Principles And Applications Of Powder Diffraction

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Principles and Applications of Powder Diffraction

Author : Abraham Clearfield,Joseph Reibenspies,Nattamai Bhuvanesh
Publisher : Wiley-Blackwell
Page : 0 pages
File Size : 55,8 Mb
Release : 2008-09-22
Category : Science
ISBN : 1405162228

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Principles and Applications of Powder Diffraction by Abraham Clearfield,Joseph Reibenspies,Nattamai Bhuvanesh Pdf

Powder diffraction is one of the primary techniques used to characterize materials, providing structural information even when the crystallite size is too small for single crystal x-ray diffraction methods. There has been a significant increase in the application of powder diffraction in recent years, both in research and manufacturing, fuelled by improved instrumentation, data processing and awareness of the information that can be obtained. Powder diffraction allows for rapid, non-destructive analysis of multi-component mixtures without the need for extensive sample preparation. This gives laboratories the ability to quickly analyse unknown materials and perform materials characterization in such fields as chemistry, materials science, geology, mineralogy, forensics, archaeology, and the biological and pharmaceutical sciences. This book provides a concise introduction to modern powder diffraction methods with particular emphasis on practical aspects. It covers the background theory of diffraction in a form approachable by those with an undergraduate degree. Whilst individual chapters are written as stand alone sections, the text is sufficiently focused so that it can be read in its entirety by the non-specialist who wants to gain a rapid overview of what they can do with modern powder diffraction methods.

Powder Diffraction

Author : Anonim
Publisher : DIANE Publishing
Page : 18 pages
File Size : 45,5 Mb
Release : 1995
Category : Electronic
ISBN : 142231832X

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Powder Diffraction by Anonim Pdf

X-Ray Diffraction for Materials Research

Author : Myeongkyu Lee
Publisher : CRC Press
Page : 302 pages
File Size : 52,7 Mb
Release : 2017-03-16
Category : Science
ISBN : 9781315361970

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X-Ray Diffraction for Materials Research by Myeongkyu Lee Pdf

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.

Thin Film Analysis by X-Ray Scattering

Author : Mario Birkholz
Publisher : John Wiley & Sons
Page : 378 pages
File Size : 52,6 Mb
Release : 2006-05-12
Category : Technology & Engineering
ISBN : 9783527607044

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Thin Film Analysis by X-Ray Scattering by Mario Birkholz Pdf

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.

Industrial Applications of X-Ray Diffraction

Author : Frank Smith
Publisher : CRC Press
Page : 1026 pages
File Size : 48,9 Mb
Release : 1999-09-22
Category : Science
ISBN : 9780824719920

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Industrial Applications of X-Ray Diffraction by Frank Smith Pdf

By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.

Applications of Neutron Powder Diffraction

Author : Erich H. Kisi,Christopher J. Howard
Publisher : Oxford University Press
Page : 509 pages
File Size : 40,8 Mb
Release : 2012-09-27
Category : Science
ISBN : 9780199657421

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Applications of Neutron Powder Diffraction by Erich H. Kisi,Christopher J. Howard Pdf

This is the first book covering the theory, practicalities, and the extensive applications of neutron powder diffraction in materials science, physics, chemistry, mineralogy, and engineering. The broad coverage should be accessible to graduate students and senior undergraduates in science and engineering, as well as lecturers and researchers.

Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition

Author : Vitalij Pecharsky,Peter Zavalij
Publisher : Springer Science & Business Media
Page : 751 pages
File Size : 43,6 Mb
Release : 2008-11-24
Category : Science
ISBN : 9780387095790

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Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition by Vitalij Pecharsky,Peter Zavalij Pdf

A little over ?ve years have passed since the ?rst edition of this book appeared in print. Seems like an instant but also eternity, especially considering numerous developments in the hardware and software that have made it from the laboratory test beds into the real world of powder diffraction. This prompted a revision, which had to be beyond cosmetic limits. The book was, and remains focused on standard laboratory powder diffractometry. It is still meant to be used as a text for teaching students about the capabilities and limitations of the powder diffraction method. We also hope that it goes beyond a simple text, and therefore, is useful as a reference to practitioners of the technique. The original book had seven long chapters that may have made its use as a text - convenient. So the second edition is broken down into 25 shorter chapters. The ?rst ?fteen are concerned with the fundamentals of powder diffraction, which makes it much more logical, considering a typical 16-week long semester. The last ten ch- ters are concerned with practical examples of structure solution and re?nement, which were preserved from the ?rst edition and expanded by another example – R solving the crystal structure of Tylenol .

