Download Full eBooks in PDF
Proceedings Of The International Symposium On Foundations Of Quantum Mechanics In The Light Of New Technology Central Research Laboratory Hitachi Ltd Kokubunji Tokyo Japan August 29 31 1983 Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Proceedings Of The International Symposium On Foundations Of Quantum Mechanics In The Light Of New Technology Central Research Laboratory Hitachi Ltd Kokubunji Tokyo Japan August 29 31 1983 book. This book definitely worth reading, it is an incredibly well-written.
Author : Susumu Kamefuchi
Publisher : Unknown
Page : 400 pages
File Size : 55,6 Mb
Release : 1984
Category : Quantum optics
ISBN : UCAL:B4510914
Author : Shun-ichi Kobayashi
Publisher : Unknown
Page : 454 pages
File Size : 51,6 Mb
Release : 1990
Category : Quantum theory
ISBN : UVA:X002160748
Author : Susumu Kamefuchi
Publisher : Unknown
Page : 377 pages
File Size : 49,6 Mb
Release : 1984
Category : Quantum theory
ISBN : OCLC:1144880877
Author : Masaru Tsukada
Publisher : Unknown
Page : 304 pages
File Size : 52,8 Mb
Release : 1993
Category : Physics
ISBN : UOM:39015028924515
Author : Anonim
Publisher : Unknown
Page : 1006 pages
File Size : 55,6 Mb
Release : 1985
Category : Physics
ISBN : UOM:39015026184294
Author : Anonim
Publisher : Unknown
Page : 400 pages
File Size : 52,6 Mb
Release : 1993
Category : Nuclear physics
ISBN : UCSD:31822017904152
Author : Anonim
Publisher : Unknown
Page : 794 pages
File Size : 49,6 Mb
Release : 1993
Category : Nuclear physics
ISBN : UVA:X001966006
Author : Anonim
Publisher : Unknown
Page : 1288 pages
File Size : 55,9 Mb
Release : 1985
Category : Nuclear energy
ISBN : STANFORD:36105021589424
Author : Riel Miller
Publisher : Routledge
Page : 276 pages
File Size : 44,7 Mb
Release : 2018-04-27
Category : Nature
ISBN : 9781351047982
People are using the future to search for better ways to achieve sustainability, inclusiveness, prosperity, well-being and peace. In addition, the way the future is understood and used is changing in almost all domains, from social science to daily life. This book presents the results of significant research undertaken by UNESCO with a number of partners to detect and define the theory and practice of anticipation around the world today. It uses the concept of ‘Futures Literacy’ as a tool to define the understanding of anticipatory systems and processes – also known as the Discipline of Anticipation. This innovative title explores: • new topics such as Futures Literacy and the Discipline of Anticipation; • the evidence collected from over 30 Futures Literacy Laboratories and presented in 14 full case studies; • the need and opportunity for significant innovation in human decision-making systems. This book will be of great interest to scholars, researchers, policy-makers and students, as well as activists working on sustainability issues and innovation, future studies and anticipation studies. The Open Access version of this book, available at https://www.taylorfrancis.com/books/e/9781351047999, has been made available under a Attribution-NonCommercial-NoDerivs 3.0 IGO (CC-BY-NC-ND 3.0 IGO) license.
Author : Calvin G. Burnham,R. D. Kane
Publisher : World Scientific
Page : 710 pages
File Size : 43,6 Mb
Release : 1988
Category : Science
ISBN : 9971506106
The development of high temperature superconductors is one of the major technological discoveries of this century. The impact and interactions from the scientific, technical, business and political aspects will be presented.
Author : Richard W. Siegel,Evelyn Hu
Publisher : Springer Science & Business Media
Page : 354 pages
File Size : 45,7 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9789401591850
Timely information on scientific and engineering developments occurring in laboratories around the world provides critical input to maintaining the economic and technological strength of the United States. Moreover, sharing this information quickly with other countries can greatly enhance the productivity of scientists and engineers. These are some of the reasons why the National Science Foundation (NSF) has been involved in funding science and technology assessments comparing the United States and foreign countries since the early 1980s. A substantial number of these studies have been conducted by the World Technology Evaluation Center (WTEC) managed by Loyola College through a cooperative agreement with NSF. The National Science and Technology Council (NSTC), Committee on Technology's Interagency Working Group on NanoScience, Engineering and Technology (CT/IWGN) worked with WTEC to develop the scope of this Nanostucture Science and Technology report in an effort to develop a baseline of understanding for how to strategically make Federal nanoscale R&D investments in the coming years. The purpose of the NSTC/WTEC activity is to assess R&D efforts in other countries in specific areas of technology, to compare these efforts and their results to U. S. research in the same areas, and to identify opportunities for international collaboration in precompetitive research. Many U. S. organizations support substantial data gathering and analysis efforts focusing on nations such as Japan. But often the results of these studies are not widely available. At the same time, government and privately sponsored studies that are in the public domain tend to be "input" studies.
