Author : Mark J. Gierl,Hollis Lai,Vasily Tanygin
Publisher : Routledge
Page : 190 pages
File Size : 55,6 Mb
Release : 2021-05-18
Category : Education
ISBN : 9781000378009
Advanced Methods in Automatic Item Generation by Mark J. Gierl,Hollis Lai,Vasily Tanygin Pdf
Advanced Methods in Automatic Item Generation is an up-to-date survey of the growing research on automatic item generation (AIG) in today’s technology-enhanced educational measurement sector. As test administration procedures increasingly integrate digital media and Internet use, assessment stakeholders—from graduate students to scholars to industry professionals—have numerous opportunities to study and create different types of tests and test items. This comprehensive analysis offers thorough coverage of the theoretical foundations and concepts that define AIG, as well as the practical considerations required to produce and apply large numbers of useful test items.