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Author : Gareth Thomas
Publisher : Unknown
Page : 326 pages
File Size : 43,5 Mb
Release : 1962
Category : Science
ISBN : UOM:39015002079708
Brings together modern data on the principles, practice, and applications of this subject.
Author : Ganka Zlateva,Zlatanka Martinova
Publisher : CRC Press
Page : 184 pages
File Size : 45,9 Mb
Release : 2008-05-05
Category : Science
ISBN : 9781420075571
A teaching tool intended to complement existing books on the theory of materials science, metallurgy, and electron microscopy, this text focuses on metals and alloys. It visualizes key structural elements common to crystalline materials, including crystal lattice imperfections, along with the principles and steps involved in the microstructure deve
Author : L.M Clarebrough
Publisher : Routledge
Page : 446 pages
File Size : 42,5 Mb
Release : 2021-09-02
Category : Science
ISBN : 9781351453196
Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.
Author : Gareth Thomas,Jack Washburn
Publisher : Unknown
Page : 1044 pages
File Size : 52,7 Mb
Release : 1963
Category : Crystallography
ISBN : UOM:39015006398708
Author : Oliver Diwald,Thomas Berger
Publisher : John Wiley & Sons
Page : 903 pages
File Size : 43,8 Mb
Release : 2021-09-14
Category : Technology & Engineering
ISBN : 9781119436744
Metal Oxide Nanoparticles A complete nanoparticle resource for chemists and industry professionals Metal oxide nanoparticles are integral to a wide range of natural and technological processes—from mineral transformation to electronics. Additionally, the fields of engineering, electronics, energy technology, and electronics all utilize metal oxide nanoparticle powders. Metal Oxide Nanoparticles: Formation, Functional Properties, and Interfaces presents readers with the most relevant synthesis and formulation approaches for using metal oxide nanoparticles as functional materials. It covers common processing routes and the assessment of physical and chemical particle properties through comprehensive and complementary characterization methods. This book will serve as an introduction to nanoparticle formulation, their interface chemistry and functional properties at the nanoscale. It will also act as an in-depth resource, sharing detailed information on advanced approaches to the physical, chemical, surface, and interface characterization of metal oxide nanoparticle powders and dispersions. Addresses the application of metal oxide nanoparticles and its economic impact Examines particle synthesis, including the principles of selected bottom-up strategies Explores nanoparticle formulation—a selection of processing and application routes Discusses the significance of particle surfaces and interfaces on structure formation, stability and functional materials properties Covers metal oxide nanoparticle characterization at different length scales With this valuable resource, academic researchers, industrial chemists, and PhD students can all gain insight into the synthesis, properties, and applications of metal oxide nanoparticles.
Author : P. E. J. Flewitt,R. K. Wild
Publisher : Ashgate Publishing
Page : 238 pages
File Size : 49,8 Mb
Release : 1986
Category : Alloys
ISBN : UCSD:31822002600203
Author : Lothar Engel,Hermann Klingele
Publisher : Manson Publishing
Page : 271 pages
File Size : 43,7 Mb
Release : 1981
Category : Electron metallography
ISBN : 0723407509
Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.
Author : J. McCall
Publisher : Springer Science & Business Media
Page : 360 pages
File Size : 54,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461587088
/.letallography is much more than taking striking pictures at high magnifications or polishing and etching specimens in such a way that no scratches can be seen. Basically, metallography is the physical metallurgist's most useful and most used tool for studying metals. Although it is perhaps his oldest tool, it certainly is not likely to become obsolete. Rather, the continued demands that have been placed upon materials have required more detailed charac terizations of their microstructures and this, in turn, has re quired the metallographer to develop new techniques to make these characterizations. Not too many years ago, the metallographer had only optical microscopes with which to examine his specimens. Now he has elec tron microscopes, scanning electron microscopes, and a whole host of instruments which were unknown to him only a relatively few years ago. This has forced him to learn not only how to use these new instruments and how to interpret the information that they provide but it also has made him develop new techniques for preparing the samples for examination.
