Cluster Secondary Ion Mass Spectrometry

Author : Christine M. Mahoney
Publisher : John Wiley & Sons
Page : 325 pages
File Size : 40,5 Mb
Release : 2013-04-17
Category : Science
ISBN : 9781118589243

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Cluster Secondary Ion Mass Spectrometry by Christine M. Mahoney Pdf

Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.

Author : J. C. Vickerman,Alan Brown,Nicola M. Reed
Publisher : Oxford University Press, USA
Page : 368 pages
File Size : 52,9 Mb
Release : 1989
Category : Business & Economics
ISBN : UOM:39015017018667

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Secondary Ion Mass Spectrometry by J. C. Vickerman,Alan Brown,Nicola M. Reed Pdf

This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.

Author : Paul van der Heide
Publisher : John Wiley & Sons
Page : 412 pages
File Size : 42,5 Mb
Release : 2014-08-19
Category : Science
ISBN : 9781118916773

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Secondary Ion Mass Spectrometry by Paul van der Heide Pdf

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) • Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations • Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission • Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) • Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions • Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Author : J. C. Vickerman,David Briggs
Publisher : IM Publications
Page : 742 pages
File Size : 55,7 Mb
Release : 2013
Category : Mass spectrometry
ISBN : 9781906715175

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ToF-SIMS by J. C. Vickerman,David Briggs Pdf

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

Author : Sarah Fearn
Publisher : Morgan & Claypool Publishers
Page : 67 pages
File Size : 48,7 Mb
Release : 2015-10-16
Category : Technology & Engineering
ISBN : 9781681740881

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science by Sarah Fearn Pdf

This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Author : A. Benninghoven,C.A. Jr. Evans,R.A. Powell,R. Shimizu,H.A. Storms
Publisher : Springer Science & Business Media
Page : 310 pages
File Size : 49,8 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783642618710

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Secondary Ion Mass Spectrometry SIMS II by A. Benninghoven,C.A. Jr. Evans,R.A. Powell,R. Shimizu,H.A. Storms Pdf

Author : G. Gillen,R. Lareau,J. Bennett,F. Stevie
Publisher : Wiley
Page : 1150 pages
File Size : 47,7 Mb
Release : 1998-03-06
Category : Technology & Engineering
ISBN : 0471978264

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Secondary Ion Mass Spectrometry SIMS XI by G. Gillen,R. Lareau,J. Bennett,F. Stevie Pdf

This volume contains 252 contributions presented as plenary,invited and contributed poster and oral presentations at the 11thInternational Conference on Secondary Ion Mass Spectrometry (SIMSXI) held at the Hilton Hotel, Walt Disney World Village, Orlando,Florida, 7 12 September, 1997. The book covers a diverse range ofresearch, reflecting the rapid growth in advanced semiconductorcharacterization, ultra shallow depth profiling, TOF-SIMS and thenew areas in which SIMS techniques are being used, for example inbiological sciences and organic surface characterization. Papersare presented under the following categories: * Isotopic SIMS * Biological SIMS * Semiconductor Characterization Techniques and Applications * Ultra Shallow Depth Profiling * Depth Profiling Fundamental/Modelling and Diffusion * Sputter-Induced Topography * Fundamentals of Molecular Desorption * Organic Materials * Practical TOF-SIMS * Polyatomic Primary Ions * Materials/Surface Analysis * Postionization * Instrumentation * Geological SIMS * Imaging * Fundamentals of Sputtering * Ion Formation and Cluster Formation * Quantitative Analysis Environmental/ParticleCharacterization * Related Techniques These proceedings provide an invaluable source of reference forboth newcomers to the field and experienced SIMS users.

Author : Kurt F. J. Heinrich,Dale E. Newbury
Publisher : Unknown
Page : 244 pages
File Size : 41,6 Mb
Release : 1975
Category : Mass spectrometry
ISBN : UOM:39015077585878

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Secondary Ion Mass Spectrometry by Kurt F. J. Heinrich,Dale E. Newbury Pdf

Author : A. Benninghoven,P. Bertrand,H. N. Migeon
Publisher : Elsevier Science & Technology
Page : 1092 pages
File Size : 55,8 Mb
Release : 2000
Category : Science
ISBN : STANFORD:36105110323065

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Secondary Ion Mass Spectrometry by A. Benninghoven,P. Bertrand,H. N. Migeon Pdf

Hardbound. This biennial conference series is the first international forum covering developments in Secondary Ion Mass Spectrometry. All aspects of the most recent developments in SIMS were covered by the scientific program: fundamentals, instrumentation, methodology, and analytical applications in different fields (semiconductors, polymer and organic materials, life sciences, environmental sciences, earth sciences, materials science). Related techniques and topics were also included.

