Current Material Research Using X Rays Related Techniques
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Hasan Zuhudi Abdullah,Rosniza Hussin,Mas Fawzi Mohd Ali,Hariati Mohd Taib,Sufizar Ahmad,Ainun Rahmahwati Ainuddin,Hamimah Abdul Rahman,Mohamed Nasrul Mohd Hatta,Wan Nur Azrina Wan Muhammad,Shahruddin Mahzan,Maizlinda Izwana Idris,Nur Azam Badarulzaman,Siti Aida Ibrahim,Zawati Harun
Author : Hasan Zuhudi Abdullah,Rosniza Hussin,Mas Fawzi Mohd Ali,Hariati Mohd Taib,Sufizar Ahmad,Ainun Rahmahwati Ainuddin,Hamimah Abdul Rahman,Mohamed Nasrul Mohd Hatta,Wan Nur Azrina Wan Muhammad,Shahruddin Mahzan,Maizlinda Izwana Idris,Nur Azam Badarulzaman,Siti Aida Ibrahim,Zawati Harun Publisher : Trans Tech Publications Ltd Page : 540 pages File Size : 52,9 Mb Release : 2015-02-10 Category : Technology & Engineering ISBN : 9783038267942
Current Material Research Using X-Rays & Related Techniques by Hasan Zuhudi Abdullah,Rosniza Hussin,Mas Fawzi Mohd Ali,Hariati Mohd Taib,Sufizar Ahmad,Ainun Rahmahwati Ainuddin,Hamimah Abdul Rahman,Mohamed Nasrul Mohd Hatta,Wan Nur Azrina Wan Muhammad,Shahruddin Mahzan,Maizlinda Izwana Idris,Nur Azam Badarulzaman,Siti Aida Ibrahim,Zawati Harun Pdf
As we have known, X-ray and related techniques are mainly used for quality control and materials characterization study. Most of the equipment used in these activities has contributed a lot to the advancement of materials science, solid state physics, chemistry, medical and other fields. In recent years, there have been a lot of improvements that includes the introduction of an array of software including instrument control, data interpretation and standard data that may provide quick results with enhanced efficiency. IXCRI 2014 aims to exchange and share experiences and research findings in all aspects of X-rays and related techniques among academics, researchers and the industry. Not only that, ICXRI 2014 includes a workshop session, which allows participants to gain a hands-on experience in learning fundamental understanding on X-ray applications. Due to this unique conference-workshop combination, I strongly believe that this conference will have a huge impact and will lead to future innovations and strong linkages among the participants. This is reflected in the number of participants, which amounts to a total of nearly 100 papers being presented here in this conference.
Current Material Research Using X-Rays and Related Techniques II by Zainal Arifin Ahmad,Meor Yusoff Meor Sulaiman,Mohd Ambar Yarmo,Fauziah Abdul Aziz,Khairul Nizar Ismail,Norazharuddin Shah Abdullah,Yusof Abdullah,Nik Akmar Rejab,Mohsen Ahmadipour Pdf
Selected, peer reviewed papers from the International Conference on X-Rays and Related Techniques in Research and Industry 2016 (ICXRI2016), August 17-18, 2016, Putrajaya, Malaysia
Current Materials Research Using X-Rays and Related Techniques III by Muhamad Faiz Md Din,Fakhroul Ridzuan Hashim,Nazrul Fariq Makmor,Muhammad Azwadi Sulaiman,Norazharuddin Shah Abdullah,Wan Fahmin Faiz Wan Ali,Nik Akmar Rejab Pdf
Selected peer-reviewed full text papers from the 10th International Conference on X-Rays and Related Techniques in Research and Industry (ICXRI 2021)
Zainal Arifin Ahmad,Muhd Ambar Yarmo,Fauziah Haji Abdul Aziz,Meor Yusoff Meor Sulaiman,Badrol Ahmad,Khairul Nizar Ismail,Norazharuddin Shah Bin Abdullah,Muhammad Azwadi Sulaiman,Ahamd Zahirani Ahmad Azhar
Author : Zainal Arifin Ahmad,Muhd Ambar Yarmo,Fauziah Haji Abdul Aziz,Meor Yusoff Meor Sulaiman,Badrol Ahmad,Khairul Nizar Ismail,Norazharuddin Shah Bin Abdullah,Muhammad Azwadi Sulaiman,Ahamd Zahirani Ahmad Azhar Publisher : Trans Tech Publication Page : 523 pages File Size : 52,8 Mb Release : 2013 Category : Technology & Engineering ISBN : 3037855606
Advanced X-ray Characterization Techniques by Zainal Arifin Ahmad,Muhd Ambar Yarmo,Fauziah Haji Abdul Aziz,Meor Yusoff Meor Sulaiman,Badrol Ahmad,Khairul Nizar Ismail,Norazharuddin Shah Bin Abdullah,Muhammad Azwadi Sulaiman,Ahamd Zahirani Ahmad Azhar Pdf