Fundamentals of Powder Diffraction and Structural Characterization of Materials

Author : Vitalij Pecharsky,Peter Zavalij
Publisher : Springer Science & Business Media
Page : 752 pages
File Size : 49,6 Mb
Release : 2003-05-31
Category : Technology & Engineering
ISBN : 1402073658

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Fundamentals of Powder Diffraction and Structural Characterization of Materials by Vitalij Pecharsky,Peter Zavalij Pdf

Requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method. Useful for any scientific or engineering background, where precise structural information is required. Comprehensively describes the state-of-the-art in structure determination from powder diffraction data both theoretically and practically using multiple examples of varying complexity. Pays particular attention to the utilization of Internet resources, especially the well-tested and freely available computer codes designed for processing of powder diffraction data.

Elements of X Ray Diffraction

Author : B. D. Cullity
Publisher : Franklin Classics Trade Press
Page : 526 pages
File Size : 40,6 Mb
Release : 2018-11-10
Category : History
ISBN : 0353234281

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Elements of X Ray Diffraction by B. D. Cullity Pdf

This work has been selected by scholars as being culturally important and is part of the knowledge base of civilization as we know it. This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. To ensure a quality reading experience, this work has been proofread and republished using a format that seamlessly blends the original graphical elements with text in an easy-to-read typeface. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.

X-ray Diffraction

Author : Kaimin Shih
Publisher : Nova Science Publishers
Page : 0 pages
File Size : 43,9 Mb
Release : 2013
Category : Materials
ISBN : 1628085916

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X-ray Diffraction by Kaimin Shih Pdf

An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge boundaries. Written by more than 30 X-ray diffraction experts from 9 countries/regions, this book consists of 11 chapters examining the development of the XRD technique and demonstrating various new opportunities for its application. Each chapter discusses timely and important subjects surrounding the XRD technique, including the past and future of the single-crystal XRD technique and new explorations with co-ordination polymers; the very successful implementation of Rietveld refinement analysis for alloys, intermetallics, cements, and ceramics; the application of XRD in nanoparticles structure study; the methodological developments in quantifying the state of residual stress in materials; and the state-of-the-art progress in combining XRD principles with electron crystallography for structure determination.

Uniting Electron Crystallography and Powder Diffraction

Author : Ute Kolb,Kenneth Shankland,Louisa Meshi,Anatoly Avilov,William I.F David
Publisher : Springer
Page : 427 pages
File Size : 42,9 Mb
Release : 2012-12-20
Category : Science
ISBN : 9789400755802

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Uniting Electron Crystallography and Powder Diffraction by Ute Kolb,Kenneth Shankland,Louisa Meshi,Anatoly Avilov,William I.F David Pdf

The polycrystalline and nanocrystalline states play an increasingly important role in exploiting the properties of materials, encompassing applications as diverse as pharmaceuticals, catalysts, solar cells and energy storage. A knowledge of the three-dimensional atomic and molecular structure of materials is essential for understanding and controlling their properties, yet traditional single-crystal X-ray diffraction methods lose their power when only polycrystalline and nanocrystalline samples are available. It is here that powder diffraction and single-crystal electron diffraction techniques take over, substantially extending the range of applicability of the crystallographic principles of structure determination. This volume, a collection of teaching contributions presented at the Crystallographic Course in Erice in 2011, clearly describes the fundamentals and the state-of-the-art of powder diffraction and electron diffraction methods in materials characterisation, encompassing a diverse range of disciplines and materials stretching from archeometry to zeolites. As such, it is a comprehensive and valuable resource for those wishing to gain an understanding of the broad applicability of these two rapidly developing fields.

Principles and Applications of Lithium Secondary Batteries

Author : Jung-Ki Park
Publisher : John Wiley & Sons
Page : 388 pages
File Size : 44,9 Mb
Release : 2012-06-13
Category : Technology & Engineering
ISBN : 9783527650422

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Principles and Applications of Lithium Secondary Batteries by Jung-Ki Park Pdf

Lithium secondary batteries have been key to mobile electronics since 1990. Large-format batteries typically for electric vehicles and energy storage systems are attracting much attention due to current energy and environmental issues. Lithium batteries are expected to play a central role in boosting green technologies. Therefore, a large number of scientists and engineers are carrying out research and development on lithium secondary batteries. The book is written in a straightforward fashion suitable for undergraduate and graduate students, as well as scientists, and engineers starting out in the field. The chapters in this book have been thoroughly edited by a collective of experts to achieve a cohesive book with a consistent style, level, and philosophy. They cover a wide range of topics, including principles and technologies of key materials such as the cathode, anode, electrolyte, and separator. Battery technologies such as design, manufacturing processes, and evaluation methods as well as applications are addressed. In addition, analytical methods for determining electrochemical and other properties of batteries are also included. Hence, this book is a must-have for everyone interested in obtaining all the basic information on lithium secondary batteries.

Metal Oxide Nanoparticles

Author : Oliver Diwald,Thomas Berger
Publisher : John Wiley & Sons
Page : 903 pages
File Size : 41,6 Mb
Release : 2021-09-10
Category : Technology & Engineering
ISBN : 9781119436768

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Metal Oxide Nanoparticles by Oliver Diwald,Thomas Berger Pdf

Ein umfassendes Referenzwerk für Chemiker und Industriefachleute zum Thema Nanopartikel Nanopartikel aus Metalloxid sind ein wesentlicher Bestandteil zahlreicher natürlicher und technologischer Prozesse ? von der Mineralumwandlung bis zur Elektronik. Darüber hinaus kommen Metalloxid-Nanopartikel in Pulverform im Maschinenbau, in der Elektronik und der Energietechnik zum Einsatz. Das Werk Metal Oxide Nanoparticles: Formation, Functional Properties and Interfaces stellt die wichtigsten Synthese- und Formulierungsansätze bei der Nutzung von Metalloxid-Nanopartikeln als Funktionsmaterialien vor. Es werden die üblichen Verarbeitungswege erklärt und die physikalischen und chemischen Eigenschaften der Partikel mithilfe von umfassenden und ergänzenden Charakterisierungsmethoden bewertet. Dieses Werk kann als Einführung in die Formulierung von Nanopartikeln, ihre Grenzflächenchemie und ihre funktionellen Eigenschaften im Nanobereich genutzt werden. Darüber hinaus dient es zum vertiefenden Verständnis, denn das Buch enthält detaillierte Angaben zu fortschrittlichen Methoden bei der physikalischen, chemischen, Oberflächen- und Grenzflächencharakterisierung von Metalloxid-Nanopartikeln in Pulvern und Dispersionen. *Erläuterung der Anwendung von Metalloxid-Nanopartikeln und der wirtschaftlichen Auswirkungen *Betrachtung der Partikelsynthese, einschließlich der Grundsätze ausgewählter Bottom-up-Strategien *Untersuchung der Formulierung von Nanopartikeln mit einer Auswahl von Verarbeitungs- und Anwendungswegen *Diskussion der Bedeutung von Partikeloberflächen und -grenzflächen für Strukturbildung, Stabilität und funktionelle Materialeigenschaften *Betrachtung der Charakterisierung von Metalloxid-Nanopartikeln auf verschiedenen Längenskalen In diesem Buch finden Forscher im akademischen Bereich, Chemiker in der Industrie und Doktoranden wichtige Erkenntnisse über die Synthese, Eigenschaften und Anwendungen von Metalloxid-Nanopartikeln.

Introduction to X-Ray Powder Diffractometry

Author : Ron Jenkins,Robert Snyder
Publisher : Wiley-Interscience
Page : 440 pages
File Size : 54,9 Mb
Release : 1996-07-12
Category : Science
ISBN : UOM:49015002666668

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Introduction to X-Ray Powder Diffractometry by Ron Jenkins,Robert Snyder Pdf

When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.

Modern Powder Diffraction

Author : David L. Bish,Jeffrey E. Post
Publisher : Walter de Gruyter GmbH & Co KG
Page : 384 pages
File Size : 49,5 Mb
Release : 2018-12-17
Category : Science
ISBN : 9781501509018

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Modern Powder Diffraction by David L. Bish,Jeffrey E. Post Pdf

Volume 20 of Reviews in Mineralogy attempted to: (1) provide examples illustrating the state-of-the-art in powder diffraction, with emphasis on applications to geological materials; (2) describe how to obtain high-quality powder diffraction data; and (3) show how to extract maximum information from available data. In particular, the nonambient experiments are examples of some of the new and exciting areas of study using powder diffraction, and the interested reader is directed to the rapidly growing number of published papers on these subjects. Powder diffraction has evolved to a point where considerable information can be obtained from ug-sized samples, where detection limits are in the hundreds of ppm range, and where useful data can be obtained in milliseconds to microseconds. We hope that the information in this volume will increase the reader's access to the considerable amount of information contained in typical diffraction data.