X Ray Science

Author : J. G. Brown
Publisher : Springer Science & Business Media
Page : 260 pages
File Size : 54,7 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461343981

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X-Rays and Their Applications by J. G. Brown Pdf

This book is intended to provide a treatment of the production, properties and applications of X-rays suitable for undergraduate courses in physics. It is hoped that parts of it, at least, will be useful to students on other courses in physics, materials science, metallurgy, chemistry, engineering, etc. at various levels. It is also hoped that parts of it will serve as an introduction to the subject of X-ray crystallography, and to this end the treatment of X-ray diffraction has been designed to show the relation between the simple approach and the more sophisticated treatments. During many years of teaching this subject to Degree, Diploma in Technology and Higher National Certificate students, I have been unable to find a single book which attempts to cover the whole of this field. This lack of a treatment of X-rays and their applications in one volume has prompted me to attempt to fill the gap and this present volume is the result. Obviously in writing such a book I have referred to many existing books and I acknowledge my indebtedness to the authors of all the books which I have used. I believe that all these books are included in the re ferences at the ends of the chapters but if I have omitted any, then my apologies are offered to the authors concerned.

Author : Andreas Maier,Stefan Steidl,Vincent Christlein,Joachim Hornegger
Publisher : Springer
Page : 263 pages
File Size : 54,9 Mb
Release : 2018-08-02
Category : Computers
ISBN : 9783319965208

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Medical Imaging Systems by Andreas Maier,Stefan Steidl,Vincent Christlein,Joachim Hornegger Pdf

This open access book gives a complete and comprehensive introduction to the fields of medical imaging systems, as designed for a broad range of applications. The authors of the book first explain the foundations of system theory and image processing, before highlighting several modalities in a dedicated chapter. The initial focus is on modalities that are closely related to traditional camera systems such as endoscopy and microscopy. This is followed by more complex image formation processes: magnetic resonance imaging, X-ray projection imaging, computed tomography, X-ray phase-contrast imaging, nuclear imaging, ultrasound, and optical coherence tomography.

Author : Yoshio Waseda,Eiichiro Matsubara,Kozo Shinoda
Publisher : Springer Science & Business Media
Page : 320 pages
File Size : 52,6 Mb
Release : 2011-03-18
Category : Technology & Engineering
ISBN : 9783642166358

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X-Ray Diffraction Crystallography by Yoshio Waseda,Eiichiro Matsubara,Kozo Shinoda Pdf

X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.

Author : David Sayre,Malcolm Howells,Janos Kirz,Harvey Rarback
Publisher : Springer
Page : 464 pages
File Size : 40,5 Mb
Release : 2013-06-05
Category : Science
ISBN : 9783540392460

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X-Ray Microscopy II by David Sayre,Malcolm Howells,Janos Kirz,Harvey Rarback Pdf

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.

Author : Metin Tolan
Publisher : Springer
Page : 198 pages
File Size : 45,9 Mb
Release : 2014-03-12
Category : Technology & Engineering
ISBN : 3662142171

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X-Ray Scattering from Soft-Matter Thin Films by Metin Tolan Pdf

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

Author : Siegfried Hofmann
Publisher : Springer Science & Business Media
Page : 544 pages
File Size : 50,7 Mb
Release : 2012-10-25
Category : Science
ISBN : 9783642273803

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by Siegfried Hofmann Pdf

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Author : Gregory S. Girolami
Publisher : University Science Books
Page : 0 pages
File Size : 51,6 Mb
Release : 2015-07-31
Category : Science
ISBN : 1891389777

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X-Ray Crystallography by Gregory S. Girolami Pdf

X-Ray Crystallography is a well-balanced, thorough, and clearly written introduction to the most important and widely practiced technique to determine the arrangement of atoms in molecules and solids. Featuring excellent illustrations and homework problems throughout, the book is intended both for advanced undergraduate and graduate students who are learning the subject for the first time, as well as for those who have practical experience but seek a text summarizing the theory of diffraction and X-ray crystallography. It is organized into three parts: Part 1 deals with symmetry and space groups, Part 2 explains the physics of X rays and diffraction, and Part 3 examines the methods for solving and refining crystal structures. The discussion proceeds in a logical and clear fashion from the fundamentals through to advanced topics such as disorder, twinning, microfocus sources, low energy electron diffraction, charge flipping, protein crystallography, the maximum likelihood method of refinement, and powder, neutron, and electron diffraction. The author's clear writing style and distinctive approach is well suited for chemists, biologists, materials scientists, physicists, and scientists from related disciplines.

Author : Jens Als-Nielsen,Des McMorrow
Publisher : John Wiley & Sons
Page : 432 pages
File Size : 53,7 Mb
Release : 2011-04-20
Category : Science
ISBN : 1119970156

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Elements of Modern X-ray Physics by Jens Als-Nielsen,Des McMorrow Pdf

Eagerly awaited, this second edition of a best-selling text comprehensively describes from a modern perspective the basics of x-ray physics as well as the completely new opportunities offered by synchrotron radiation. Written by internationally acclaimed authors, the style of the book is to develop the basic physical principles without obscuring them with excessive mathematics. The second edition differs substantially from the first edition, with over 30% new material, including: A new chapter on non-crystalline diffraction - designed to appeal to the large community who study the structure of liquids, glasses, and most importantly polymers and bio-molecules A new chapter on x-ray imaging - developed in close cooperation with many of the leading experts in the field Two new chapters covering non-crystalline diffraction and imaging Many important changes to various sections in the book have been made with a view to improving the exposition Four-colour representation throughout the text to clarify key concepts Extensive problems after each chapter There is also supplementary book material for this title available online (http://booksupport.wiley.com). Praise for the previous edition: “The publication of Jens Als-Nielsen and Des McMorrow’s Elements of Modern X-ray Physics is a defining moment in the field of synchrotron radiation... a welcome addition to the bookshelves of synchrotron–radiation professionals and students alike.... The text is now my personal choice for teaching x-ray physics...” – Physics Today, 2002