X-ray applications and techniques are gaining importance and are moving to the forefront of science. A powerful tool with many advantages, X-ray applications and techniques present a route for rapid, hassle-free, non-destructive, safe and accurate analysis. This book contains a compilation of papers, all related to X-ray techniques, which are applied in various areas of science and technology, namely in research and industry. This publication aims to showcase the current diversity and versatility of X-ray related techniques. With contributors from all around the world, this publication of compiled papers will relate a host of X-ray related techniques with aims and the eventual findings, all of which are presented in a short and concise manner. It is believed that this book will be a good scientific literature which provides clear and important information on X-ray related ventures.
High-Z Materials for X-ray Detection by Leonardo Abbene,Krzysztof (Kris) Iniewski Pdf
This book will provide readers with a good overview of some of most recent advances in the field of High-Z materials. There will be a good mixture of general chapters in both technology and applications in opto-electronics, X-ray detection and emerging optoelectronics applications. The book will have an in-depth review of the research topics from world-leading specialists in the field.
Introduction to X-Ray Powder Diffractometry by Ron Jenkins,Robert Snyder Pdf
When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity. Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation. The first three chapters outline diffraction theory in clear language, accessible to both students and professionals in chemistry, physics, geology, and materials science. The book's middle chapters describe the instrumentation and procedures used in X-ray diffraction, including X-ray sources, X-ray detection, and production of monochromatic radiation. The chapter devoted to instrument design and calibration is followed by an examination of specimen preparation methods, data collection, and reduction. The final two chapters provide in-depth discussions of qualitative and quantitative analysis. While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material. Self-contained, timely, and user-friendly, Introduction to X-ray Powder Diffractometry is an enormously useful text and professional reference for analytical chemists, physicists, geologists and materials scientists, and upper-level undergraduate and graduate students in materials science and analytical chemistry. X-ray powder diffraction-a technique that has matured significantly in recent years-is used to identify solid samples and determine their composition by analyzing the so-called "fingerprints" they generate when X-rayed. This unique volume fulfills two major roles: it is the first textbook devoted solely to X-ray powder diffractometry, and the first up-to-date treatment of the subject in 20 years. This timely, authoritative volume features: * Clear, concise descriptions of both theory and practice-including fundamentals of diffraction theory and all aspects of the diffractometer * A treatment that reflects current trends toward automation, covering the newest instrumentation and automation techniques * Coverage of all the most common applications, with special emphasis on qualitative and quantitative analysis * An accessible presentation appropriate for both students and professionals * More than 230 tables and illustrations Introduction to X-ray Powder Diffractometry, a collaboration between two internationally known and respected experts in the field, provides invaluable guidance to anyone using X-ray powder diffractometers and diffractometry in materials science, ceramics, the pharmaceutical industry, and elsewhere.
