Scanning Electron Microscope Optics And Spectrometers

Author : Anjam Khursheed
Publisher : World Scientific
Page : 417 pages
File Size : 53,6 Mb
Release : 2011
Category : Technology & Engineering
ISBN : 9789812836670

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Scanning Electron Microscope Optics and Spectrometers by Anjam Khursheed Pdf

This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

Author : T Mulvey,C. J. R. Sheppard
Publisher : Academic Press
Page : 198 pages
File Size : 54,7 Mb
Release : 2013-10-22
Category : Science
ISBN : 9781483282244

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Advances in Optical and Electron Microscopy by T Mulvey,C. J. R. Sheppard Pdf

Advances in Optical and Electron Microscopy, Volume 11 compiles papers on the important developments in optical and electron microscopy. This book discusses the instrumentation and operation for high-resolution electron microscopy; diffraction pattern and camera length; and electron microscopy of surface structure. The history of surface imaging by conventional transmission electron microscopy; ion probe microscopy; and secondary ion mass spectrometry with high lateral resolution are also elaborated. This text likewise covers the acoustic microscopy; quantitative methods; biological applications and near-surface imaging of solids; and interior imaging. This publication is a beneficial to students and individuals researching on optical and electron microscopy.

Author : Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael
Publisher : Springer Science & Business Media
Page : 689 pages
File Size : 50,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461502159

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,David C. Joy,Charles E. Lyman,Patrick Echlin,Eric Lifshin,Linda Sawyer,J.R. Michael Pdf

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

Author : Joseph Goldstein
Publisher : Springer
Page : 846 pages
File Size : 52,7 Mb
Release : 1992-05-31
Category : Medical
ISBN : UOM:39015042124795

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein Pdf

A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland, Or.

Author : Dr Robert Keyse
Publisher : Routledge
Page : 205 pages
File Size : 50,9 Mb
Release : 2018-12-19
Category : Technology & Engineering
ISBN : 9781351436601

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Introduction to Scanning Transmission Electron Microscopy by Dr Robert Keyse Pdf

1997 was the 'Year of the Electron' because it marked the centenary pf the celebrated discovery of the smallest of the fundamental particles that make up ordinary matter, and which has proved to have so many remarkable properties that, after light, it has become the most widley used of the particles in scientific and technogical applications. STEM is a discipline of importance to a growing number of microscopists. This book is essential reading for undergraduates, postgraduates and researchers requiring an up-to-date and comprehensive introduction to this rapidly growing, state of the art technique.

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
Page : 598 pages
File Size : 45,8 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461344223

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Practical Scanning Electron Microscopy by Joseph Goldstein Pdf

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Author : Anonim
Publisher : Unknown
Page : 472 pages
File Size : 44,7 Mb
Release : 1986
Category : Electron microscopy
ISBN : UOM:39015022543931

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Scanning Electron Microscopy by Anonim Pdf

Vols. for 1968-77 include the proceedings of the annual Scanning Electron Microscope Symposium, sponsored by the IIT Research Institute, and other workshops.

Author : Ludwig Reimer
Publisher : Springer
Page : 538 pages
File Size : 48,9 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783540389675

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Scanning Electron Microscopy by Ludwig Reimer Pdf

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Author : C. Barry Carter,David B. Williams
Publisher : Springer
Page : 518 pages
File Size : 51,6 Mb
Release : 2016-08-24
Category : Technology & Engineering
ISBN : 9783319266510

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Transmission Electron Microscopy by C. Barry Carter,David B. Williams Pdf

This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Author : Patrick Echlin,C.E. Fiori,Joseph Goldstein,David C. Joy,Dale E. Newbury
Publisher : Springer Science & Business Media
Page : 454 pages
File Size : 41,6 Mb
Release : 2013-06-29
Category : Medical
ISBN : 9781475790276

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Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin,C.E. Fiori,Joseph Goldstein,David C. Joy,Dale E. Newbury Pdf

This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.

Author : P. W. Hawkes
Publisher : Unknown
Page : 268 pages
File Size : 49,8 Mb
Release : 1972
Category : Science
ISBN : MINN:31951000502988S

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Electron Optics and Electron Microscopy by P. W. Hawkes Pdf

Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.

Author : M. A. Hayat
Publisher : John Wiley & Sons
Page : 264 pages
File Size : 40,9 Mb
Release : 1974
Category : Science
ISBN : UIUC:30112006003336

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Principles and Techniques of Scanning Electron Microscopy by M. A. Hayat Pdf

Author : Peter J. Goodhew,John Humphreys,Richard Beanland
Publisher : CRC Press
Page : 274 pages
File Size : 55,8 Mb
Release : 2000-11-30
Category : Technology & Engineering
ISBN : 0748409688

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Electron Microscopy and Analysis, Third Edition by Peter J. Goodhew,John Humphreys,Richard Beanland Pdf

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Author : Stephen J. Pennycook,Peter D. Nellist
Publisher : Springer Science & Business Media
Page : 762 pages
File Size : 43,8 Mb
Release : 2011-03-24
Category : Technology & Engineering
ISBN : 9781441972002

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Scanning Transmission Electron Microscopy by Stephen J. Pennycook,Peter D. Nellist Pdf

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Author : Anonim
Publisher : Academic Press
Page : 320 pages
File Size : 55,7 Mb
Release : 2009-11-05
Category : Technology & Engineering
ISBN : 0080961584

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Advances in Imaging and Electron Physics by Anonim Pdf

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians