Advances In Scanning Probe Microscopy

Author : T. Sakurai,Y. Watanabe
Publisher : Springer Science & Business Media
Page : 352 pages
File Size : 52,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783642569494

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Advances in Scanning Probe Microscopy by T. Sakurai,Y. Watanabe Pdf

There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.

Author : Stephen Jesse
Publisher : Unknown
Page : 36 pages
File Size : 47,7 Mb
Release : 2013
Category : Materials
ISBN : OCLC:882237961

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Advances in Scanning Probe Microscopy for Imaging Functionality on the Nanoscale by Stephen Jesse Pdf

Author : Ernst Meyer,Roland Bennewitz,Hans J. Hug
Publisher : Springer Nature
Page : 330 pages
File Size : 53,6 Mb
Release : 2021-05-31
Category : Science
ISBN : 9783030370893

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Scanning Probe Microscopy by Ernst Meyer,Roland Bennewitz,Hans J. Hug Pdf

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Author : Seizo Morita
Publisher : Springer Science & Business Media
Page : 207 pages
File Size : 44,9 Mb
Release : 2006-12-30
Category : Technology & Engineering
ISBN : 9783540343158

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Roadmap of Scanning Probe Microscopy by Seizo Morita Pdf

Scanning tunneling microscopy has achieved remarkable progress and become the key technology for surface science. This book predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately taken and may accelerate research and development on nanotechnology and nanoscience, as well as all in SPM-related fields in the future.

Author : Dawn A. Bonnell,Sergei V. Kalinin
Publisher : World Scientific
Page : 640 pages
File Size : 46,7 Mb
Release : 2013
Category : Technology & Engineering
ISBN : 9789814434713

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Scanning Probe Microscopy for Energy Research by Dawn A. Bonnell,Sergei V. Kalinin Pdf

Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 41,6 Mb
Release : 2024-07-01
Category : Electronic
ISBN : 9789814462808

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Scanning Probe Microscopy by Anonim Pdf

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 1002 pages
File Size : 40,8 Mb
Release : 2007-04-03
Category : Technology & Engineering
ISBN : 9780387286686

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Scanning Probe Microscopy by Sergei V. Kalinin,Alexei Gruverman Pdf

This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.

Author : Nikodem Tomczak,Kuan Eng Johnson Goh
Publisher : World Scientific
Page : 277 pages
File Size : 54,7 Mb
Release : 2011
Category : Science
ISBN : 9789814324762

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Scanning Probe Microscopy by Nikodem Tomczak,Kuan Eng Johnson Goh Pdf

Scanning Probe Microscopy (SPM) is the enabling tool for nano(bio)technology, which has opened new vistas in many interdisciplinary research areas. Concomitant with the developments in SPM instrumentation and techniques are new and previously unthought-of opportunities in materials nanofabrication and characterisation. In particular, the developments in addressing and manipulating matter at the level of single atoms or molecules, and studies of biological materials (e.g. live cells, or cell membranes) result in new and exciting discoveries. The rising importance of SPM demands a concise treatment in the form of a book which is accessible to interdisciplinary practitioners. This book highlights recent advances in the field of SPM with sufficient depth and breadth to provide an intellectually stimulating overview of the current state of the art. The book is based on a set of carefully selected original works from renowned contributors on topics that range from atom technology, scanning tunneling spectroscopy of self-assembled nanostructures, SPM probe fabrication, scanning force microscopy applications in biology and materials science down to the single molecule level, novel scanning probe techniques, and nanolithography. The variety of topics underlines the strong interdisciplinary character of SPM related research and the combined expertise of the contributors gives us a unique opportunity to discuss possible future trends in SPM related research. This makes the book not merely a collection of already published material but an enlightening insight into cutting edge research and global SPM research trends.

Author : I. Meisel,C. S. Kniep,S. Spiegel,K. Grieve
Publisher : Wiley-VCH
Page : 0 pages
File Size : 43,5 Mb
Release : 2001-08-15
Category : Technology & Engineering
ISBN : 3527303294

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Advances in Scanning Probe Microscopy of Polymers by I. Meisel,C. S. Kniep,S. Spiegel,K. Grieve Pdf

The symposium "Recent Advances in Scanning Probe Microscopy of Polymers" held during the 220th American Chemical Society National Meeting in Washington DC in August 2000 focused on the latest advances in applications of SPM techniques for the study of polymeric and organic materials. The main topics consisted of SPM imaging of polymer morphology and microstructure, microtribological properties of polymers, micromechanical probing of polymers, microthermal imaging, studies of ultrathin and molecular organic and polymeric films, modeling of tip-surface interactions, chemical compositional analysis of heterogeneous materials, and SPM applications to industrial polymers. This volume of Macromolecular Symposia will be a valuable guide in the field of contemporary SPM studies of polymeric materials.

Author : Sergei V. Kalinin,Alexei Gruverman
Publisher : Springer Science & Business Media
Page : 563 pages
File Size : 53,5 Mb
Release : 2010-12-13
Category : Technology & Engineering
ISBN : 9781441971678

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Scanning Probe Microscopy of Functional Materials by Sergei V. Kalinin,Alexei Gruverman Pdf

The goal of this book is to provide a general overview of the rapidly developing field of novel scanning probe microscopy (SPM) techniques for characterization of a wide range of functional materials, including complex oxides, biopolymers, and semiconductors. Many recent advances in condensed matter physics and materials science, including transport mechanisms in carbon nanostructures and the role of disorder on high temperature superconductivity, would have been impossible without SPM. The unique aspect of SPM is its potential for imaging functional properties of materials as opposed to structural characterization by electron microscopy. Examples include electrical transport and magnetic, optical, and electromechanical properties. By bringing together critical reviews by leading researchers on the application of SPM to to the nanoscale characterization of functional materials properties, this book provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology.

Author : David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 40,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401144513

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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Pdf

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Page : 465 pages
File Size : 41,6 Mb
Release : 2007-12-20
Category : Technology & Engineering
ISBN : 9783540740803

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Applied Scanning Probe Methods VIII by Bharat Bhushan,Harald Fuchs,Masahiko Tomitori Pdf

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Author : Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
Publisher : Springer Science & Business Media
Page : 475 pages
File Size : 41,9 Mb
Release : 2007-12-20
Category : Technology & Engineering
ISBN : 9783540740858

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Applied Scanning Probe Methods X by Bharat Bhushan,Harald Fuchs,Masahiko Tomitori Pdf

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications.

Author : Dawn Bonnell
Publisher : John Wiley & Sons
Page : 520 pages
File Size : 41,5 Mb
Release : 2000-12-05
Category : Science
ISBN : 9780471248248

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Scanning Probe Microscopy and Spectroscopy by Dawn Bonnell Pdf

A practical introduction to basic theory and contemporary applications across a wide range of research disciplines Over the past two decades, scanning probe microscopies and spectroscopies have gained acceptance as indispensable characterization tools for an array of disciplines. This book provides novices and experienced researchers with a highly accessible treatment of basic theory, alongside detailed examples of current applications of both scanning tunneling and force microscopies and spectroscopies. Like its popular predecessor, Scanning Probe Microscopy and Spectroscopy, Second Edition features contributions from distinguished scientists working in a wide range of specialties at university, commercial, and government research labs around the world. Chapters have been edited for clarity, conciseness, and uniformity of presentation to provide professionals with a concise working reference to scanning probe microscopic and spectroscopic principles, techniques, and practices. This Second Edition has been substantially revised and expanded to reflect important advances and new applications. In addition to numerous examples, the Second Edition features expanded coverage of electrostatic and magnetic force microscopies, near-field optical microscopies, and new applications of buried interfaces in nanomechanics, electrochemistry, and biology. Scanning Probe Microscopy and Spectroscopy, Second Edition is an indispensable working resource for surface scientists, microscopists, and spectroscopists in materials science, chemistry, engineering, biochemistry, physics, and the life sciences. It is also an unparalleled reference text for advanced undergraduates and graduate students in those fields.

Author : Vladimir V. Tsukruk,Srikanth Singamaneni
Publisher : John Wiley & Sons
Page : 663 pages
File Size : 42,9 Mb
Release : 2012-01-09
Category : Technology & Engineering
ISBN : 9783527639960

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Scanning Probe Microscopy of Soft Matter by Vladimir V. Tsukruk,Srikanth Singamaneni Pdf

Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors