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Author : V. S. Vavilov
Publisher : Springer Science & Business Media
Page : 280 pages
File Size : 47,8 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781468490695
Author : Krzysztof Iniewski
Publisher : CRC Press
Page : 442 pages
File Size : 53,6 Mb
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 9781351833752
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.
Author : V. S. Vavilov
Publisher : Unknown
Page : 0 pages
File Size : 47,8 Mb
Release : 1973
Category : Electronic
ISBN : OCLC:1411891697
Author : C. Claeys,E. Simoen
Publisher : Springer Science & Business Media
Page : 424 pages
File Size : 46,9 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783662049747
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author : V. S Vavilov
Publisher : Unknown
Page : 284 pages
File Size : 52,9 Mb
Release : 1995-12-31
Category : Electronic
ISBN : 1468490702
Author : Frank Larin
Publisher : Unknown
Page : 312 pages
File Size : 51,7 Mb
Release : 1968
Category : Semiconductors
ISBN : UOM:39015003413260
Author : Los Alamos Scientific Laboratory
Publisher : Unknown
Page : 80 pages
File Size : 54,6 Mb
Release : 1961
Category : Radiation
ISBN : UOM:39015086498543
Author : D. C. Jones
Publisher : Unknown
Page : 122 pages
File Size : 49,6 Mb
Release : 1963
Category : Electronic apparatus and appliances
ISBN : UOM:39015095115419
Author : Allan H. Johnston,Allan Johnston
Publisher : World Scientific
Page : 376 pages
File Size : 45,7 Mb
Release : 2010
Category : Technology & Engineering
ISBN : 9789814277112
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
Author : Marta Bagatin,Simone Gerardin
Publisher : CRC Press
Page : 394 pages
File Size : 52,6 Mb
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 9781498722636
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Author : Stephen J. Gaul,Nicolaas van Vonno,Steven H. Voldman,Wesley H. Morris
Publisher : John Wiley & Sons
Page : 491 pages
File Size : 46,6 Mb
Release : 2019-12-03
Category : Technology & Engineering
ISBN : 9781118701850
A practical guide to the effects of radiation on semiconductor components of electronic systems, and techniques for the designing, laying out, and testing of hardened integrated circuits This book teaches the fundamentals of radiation environments and their effects on electronic components, as well as how to design, lay out, and test cost-effective hardened semiconductor chips not only for today’s space systems but for commercial terrestrial applications as well. It provides a historical perspective, the fundamental science of radiation, and the basics of semiconductors, as well as radiation-induced failure mechanisms in semiconductor chips. Integrated Circuits Design for Radiation Environments starts by introducing readers to semiconductors and radiation environments (including space, atmospheric, and terrestrial environments) followed by circuit design and layout. The book introduces radiation effects phenomena including single-event effects, total ionizing dose damage and displacement damage) and shows how technological solutions can address both phenomena. Describes the fundamentals of radiation environments and their effects on electronic components Teaches readers how to design, lay out and test cost-effective hardened semiconductor chips for space systems and commercial terrestrial applications Covers natural and man-made radiation environments, space systems and commercial terrestrial applications Provides up-to-date coverage of state-of-the-art of radiation hardening technology in one concise volume Includes questions and answers for the reader to test their knowledge Integrated Circuits Design for Radiation Environments will appeal to researchers and product developers in the semiconductor, space, and defense industries, as well as electronic engineers in the medical field. The book is also helpful for system, layout, process, device, reliability, applications, ESD, latchup and circuit design semiconductor engineers, along with anyone involved in micro-electronics used in harsh environments.
Author : Samuel Louis Marshall,Oscar Fisch
Publisher : Unknown
Page : 128 pages
File Size : 50,7 Mb
Release : 1960
Category : Semiconductors
ISBN : OCLC:9490335
Author : T. P. Ma,Paul V. Dressendorfer
Publisher : John Wiley & Sons
Page : 616 pages
File Size : 44,6 Mb
Release : 1989-04-18
Category : Technology & Engineering
ISBN : 047184893X
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
Author : Ronald D Schrimpf,Daniel M Fleetwood
Publisher : World Scientific
Page : 349 pages
File Size : 50,7 Mb
Release : 2004-07-29
Category : Technology & Engineering
ISBN : 9789814482158
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Author : Paul Leroux
Publisher : MDPI
Page : 210 pages
File Size : 42,5 Mb
Release : 2019-08-26
Category : Technology & Engineering
ISBN : 9783039212798
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.