Statistical Performance Analysis And Modeling Techniques For Nanometer Vlsi Designs

Author : Ruijing Shen,Sheldon X.-D. Tan,Hao Yu
Publisher : Springer Science & Business Media
Page : 326 pages
File Size : 49,7 Mb
Release : 2014-07-08
Category : Technology & Engineering
ISBN : 9781461407881

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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Ruijing Shen,Sheldon X.-D. Tan,Hao Yu Pdf

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented.

Author : Anonim
Publisher : Springer
Page : 336 pages
File Size : 50,8 Mb
Release : 2012-03-21
Category : Electronic
ISBN : 1461407893

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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Anonim Pdf

Author : Wenjian Yu,Xiren Wang
Publisher : Springer Science & Business
Page : 258 pages
File Size : 44,9 Mb
Release : 2014-04-21
Category : Technology & Engineering
ISBN : 9783642542985

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Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits by Wenjian Yu,Xiren Wang Pdf

Resistance and capacitance (RC) extraction is an essential step in modeling the interconnection wires and substrate coupling effect in nanometer-technology integrated circuits (IC). The field-solver techniques for RC extraction guarantee the accuracy of modeling, and are becoming increasingly important in meeting the demand for accurate modeling and simulation of VLSI designs. Advanced Field-Solver Techniques for RC Extraction of Integrated Circuits presents a systematic introduction to, and treatment of, the key field-solver methods for RC extraction of VLSI interconnects and substrate coupling in mixed-signal ICs. Various field-solver techniques are explained in detail, with real-world examples to illustrate the advantages and disadvantages of each algorithm. This book will benefit graduate students and researchers in the field of electrical and computer engineering as well as engineers working in the IC design and design automation industries. Dr. Wenjian Yu is an Associate Professor at the Department of Computer Science and Technology at Tsinghua University in China; Dr. Xiren Wang is a R&D Engineer at Cadence Design Systems in the USA.

Author : Guoyong Shi,Sheldon X.-D. Tan,Esteban Tlelo Cuautle
Publisher : Springer
Page : 308 pages
File Size : 53,5 Mb
Release : 2014-06-19
Category : Technology & Engineering
ISBN : 9781493911035

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Advanced Symbolic Analysis for VLSI Systems by Guoyong Shi,Sheldon X.-D. Tan,Esteban Tlelo Cuautle Pdf

This book provides comprehensive coverage of the recent advances in symbolic analysis techniques for design automation of nanometer VLSI systems. The presentation is organized in parts of fundamentals, basic implementation methods and applications for VLSI design. Topics emphasized include statistical timing and crosstalk analysis, statistical and parallel analysis, performance bound analysis and behavioral modeling for analog integrated circuits. Among the recent advances, the Binary Decision Diagram (BDD) based approaches are studied in depth. The BDD-based hierarchical symbolic analysis approaches, have essentially broken the analog circuit size barrier.

Author : Samar K. Saha
Publisher : CRC Press
Page : 548 pages
File Size : 42,7 Mb
Release : 2018-09-03
Category : Technology & Engineering
ISBN : 9781482240672

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Compact Models for Integrated Circuit Design by Samar K. Saha Pdf

Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond provides a modern treatise on compact models for circuit computer-aided design (CAD). Written by an author with more than 25 years of industry experience in semiconductor processes, devices, and circuit CAD, and more than 10 years of academic experience in teaching compact modeling courses, this first-of-its-kind book on compact SPICE models for very-large-scale-integrated (VLSI) chip design offers a balanced presentation of compact modeling crucial for addressing current modeling challenges and understanding new models for emerging devices. Starting from basic semiconductor physics and covering state-of-the-art device regimes from conventional micron to nanometer, this text: Presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models Discusses the major issue of process variability, which severely impacts device and circuit performance in advanced technologies and requires statistical compact models Promotes further research of the evolution and development of compact models for VLSI circuit design and analysis Supplies fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices Includes exercise problems at the end of each chapter and extensive references at the end of the book Compact Models for Integrated Circuit Design: Conventional Transistors and Beyond is intended for senior undergraduate and graduate courses in electrical and electronics engineering as well as for researchers and practitioners working in the area of electron devices. However, even those unfamiliar with semiconductor physics gain a solid grasp of compact modeling concepts from this book.

