Semiconductor Silicon 2002

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Semiconductor Silicon 2002

Author : Howard R. Huff,László Fábry,Seigo Kishino
Publisher : The Electrochemical Society
Page : 650 pages
File Size : 49,5 Mb
Release : 2002
Category : Science
ISBN : 1566773741

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Semiconductor Silicon 2002 by Howard R. Huff,László Fábry,Seigo Kishino Pdf

Semiconductor Silicon 2002

Author : Howard R. Huff,László Fábry,Seigo Kishino
Publisher : Unknown
Page : 690 pages
File Size : 48,8 Mb
Release : 2002
Category : Science
ISBN : PSU:000051520038

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Semiconductor Silicon 2002 by Howard R. Huff,László Fábry,Seigo Kishino Pdf

Silicon Materials Science and Technology X

Author : Howard R. Huff,H. Iwai,H. Richter
Publisher : ECS Transactions
Page : 612 pages
File Size : 44,8 Mb
Release : 2006
Category : Semiconductors
ISBN : 156677439X

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Silicon Materials Science and Technology X by Howard R. Huff,H. Iwai,H. Richter Pdf

This was the tenth symposium of the International Symposium on Silcon Material Science and Technology, going back to 1969. This issue provides a unique historical record of the program and will aid in the understanding of silicon materials over the last 35 years.

Semiconductor Silicon

Author : Howard R. Huff,Edward L. Kern
Publisher : Unknown
Page : 128 pages
File Size : 53,5 Mb
Release : 1988
Category : Electronic
ISBN : OCLC:1124045952

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Semiconductor Silicon by Howard R. Huff,Edward L. Kern Pdf

Microelectronics Technology and Devices, SBMICRO 2002

Author : Electrochemical Society. Electronics Division
Publisher : The Electrochemical Society
Page : 506 pages
File Size : 44,6 Mb
Release : 2002
Category : Technology & Engineering
ISBN : 1566773288

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Microelectronics Technology and Devices, SBMICRO 2002 by Electrochemical Society. Electronics Division Pdf

Handbook of Semiconductor Manufacturing Technology

Author : Yoshio Nishi,Robert Doering
Publisher : CRC Press
Page : 3276 pages
File Size : 45,6 Mb
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 9781351829823

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Handbook of Semiconductor Manufacturing Technology by Yoshio Nishi,Robert Doering Pdf

Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.

Defects and Impurities in Silicon Materials

Author : Yutaka Yoshida,Guido Langouche
Publisher : Springer
Page : 498 pages
File Size : 43,8 Mb
Release : 2016-03-30
Category : Technology & Engineering
ISBN : 9784431558002

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Defects and Impurities in Silicon Materials by Yutaka Yoshida,Guido Langouche Pdf

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental methods, first principle theories, and computer simulation techniques. The book is aimed at young researchers, scientists, and technicians in related industries. The main purposes are to provide readers with 1) the basic physics behind defects in silicon materials, 2) the atomistic modeling as well as the characterization techniques related to defects and impurities in silicon materials, and 3) an overview of the wide range of the research fields involved.

Predictive Simulation of Semiconductor Processing

Author : Jarek Dabrowski,Eicke R. Weber
Publisher : Springer Science & Business Media
Page : 505 pages
File Size : 47,8 Mb
Release : 2013-03-09
Category : Technology & Engineering
ISBN : 9783662094327

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Predictive Simulation of Semiconductor Processing by Jarek Dabrowski,Eicke R. Weber Pdf

Predictive Simulation of Semiconductor Processing enables researchers and developers to extend the scaling range of semiconductor devices beyond the parameter range of empirical research. It requires a thorough understanding of the basic mechanisms employed in device fabrication, such as diffusion, ion implantation, epitaxy, defect formation and annealing, and contamination. This book presents an in-depth discussion of our current understanding of key processes and identifies areas that require further work in order to achieve the goal of a comprehensive, predictive process simulation tool.

Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)

Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
Page : 479 pages
File Size : 53,6 Mb
Release : 2009-09
Category : Semiconductors
ISBN : 9781566777407

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Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009) by Bernd O. Kolbesen Pdf

The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.