Author : Charles E. S. Phillips
Publisher : Unknown
Page : 232 pages
File Size : 51,7 Mb
Release : 1897
Category : Ionizing radiation
ISBN : NYPL:33433066404967

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Bibliography of X-ray Literature and Research, 1896-1897 by Charles E. S. Phillips Pdf

Author : Gubicza, Jen?
Publisher : IGI Global
Page : 359 pages
File Size : 54,7 Mb
Release : 2014-03-31
Category : Technology & Engineering
ISBN : 9781466658530

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X-Ray Line Profile Analysis in Materials Science by Gubicza, Jen? Pdf

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Author : Andrei Benediktovich,Ilya Feranchuk,Alexander Ulyanenkov
Publisher : Springer Science & Business Media
Page : 325 pages
File Size : 45,7 Mb
Release : 2013-09-07
Category : Technology & Engineering
ISBN : 9783642381775

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Theoretical Concepts of X-Ray Nanoscale Analysis by Andrei Benediktovich,Ilya Feranchuk,Alexander Ulyanenkov Pdf

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Author : Paolo Russo
Publisher : CRC Press
Page : 1477 pages
File Size : 45,6 Mb
Release : 2017-12-14
Category : Medical
ISBN : 9781498741545

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Handbook of X-ray Imaging by Paolo Russo Pdf

Containing chapter contributions from over 130 experts, this unique publication is the first handbook dedicated to the physics and technology of X-ray imaging, offering extensive coverage of the field. This highly comprehensive work is edited by one of the world’s leading experts in X-ray imaging physics and technology and has been created with guidance from a Scientific Board containing respected and renowned scientists from around the world. The book's scope includes 2D and 3D X-ray imaging techniques from soft-X-ray to megavoltage energies, including computed tomography, fluoroscopy, dental imaging and small animal imaging, with several chapters dedicated to breast imaging techniques. 2D and 3D industrial imaging is incorporated, including imaging of artworks. Specific attention is dedicated to techniques of phase contrast X-ray imaging. The approach undertaken is one that illustrates the theory as well as the techniques and the devices routinely used in the various fields. Computational aspects are fully covered, including 3D reconstruction algorithms, hard/software phantoms, and computer-aided diagnosis. Theories of image quality are fully illustrated. Historical, radioprotection, radiation dosimetry, quality assurance and educational aspects are also covered. This handbook will be suitable for a very broad audience, including graduate students in medical physics and biomedical engineering; medical physics residents; radiographers; physicists and engineers in the field of imaging and non-destructive industrial testing using X-rays; and scientists interested in understanding and using X-ray imaging techniques. The handbook's editor, Dr. Paolo Russo, has over 30 years’ experience in the academic teaching of medical physics and X-ray imaging research. He has authored several book chapters in the field of X-ray imaging, is Editor-in-Chief of an international scientific journal in medical physics, and has responsibilities in the publication committees of international scientific organizations in medical physics. Features: Comprehensive coverage of the use of X-rays both in medical radiology and industrial testing The first handbook published to be dedicated to the physics and technology of X-rays Handbook edited by world authority, with contributions from experts in each field

Author : Emilio Segrè
Publisher : Courier Corporation
Page : 354 pages
File Size : 44,5 Mb
Release : 2012-05-03
Category : Science
ISBN : 9780486141039

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From X-rays to Quarks by Emilio Segrè Pdf

A Nobel Laureate offers impressions of the development of modern physics, emphasizing complex but less familiar personalities. Offers fascinating scientific background and compelling treatments of topics of current interest. 1980 edition.

Author : Joachim Stöhr
Publisher : Springer Nature
Page : 933 pages
File Size : 49,9 Mb
Release : 2023-06-06
Category : Science
ISBN : 9783031207440

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The Nature of X-Rays and Their Interactions with Matter by Joachim Stöhr Pdf

This book gives a comprehensive account of modern x-ray science, based on the use of synchrotron radiation and x-ray-free electron lasers (XFELs). It emphasizes the new capabilities of XFELs which extend the study of matter to the intrinsic timescales associated with the motion of atoms and chemical transformations and give birth to the new field of non-linear x-ray science. Starting with the historical understanding of the puzzling nature of light, it covers the modern description of the creation, properties, and detection of x-rays within quantum optics. It then presents the formulation of the interactions of x-rays with atomic matter, both, from semi-classical and first-principles quantum points of view. The fundamental x-ray processes and techniques, absorption, emission, Thomson, and resonant scattering (REXS and RIXS) are reviewed with emphasis on simple intuitive pictures that are illustrated by experimental results. Concepts of x-ray imaging and diffractive imaging of atomic and nano structures are discussed, and the quantum optics formulation of diffraction is presented that reveals the remarkable quantum substructure of light. The unique power of x-rays in providing atom and chemical-bond specific information and separating charge and spin phenomena through x-ray polarization (dichroism) effects are highlighted. The book concludes with the discussion of many-photon or non-linear x-ray phenomena encountered with XFELs, such as stimulated emission and x-ray transparency.

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 51,7 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781461332732

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin Pdf

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.