Author : Sheldon Tan,Mehdi Tahoori,Taeyoung Kim,Shengcheng Wang,Zeyu Sun,Saman Kiamehr
Publisher : Springer Nature
Page : 460 pages
File Size : 43,5 Mb
Release : 2019-09-12
Category : Technology & Engineering
ISBN : 9783030261726

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Long-Term Reliability of Nanometer VLSI Systems by Sheldon Tan,Mehdi Tahoori,Taeyoung Kim,Shengcheng Wang,Zeyu Sun,Saman Kiamehr Pdf

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent developments in the modeling, analysis and optimization of the reliability effects from EM and BTI induced failures at the circuit, architecture and system levels of abstraction. Readers will benefit from a focus on topics such as recently developed, physics-based EM modeling, EM modeling for multi-segment wires, new EM-aware power grid analysis, and system level EM-induced reliability optimization and management techniques. Reviews classic Electromigration (EM) models, as well as existing EM failure models and discusses the limitations of those models; Introduces a dynamic EM model to address transient stress evolution, in which wires are stressed under time-varying current flows, and the EM recovery effects. Also includes new, parameterized equivalent DC current based EM models to address the recovery and transient effects; Presents a cross-layer approach to transistor aging modeling, analysis and mitigation, spanning multiple abstraction levels; Equips readers for EM-induced dynamic reliability management and energy or lifetime optimization techniques, for many-core dark silicon microprocessors, embedded systems, lower power many-core processors and datacenters.

Author : Christopher Michael,Mohammed Ismail
Publisher : Springer Science & Business Media
Page : 220 pages
File Size : 50,9 Mb
Release : 1993-01-31
Category : Computers
ISBN : 079239299X

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Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits by Christopher Michael,Mohammed Ismail Pdf

As MOS devices are scaled to meet increasingly demanding circuit specifications, process variations have a greater effect on the reliability of circuit performance. For this reason, statistical techniques are required to design integrated circuits with maximum yield. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits describes a statistical circuit simulation and optimization environment for VLSI circuit designers. The first step toward accomplishing statistical circuit design and optimization is the development of an accurate CAD tool capable of performing statistical simulation. This tool must be based on a statistical model which comprehends the effect of device and circuit characteristics, such as device size, bias, and circuit layout, which are under the control of the circuit designer on the variability of circuit performance. The distinctive feature of the CAD tool described in this book is its ability to accurately model and simulate the effect in both intra- and inter-die process variability on analog/digital circuits, accounting for the effects of the aforementioned device and circuit characteristics. Statistical Modeling for Computer-Aided Design of MOS VLSI Circuits serves as an excellent reference for those working in the field, and may be used as the text for an advanced course on the subject.

Author : Mohamed Abu Rahma,Mohab Anis
Publisher : Springer Science & Business Media
Page : 176 pages
File Size : 53,9 Mb
Release : 2012-09-27
Category : Technology & Engineering
ISBN : 9781461417484

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Nanometer Variation-Tolerant SRAM by Mohamed Abu Rahma,Mohab Anis Pdf

Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.

Author : David Wolpert,Paul Ampadu
Publisher : Springer Science & Business Media
Page : 192 pages
File Size : 40,8 Mb
Release : 2011-08-31
Category : Technology & Engineering
ISBN : 9781461407485

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Managing Temperature Effects in Nanoscale Adaptive Systems by David Wolpert,Paul Ampadu Pdf

This book discusses new techniques for detecting, controlling, and exploiting the impacts of temperature variations on nanoscale circuits and systems. A new sensor system is described that can determine the temperature dependence as well as the operating temperature to improve system reliability. A new method is presented to control a circuit’s temperature dependence by individually tuning pull-up and pull-down networks to their temperature-insensitive operating points. This method extends the range of supply voltages that can be made temperature-insensitive, achieving insensitivity at nominal voltage for the first time.

Author : Ashish Srivastava,Dennis Sylvester,David Blaauw
Publisher : Springer Science & Business Media
Page : 284 pages
File Size : 43,7 Mb
Release : 2006-04-04
Category : Technology & Engineering
ISBN : 9780387265285

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Statistical Analysis and Optimization for VLSI: Timing and Power by Ashish Srivastava,Dennis Sylvester,David Blaauw Pdf

Covers the statistical analysis and optimization issues arising due to increased process variations in current technologies. Comprises a valuable reference for statistical analysis and optimization techniques in current and future VLSI design for CAD-Tool developers and for researchers interested in starting work in this very active area of research. Written by author who lead much research in this area who provide novel ideas and approaches to handle the addressed issues

