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Author : J. R. Fryer
Publisher : Unknown
Page : 304 pages
File Size : 43,5 Mb
Release : 1979
Category : Science
ISBN : UOM:39015016014642
Author : Alex C. McLaren
Publisher : Cambridge University Press
Page : 401 pages
File Size : 41,5 Mb
Release : 1991-04-26
Category : Science
ISBN : 9780521350983
An introduction to the principles of transmission electron microscopy, written specifically for geologists and mineralogists.
Author : Gerhard Dehm,James M. Howe,Josef Zweck
Publisher : John Wiley & Sons
Page : 403 pages
File Size : 44,9 Mb
Release : 2012-05-30
Category : Technology & Engineering
ISBN : 9783527652181
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.
Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 54,9 Mb
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 0387258000
Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.
Author : Zhigang Li
Publisher : CRC Press
Page : 640 pages
File Size : 55,7 Mb
Release : 2002-12-04
Category : Science
ISBN : 9780824745769
Providing proven strategies for solutions to research, development, and production dilemmas, this reference details the instrumentation and underlying principles for utilization of electron microscopy in the manufacturing, automotive, semiconductor, photographic film, pharmaceutical, chemical, mineral, forensic, glass, and pulp and paper industries. The book covers safety, calibration, and troubleshooting techniques, as well as methods in sample preparation and image collection, interpretation, and analysis. It includes contributions from microscopy experts based at major corporations and scientists from universities and major research centers.
Author : John C. H. Spence
Publisher : Oxford University Press
Page : 425 pages
File Size : 49,9 Mb
Release : 2009
Category : Science
ISBN : 9780199552757
This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.
Author : Janice P. L. Kenney,Harish Veeramani,Daniel S. Alessi
Publisher : Cambridge University Press
Page : 429 pages
File Size : 51,9 Mb
Release : 2019-07-18
Category : Nature
ISBN : 9781107070332
A comprehensive handbook outlining state-of-the-art analytical techniques used in geomicrobiology, for advanced students, researchers and professional scientists.
Author : Jeanne Ayache,Luc Beaunier,Jacqueline Boumendil,Gabrielle Ehret,Danièle Laub
Publisher : Springer
Page : 0 pages
File Size : 44,8 Mb
Release : 2014-09-01
Category : Technology & Engineering
ISBN : 1489986979
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author : Peter R. Buseck
Publisher : Walter de Gruyter GmbH & Co KG
Page : 532 pages
File Size : 41,9 Mb
Release : 2018-12-17
Category : Science
ISBN : 9781501509735
Volume 27 of Reviews in Mineralogy provides a background to the TEM as a mineralogical tool, to give an introduction to the principles underlying its operation, and to explore mineralogical applications and ways in which electron microscopy can augment our knowledge of mineral structures, chemistry, and origin. Much time will be devoted to mineralogical applications. It provides sufficient information to allow mineralogists and petrologists to have an informed understanding of the data produced by transmission electron microscopy and to have enough knowledge and experience to undertake initial studies on their own. The opening chapters cover the principles of electron microscopy and chemical analysis using the TEM; while the following chapters consider mineralogical, petrological, and geochemical applications and their implications, for both low- and high-temperature geological environments. The Mineralogical Society of America sponsored a short courses in conjunction with their annual meetings with the Geological Society of America, and this volume represents the proceedings of the eighteenth in the sequence. This TEM course was convened October 23-25, 1992, at Hueston Woods State Park, College Comer, Ohio.
Author : Francis Leonard Deepak,Alvaro Mayoral,Raul Arenal
Publisher : Springer
Page : 272 pages
File Size : 47,6 Mb
Release : 2015-06-05
Category : Technology & Engineering
ISBN : 9783319151779
This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials.
Author : Peter Buseck,John Cowley,LeRoy Eyring
Publisher : Oxford University Press
Page : 670 pages
File Size : 43,9 Mb
Release : 1989-02-02
Category : Science
ISBN : 0195364651
This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.
Author : Frances M. Ross
Publisher : Cambridge University Press
Page : 529 pages
File Size : 45,5 Mb
Release : 2017
Category : Science
ISBN : 9781107116573
2.6.2 Electrodes for Electrochemistry
Author : Alex C. McLaren
Publisher : Cambridge University Press
Page : 400 pages
File Size : 49,6 Mb
Release : 2005-09-29
Category : Science
ISBN : 0521359430
Of the many techniques that have been applied to the study of crystal defects, none has contributed more to our understanding of their nature and influence on the physical and chemical properties of crystalline materials than transmission electron microscopy (TEM). TEM is now used extensively by an increasing number of earth scientists for direct observation of defect microstructures in minerals and rocks. Transmission Electron Microscopy of Rocks and Minerals is an introduction to the principles of the technique and is the only book to date on the subject written specifically for geologists and mineralogists. The first part of the book deals with the essential physics of the transmission electron microscope and presents the basic theoretical background required for the interpretation of images and electron diffraction patterns. The final chapters are concerned with specific applications of TEM in mineralogy and deal with such topics as planar defects, intergrowths, radiation-induced defects, dislocations and deformation-induced microstructures. The examples cover a wide range of rock-forming minerals from crustal rocks to those in the lower mantle, and also take into account the role of defects in important mineralogical and geological processes.
Author : Goerg H. Michler
Publisher : Springer Science & Business Media
Page : 472 pages
File Size : 45,9 Mb
Release : 2008-07-05
Category : Technology & Engineering
ISBN : 9783540363521
The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Author : Weilie Zhou,Zhong Lin Wang
Publisher : Springer Science & Business Media
Page : 533 pages
File Size : 54,6 Mb
Release : 2007-03-09
Category : Technology & Engineering
ISBN : 9780387396200
This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.