Author : Ronald D Schrimpf,Daniel M Fleetwood
Publisher : World Scientific
Page : 349 pages
File Size : 41,9 Mb
Release : 2004-07-29
Category : Technology & Engineering
ISBN : 9789814482158
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices by Ronald D Schrimpf,Daniel M Fleetwood Pdf
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.