Author : Peter Han Joo Chong,Akhtar Kalam,Antonio Pascoal,Manas Kumar Bera
Publisher : Springer Nature
Page : 471 pages
File Size : 45,7 Mb
Release : 2022-11-09
Category : Technology & Engineering
ISBN : 9789811943003

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Emerging Electronics and Automation by Peter Han Joo Chong,Akhtar Kalam,Antonio Pascoal,Manas Kumar Bera Pdf

This book constitutes peer-reviewed proceedings of the International Conference on Emerging Electronics and Automation (E2A) 2021. The book presents new ideas, research findings, and novel techniques in the fields of sensors and instrumentation, automation and control, artificial intelligence, MEMS sensors, soft computing, signal processing, and communication. It includes contributions received from both academia and industry. The proceedings will be helpful for beginners as well as advanced researchers in the area of automation and other allied fields.

Author : Victor Champac,Jose Garcia Gervacio
Publisher : Springer
Page : 185 pages
File Size : 51,8 Mb
Release : 2018-04-18
Category : Technology & Engineering
ISBN : 9783319754659

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Timing Performance of Nanometer Digital Circuits Under Process Variations by Victor Champac,Jose Garcia Gervacio Pdf

This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.

Author : J. Bhasker,Rakesh Chadha
Publisher : Springer Science & Business Media
Page : 588 pages
File Size : 50,8 Mb
Release : 2009-04-03
Category : Technology & Engineering
ISBN : 9780387938202

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Static Timing Analysis for Nanometer Designs by J. Bhasker,Rakesh Chadha Pdf

iming, timing, timing! That is the main concern of a digital designer charged with designing a semiconductor chip. What is it, how is it T described, and how does one verify it? The design team of a large digital design may spend months architecting and iterating the design to achieve the required timing target. Besides functional verification, the t- ing closure is the major milestone which dictates when a chip can be - leased to the semiconductor foundry for fabrication. This book addresses the timing verification using static timing analysis for nanometer designs. The book has originated from many years of our working in the area of timing verification for complex nanometer designs. We have come across many design engineers trying to learn the background and various aspects of static timing analysis. Unfortunately, there is no book currently ava- able that can be used by a working engineer to get acquainted with the - tails of static timing analysis. The chip designers lack a central reference for information on timing, that covers the basics to the advanced timing veri- cation procedures and techniques.

Author : Sandip Kundu,Aswin Sreedhar
Publisher : McGraw Hill Professional
Page : 316 pages
File Size : 47,9 Mb
Release : 2010-06-22
Category : Technology & Engineering
ISBN : 9780071635202

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Nanoscale CMOS VLSI Circuits: Design for Manufacturability by Sandip Kundu,Aswin Sreedhar Pdf

Cutting-Edge CMOS VLSI Design for Manufacturability Techniques This detailed guide offers proven methods for optimizing circuit designs to increase the yield, reliability, and manufacturability of products and mitigate defects and failure. Covering the latest devices, technologies, and processes, Nanoscale CMOS VLSI Circuits: Design for Manufacturability focuses on delivering higher performance and lower power consumption. Costs, constraints, and computational efficiencies are also discussed in the practical resource. Nanoscale CMOS VLSI Circuits covers: Current trends in CMOS VLSI design Semiconductor manufacturing technologies Photolithography Process and device variability: analyses and modeling Manufacturing-Aware Physical Design Closure Metrology, manufacturing defects, and defect extraction Defect impact modeling and yield improvement techniques Physical design and reliability DFM tools and methodologies

Author : Swarup Bhunia,Saibal Mukhopadhyay
Publisher : Springer Science & Business Media
Page : 444 pages
File Size : 41,7 Mb
Release : 2010-11-10
Category : Technology & Engineering
ISBN : 9781441974181

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Low-Power Variation-Tolerant Design in Nanometer Silicon by Swarup Bhunia,Saibal Mukhopadhyay Pdf

Design considerations for low-power operations and robustness with respect to variations typically impose contradictory requirements. Low-power design techniques such as voltage scaling, dual-threshold assignment and gate sizing can have large negative impact on parametric yield under process variations. This book focuses on circuit/architectural design techniques for achieving low power operation under parameter variations. We consider both logic and memory design aspects and cover modeling and analysis, as well as design methodology to achieve simultaneously low power and variation tolerance, while minimizing design overhead. This book will discuss current industrial practices and emerging challenges at future technology nodes.