Author : Lothar Engel,H. Klingele
Publisher : Prentice Hall
Page : 280 pages
File Size : 46,8 Mb
Release : 1981
Category : Deterioro de los metales
ISBN : OSU:32435064147333
Author : J. McCall
Publisher : Springer Science & Business Media
Page : 344 pages
File Size : 46,8 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461586937
During recent years, people involved in developing new metals and materials for use in some of the rather extreme conditions of stress, temperature, and environment have relied heavily on the microstructural condition of their materials. In fact, many of the newer materials, such as dispersion-strengthened alloys, have been designed almost entirely by first determining the microstruc ture desired and then finding the right combination of composition, heat treatment, and mechanical working that will result in the de sired microstructure. Furthermore, the extremely high reliability required of materials used today, for example, in aerospace and nuclear energy systems, requires close control on the microstruc tural conditions of materials. This is clearly evident from even a cursory examination of recently written specifications for mate rials where rather precise microstructural parameters are stipu lated. Whereas specifications written several years ago may have included microstructural requirements for details such as ASTM grain size or graphite type, today's specifications are beginning to include such things as volume fraction of phases, mean free path of particles, and grain intercept distances. Rather arbitrary terms such as "medium pearlite" have been replaced by requirements such as "interlamella spacing not to exceed 0. 1 micron. " Finally, materials users have become increasingly aware that when a material does fail, the reason for its failure may be found by examining and "reading" its microstructure. The responsibility for a particular microstructure and a resulting failure is a matter of growing importance in current product liability consider ations.
Author : Patrick Echlin
Publisher : Springer Science & Business Media
Page : 329 pages
File Size : 55,7 Mb
Release : 2011-04-14
Category : Technology & Engineering
ISBN : 9780387857312
Scanning electr on microscopy (SEM) and x-ray microanalysis can produce magnified images and in situ chemical information from virtually any type of specimen. The two instruments generally operate in a high vacuum and a very dry environment in order to produce the high energy beam of electrons needed for imaging and analysis. With a few notable exceptions, most specimens destined for study in the SEM are poor conductors and composed of beam sensitive light elements containing variable amounts of water. In the SEM, the imaging system depends on the specimen being sufficiently electrically conductive to ensure that the bulk of the incoming electrons go to ground. The formation of the image depends on collecting the different signals that are scattered as a consequence of the high energy beam interacting with the sample. Backscattered electrons and secondary electrons are generated within the primary beam-sample interactive volume and are the two principal signals used to form images. The backscattered electron coefficient ( ? ) increases with increasing atomic number of the specimen, whereas the secondary electron coefficient ( ? ) is relatively insensitive to atomic number. This fundamental diff- ence in the two signals can have an important effect on the way samples may need to be prepared. The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Author : Stephen J. Pennycook,Peter D. Nellist
Publisher : Springer Science & Business Media
Page : 764 pages
File Size : 48,5 Mb
Release : 2011-03-24
Category : Technology & Engineering
ISBN : 9781441972002
Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Author : Jeanne Ayache,Luc Beaunier,Jacqueline Boumendil,Gabrielle Ehret,Danièle Laub
Publisher : Springer Science & Business Media
Page : 250 pages
File Size : 50,9 Mb
Release : 2010-07-03
Category : Technology & Engineering
ISBN : 0387981829
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author : Jeanne Ayache,Luc Beaunier,Jacqueline Boumendil,Gabrielle Ehret,Danièle Laub
Publisher : Springer Science & Business Media
Page : 338 pages
File Size : 49,8 Mb
Release : 2010-06-08
Category : Technology & Engineering
ISBN : 1441959742
Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.
Author : Mark Michael Disko,Channing C. Ahn,Brent Fultz
Publisher : Minerals, Metals, & Materials Society
Page : 292 pages
File Size : 41,8 Mb
Release : 1992
Category : Electron energy loss spectroscopy
ISBN : UCAL:B3880275
This volume of conference proceedings characterizes the microstructure of materials ranging from polymers to superconductors. Electron energy loss spectrometry is a recent addition to the group of diffraction, imaging and spectroscopic techniques available for the study of materials by transmission electron microscope. The book is intended for the use of materials scientists who are looking for a combination of analytical tools and problem-solving approaches.