Author : Freddy Adams,Carlo Barbante
Publisher : Elsevier
Page : 480 pages
File Size : 47,9 Mb
Release : 2015-06-06
Category : Science
ISBN : 9780444634504

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Chemical Imaging Analysis by Freddy Adams,Carlo Barbante Pdf

Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed – or adapted from existing techniques – and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques. Provides comprehensive coverage of analytical techniques used in chemical imaging analysis Explores a variety of specialized techniques Provides a general overview of imaging techniques in diverse fields

Author : Anonim
Publisher : Academic Press
Page : 428 pages
File Size : 51,5 Mb
Release : 2021-12-01
Category : Science
ISBN : 9780323911153

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New Methods and Sensors for Membrane and Cell Volume Research by Anonim Pdf

New Methods and Sensors for Membrane and Cell Volume Research, Volume 88 provides an overview of novel experimental approaches to study both the cell membrane and the under-membrane space – the cytosol, which have lately began drawing renewed attention. The book's overall emphasis is on fluorescent and FRET-based sensors, however, other optical (such as variants of transmission microscopy) and non-optical methods (neutron scattering and mass spectrometry) also have dedicated chapters. This volume provides a rare review of experimental approaches to study intracellular phase transitions, as well as anion channels, membrane tension and dynamics, and other topics of intense current interest. Describes novel FRET-based membrane sensors Reviews selected non-optical approaches to membrane structure and dynamics Describes traditional and modern aspects of cell volume research, such as phase transitions and macromolecular crowding

Author : K. L. Mittal,H. S. Bui
Publisher : John Wiley & Sons
Page : 720 pages
File Size : 51,6 Mb
Release : 2021-04-06
Category : Technology & Engineering
ISBN : 9781119654827

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Surface Science and Adhesion in Cosmetics by K. L. Mittal,H. S. Bui Pdf

Activity in the arena of surface chemistry and adhesion aspects in cosmetics is substantial, but the information is scattered in many diverse publications media and no book exists which discusses surface chemistry and adhesion in cosmetics in unified manner. This book containing 15 chapters written by eminent researchers from academia and industry is divided into three parts: Part 1: General Topics; Part 2: Surface Chemistry Aspects; and Part 3: Wetting and Adhesion Aspects. The topics covered include: Lip biophysical properties and characterization; use of advanced silicone materials in long-lasting cosmetics; non-aqueous dispersions of acrylate copolymers in lipsticks; cosmetic oils in Lipstick structure; chemical structure of the hair surface, surface forces and interactions; AFM for hair surface characterization; application of AFM in characterizing hair, skin and cosmetic deposition; SIMS as a surface analysis method for hair, skin and cosmetics; surface tensiometry approach to characterize cosmetic products; spreading of hairsprays on hair; color transfer from long-wear face foundation products; interaction of polyelectrolytes and surfactants on hair surfaces; cosmetic adhesion to facial skin; and adhesion aspects in semi-permanent mascara; lipstick adhesion measurement.

Author : Mike S. Lee
Publisher : John Wiley & Sons
Page : 1362 pages
File Size : 52,8 Mb
Release : 2012-05-08
Category : Science
ISBN : 9780470536735

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Mass Spectrometry Handbook by Mike S. Lee Pdf

Due to its enormous sensitivity and ease of use, mass spectrometry has grown into the analytical tool of choice in most industries and areas of research. This unique reference provides an extensive library of methods used in mass spectrometry, covering applications of mass spectrometry in fields as diverse as drug discovery, environmental science, forensic science, clinical analysis, polymers, oil composition, doping, cellular research, semiconductor, ceramics, metals and alloys, and homeland security. The book provides the reader with a protocol for the technique described (including sampling methods) and explains why to use a particular method and not others. Essential for MS specialists working in industrial, environmental, and clinical fields.

Author : Alfred Benninghoven,Richard J. Colton,David S. Simons,Helmut W. Werner
Publisher : Springer Science & Business Media
Page : 578 pages
File Size : 43,8 Mb
Release : 2012-12-06
Category : Science
ISBN : 9783642827242

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Secondary Ion Mass Spectrometry SIMS V by Alfred Benninghoven,Richard J. Colton,David S. Simons,Helmut W. Werner Pdf

This volume contains the proceedings of the Fifth International Confer ence on Secondary Ion Mass Spectrometry (SIMS V), held at the Capitol Holiday Inn, Washington, DC, USA, from September 30 to October 4, 1985. The conference was the fifth in a series of conferences held bienni ally. Previous conferences were held in Miinster (1977), Stanford (1979), Budapest (1981), and Osaka (1983). SIMS V was organized by Dr. R.J. Colton of the Nayal Research Lab oratory and Dr. D.S. Simons of the National Bureau of Standards un der the auspices of the International Organizing Committee chaired by Prof. A. Benninghoven of the Universitat Miinster. Dr. Richard F.K. Herzog served as the honorary chairman of SIMS V. While Dr. Herzog is best known to the mass spectrometry community for his theoretical development of a mass spectrometer design, known as the Mattauch-Herzog geometry, he also made several early and impor tant contributions to SIMS. In 1949, Herzog and Viehbock published a description of the first instrument designed to study secondary ions pro duced by bombardment from a beam of ions generated in a source that was separated from the sample by a narrow tube. Later at the GCA Cor poration, he brought together a team of researchers including H.J. Liebl, F.G. Riidenauer, W.P. Poschenrieder and F.G. Satkiewicz, who designed and built, and carried out applied research with the first commercial ion microprobe.

Author : Jacek Grams
Publisher : Nova Publishers
Page : 292 pages
File Size : 52,6 Mb
Release : 2007
Category : Science
ISBN : 1600216358

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New Trends and Potentialities of ToF-SIMS in Surface Studies by Jacek Grams Pdf

This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS). It includes research and applications of the new primary ion guns. It also describes new possibilities of mass spectrometers and instrumentation development.