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Author : H. J. von Bardeleben
Publisher : Unknown
Page : 450 pages
File Size : 54,8 Mb
Release : 1986
Category : Semiconductors
ISBN : UVA:X001114650
Author : Masashi Suezawa
Publisher : Unknown
Page : 660 pages
File Size : 55,7 Mb
Release : 1995
Category : Semiconductors
ISBN : UVA:X002569566
Author : Masashi Suezawa,Hiroshi Katayama-Yoshida
Publisher : Unknown
Page : 666 pages
File Size : 54,7 Mb
Release : 1995
Category : Semiconductors
ISBN : UOM:39015035263261
Author : M. Suezawa,H. Katayama-Yoshida
Publisher : Trans Tech Publications
Page : 608 pages
File Size : 52,8 Mb
Release : 1996
Category : Science
ISBN : UVA:X002569565
The study of defects in semiconductors has never been independent of the progress in semiconductor technology. With rapid development in semiconductor device technology, novel types of defects as well as very peculiar behavior of defects in semiconductors have been found one after another. New subjects in the basic study of defects have often been arisen from experiences in the practical field. Great progress has also been achieved in device production technology on the basis of the knowledge clarified in the basic field.
Author : Helmut Heinrich,Wolfgang Jantsch
Publisher : Unknown
Page : 0 pages
File Size : 55,8 Mb
Release : 1994
Category : Semiconductors
ISBN : 0878496718
Author : Anna Cavallini,Stefan K. Estreicher
Publisher : Unknown
Page : 0 pages
File Size : 52,9 Mb
Release : 2014
Category : Semiconductors
ISBN : 1632660458
Author : Masashi Suezawa,Hiroshi Katayama-Yoshida
Publisher : Unknown
Page : 538 pages
File Size : 55,9 Mb
Release : 1995
Category : Semiconductors
ISBN : UVA:X002569567
Author : Masashi Suezawa,Hiroshi Katayama-Yoshida
Publisher : Trans Tech Publications Ltd
Page : 2268 pages
File Size : 54,5 Mb
Release : 1995-11-21
Category : Technology & Engineering
ISBN : 9783035705027
The study of defects in semiconductors has never been independent of the progress in semiconductor technology. With rapid development in semiconductor device technology, novel types of defects as well as very peculiar behavior of defects in semiconductors have been found one after another. New subjects in the basic study of defects have often been arisen from experiences in the practical field. Great progress has also been achieved in device production technology on the basis of the knowledge clarified in the basic field.
Author : L.. Degiorgi
Publisher : Unknown
Page : 1181 pages
File Size : 44,9 Mb
Release : 2003
Category : Semiconductors
ISBN : OCLC:900865744
Author : Gordon Davies,Gary Gerard DeLeo,Michael Stavola
Publisher : Unknown
Page : 572 pages
File Size : 53,9 Mb
Release : 1992
Category : Semiconductors
ISBN : UVA:X002023881
Author : Anna Cavallini,Stefan K. Estreicher
Publisher : Unknown
Page : 375 pages
File Size : 55,6 Mb
Release : 2014
Category : Semiconductors
ISBN : OCLC:960176950
Author : György Ferenczi
Publisher : Unknown
Page : 552 pages
File Size : 49,8 Mb
Release : 1989
Category : Semiconductors
ISBN : UVA:X001423780
Author : H. J. von Bardeleben
Publisher : Unknown
Page : 706 pages
File Size : 47,9 Mb
Release : 1986
Category : Semiconductors
ISBN : UCSC:32106007479279
Author : Kōji Sumino
Publisher : Unknown
Page : 826 pages
File Size : 51,9 Mb
Release : 1990
Category : Materials
ISBN : STANFORD:36105030088996
Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defect control in semiconducting materials, such as silicon, III-V, II-VI compounds, organic semiconductors, heterostructure, etc. The conference brought together scientists in the field of fundamental research and engineers involved in application related to electronic devices in order to promote future research activity in both fields and establish a fundamental knowledge of defect control. The main emphasis of the 254 papers presented in this volume is on the control of the concentration, distribution, structural and electronic states of any types of defects including impurities as well as control of the electrical, optical and other activities of defects. Due to the extensive length of the contents, only the number of papers presented per session is listed below.
Author : Anonim
Publisher : Unknown
Page : 732 pages
File Size : 44,5 Mb
Release : 1997
Category : Semiconductors
ISBN : UOM:39015040322276