Author : Hermann Grabert,Michel H. Devoret
Publisher : Springer Science & Business Media
Page : 344 pages
File Size : 43,5 Mb
Release : 2013-11-27
Category : Science
ISBN : 9781475721669
The field of single charge tunneling comprises of phenomena where the tunneling of a microscopic charge, usually carried by an electron or a Cooper pair, leads to macro scopically observable effects. The first conference entirely devoted to this new field was the NATO Advanced Study Institute on Single Charge Tunneling held in Les Hauches, France, March 5-15, 1991. This book contains a series of tutorial articles based on lectures presented at the meeting. It was intended to provide both an introduction for nonexperts and a valuable reference summarizing the state of the art of single charge tun neling. A complementary publication with contributions by participants of the NATO Advanced Study Institute is the Special Issue on Single Charge Tunneling of Zeitschrift für Physik B, Vol. 85, pp. 317-468 (1991 ). That issue with original papers provides a snapshot af the leading edge of current research in the field. The success of the meeting and the publicatian of this volume was made possible through the generaus support af the NATO Scientific A:ffairs Division, Brussels, Belgium. The Centre de Physique des Hauches has provided a superbly situated conference site and took care af many lacal arrangements. Both far the preparation of the conference and the handling af some manuscripts the suppart af the Centre d 'Etudes de Saclay was essential. The editing of the proceedings volume would not have been passible without the dedicated efforts of Dr. G. -1. Ingald, who tailared a 1\.
Author : Howard Huff
Publisher : Springer Science & Business Media
Page : 740 pages
File Size : 41,7 Mb
Release : 2005
Category : Science
ISBN : 3540210814
Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). More than just an historical overview, this book will assess previous and present approaches related to scaling the gate dielectric and their impact, along with the creative directions and forthcoming challenges that will define the future of gate dielectric scaling technology. Topics include: an extensive review of Moore's Law, the classical regime for SiO2 gate dielectrics; the transition to silicon oxynitride gate dielectrics; the transition to high-K gate dielectrics (including the drive towards equivalent oxide thickness in the single-digit nanometer regime); and future directions and issues for ultimate technology generation scaling. The vision, wisdom, and experience of the team of authors will make this book a timely, relevant, and interesting, resource focusing on fundamentals of the 45 nm Technology Generation and beyond.
Author : Jan M. Rabaey,Massoud Pedram
Publisher : Springer Science & Business Media
Page : 373 pages
File Size : 51,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461523079
Low Power Design Methodologies presents the first in-depth coverage of all the layers of the design hierarchy, ranging from the technology, circuit, logic and architectural levels, up to the system layer. The book gives insight into the mechanisms of power dissipation in digital circuits and presents state of the art approaches to power reduction. Finally, it introduces a global view of low power design methodologies and how these are being captured in the latest design automation environments. The individual chapters are written by the leading researchers in the area, drawn from both industry and academia. Extensive references are included at the end of each chapter. Audience: A broad introduction for anyone interested in low power design. Can also be used as a text book for an advanced graduate class. A starting point for any aspiring researcher.
Author : A. Christou,B.A. Unger
Publisher : Springer Science & Business Media
Page : 571 pages
File Size : 45,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789400924826
This publication is a compilation of papers presented at the Semiconductor Device Reliabi lity Workshop sponsored by the NATO International Scientific Exchange Program. The Workshop was held in Crete, Greece from June 4 to June 9, 1989. The objective of the Workshop was to review and to further explore advances in the field of semiconductor reliability through invited paper presentations and discussions. The technical emphasis was on quality assurance and reliability of optoelectronic and high speed semiconductor devices. The primary support for the meeting was provided by the Scientific Affairs Division of NATO. We are indebted to NATO for their support and to Dr. Craig Sinclair, who admin isters this program. The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis cussed. A brief review of these sessions is presented in this book.