Comprehensive Semiconductor Science and Technology

Author : Anonim
Publisher : Newnes
Page : 3572 pages
File Size : 53,5 Mb
Release : 2011-01-28
Category : Science
ISBN : 9780080932286

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Comprehensive Semiconductor Science and Technology by Anonim Pdf

Semiconductors are at the heart of modern living. Almost everything we do, be it work, travel, communication, or entertainment, all depend on some feature of semiconductor technology. Comprehensive Semiconductor Science and Technology, Six Volume Set captures the breadth of this important field, and presents it in a single source to the large audience who study, make, and exploit semiconductors. Previous attempts at this achievement have been abbreviated, and have omitted important topics. Written and Edited by a truly international team of experts, this work delivers an objective yet cohesive global review of the semiconductor world. The work is divided into three sections. The first section is concerned with the fundamental physics of semiconductors, showing how the electronic features and the lattice dynamics change drastically when systems vary from bulk to a low-dimensional structure and further to a nanometer size. Throughout this section there is an emphasis on the full understanding of the underlying physics. The second section deals largely with the transformation of the conceptual framework of solid state physics into devices and systems which require the growth of extremely high purity, nearly defect-free bulk and epitaxial materials. The last section is devoted to exploitation of the knowledge described in the previous sections to highlight the spectrum of devices we see all around us. Provides a comprehensive global picture of the semiconductor world Each of the work's three sections presents a complete description of one aspect of the whole Written and Edited by a truly international team of experts

Semiconductor Silicon

Author : Edward L. Kern
Publisher : Unknown
Page : 788 pages
File Size : 47,7 Mb
Release : 1969
Category : Semiconductors
ISBN : CORNELL:31924003908534

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Semiconductor Silicon by Edward L. Kern Pdf

Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment

Author : Denis Flandre,Alexei N. Nazarov,Peter L.F. Hemment
Publisher : Springer Science & Business Media
Page : 358 pages
File Size : 40,8 Mb
Release : 2006-05-06
Category : Technology & Engineering
ISBN : 9781402030130

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Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment by Denis Flandre,Alexei N. Nazarov,Peter L.F. Hemment Pdf

This proceedings volume archives the contributions of the speakers who attended the NATO Advanced Research Workshop on “Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment” held at the Sanatorium Puscha Ozerna, th th Kyiv, Ukraine, from 25 to 29 April 2004. The semiconductor industry has maintained a very rapid growth during the last three decades through impressive technological achievements which have resulted in products with higher performance and lower cost per function. After many years of development semiconductor-on-insulator materials have entered volume production and will increasingly be used by the manufacturing industry. The wider use of semiconductor (especially silicon) on insulator materials will not only enable the benefits of these materials to be further demonstrated but, also, will drive down the cost of substrates which, in turn, will stimulate the development of other novel devices and applications. In itself this trend will encourage the promotion of the skills and ideas generated by researchers in the Former Soviet Union and Eastern Europe and their incorporation in future collaborations.

Semiconductor Silicon 1994

Author : Howard R. Huff,Werner Bergholz,Koji Sumino
Publisher : The Electrochemical Society
Page : 1284 pages
File Size : 43,7 Mb
Release : 1994
Category : Semiconductors
ISBN : 1566770424

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Semiconductor Silicon 1994 by Howard R. Huff,Werner Bergholz,Koji Sumino Pdf

Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes

Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
Page : 572 pages
File Size : 54,6 Mb
Release : 2003
Category : Technology & Engineering
ISBN : 1566773482

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Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes by Bernd O. Kolbesen Pdf

.".. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ..."--p. iii.

Simulation of Semiconductor Processes and Devices 2004

Author : Gerhard Wachutka,Gabriele Schrag
Publisher : Springer Science & Business Media
Page : 387 pages
File Size : 51,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783709106242

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Simulation of Semiconductor Processes and Devices 2004 by Gerhard Wachutka,Gabriele Schrag Pdf

This volume contains the proceedings of the 10th edition of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2004), held in Munich, Germany, on September 2-4, 2004. The conference program included 7 invited plenary lectures and 82 contributed papers for oral or poster presentation, which were carefully selected out of a total of 151 abstracts submitted from 14 countries around the world. Like the previous meetings, SISPAD 2004 provided a world-wide forum for the presentation and discussion of recent advances and developments in the theoretical description, physical modeling and numerical simulation and analysis of semiconductor fabrication processes, device operation and system performance. The variety of topics covered by the conference contributions reflects the physical effects and technological problems encountered in consequence of the progressively shrinking device dimensions and the ever-growing complexity in device technology.