X-Ray Fluorescence Spectrometry and Related Techniques by Eva Margui,Rene Van Grieken Pdf
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Containing chapter contributions from over 130 experts, this unique publication is the first handbook dedicated to the physics and technology of X-ray imaging, offering extensive coverage of the field. This highly comprehensive work is edited by one of the world’s leading experts in X-ray imaging physics and technology and has been created with guidance from a Scientific Board containing respected and renowned scientists from around the world. The book's scope includes 2D and 3D X-ray imaging techniques from soft-X-ray to megavoltage energies, including computed tomography, fluoroscopy, dental imaging and small animal imaging, with several chapters dedicated to breast imaging techniques. 2D and 3D industrial imaging is incorporated, including imaging of artworks. Specific attention is dedicated to techniques of phase contrast X-ray imaging. The approach undertaken is one that illustrates the theory as well as the techniques and the devices routinely used in the various fields. Computational aspects are fully covered, including 3D reconstruction algorithms, hard/software phantoms, and computer-aided diagnosis. Theories of image quality are fully illustrated. Historical, radioprotection, radiation dosimetry, quality assurance and educational aspects are also covered. This handbook will be suitable for a very broad audience, including graduate students in medical physics and biomedical engineering; medical physics residents; radiographers; physicists and engineers in the field of imaging and non-destructive industrial testing using X-rays; and scientists interested in understanding and using X-ray imaging techniques. The handbook's editor, Dr. Paolo Russo, has over 30 years’ experience in the academic teaching of medical physics and X-ray imaging research. He has authored several book chapters in the field of X-ray imaging, is Editor-in-Chief of an international scientific journal in medical physics, and has responsibilities in the publication committees of international scientific organizations in medical physics. Features: Comprehensive coverage of the use of X-rays both in medical radiology and industrial testing The first handbook published to be dedicated to the physics and technology of X-rays Handbook edited by world authority, with contributions from experts in each field
Industrial X-Ray Computed Tomography by Simone Carmignato,Wim Dewulf,Richard Leach Pdf
X-ray computed tomography has been used for several decades as a tool for measuring the three-dimensional geometry of the internal organs in medicine. However, in recent years, we have seen a move in manufacturing industries for the use of X-ray computed tomography; first to give qualitative information about the internal geometry and defects in a component, and more recently, as a fully-quantitative technique for dimensional and materials analysis. This trend is primarily due to the ability of X-ray computed tomography to give a high-density and multi-scale representation of both the external and internal geometry of a component, in a non-destructive, non-contact and relatively fast way. But, due to the complexity of X-ray computed tomography, there are remaining metrological issues to solve and the specification standards are still under development. This book will act as a one-stop-shop resource for students and users of X-ray computed tomography in both academia and industry. It presents the fundamental principles of the technique, detailed descriptions of the various components (hardware and software), current developments in calibration and performance verification and a wealth of example applications. The book will also highlight where there is still work to do, in the perspective that X-ray computed tomography will be an essential part of Industry 4.0.
X-Ray Spectrometry by Kouichi Tsuji,Jasna Injuk,René Van Grieken Pdf
X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.
Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott,David C. Joy
Author : Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott,David C. Joy Publisher : Springer Page : 554 pages File Size : 51,6 Mb Release : 2017-11-17 Category : Technology & Engineering ISBN : 9781493966769
Scanning Electron Microscopy and X-Ray Microanalysis by Joseph I. Goldstein,Dale E. Newbury,Joseph R. Michael,Nicholas W.M. Ritchie,John Henry J. Scott,David C. Joy Pdf
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD). With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solving Covers Helium ion scanning microscopy Organized into relatively self-contained modules – no need to "read it all" to understand a topic Includes an online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3
Handbook of Practical X-Ray Fluorescence Analysis by Burkhard Beckhoff,Birgit Kanngießer,Norbert Langhoff,Reiner Wedell,Helmut Wolff Pdf
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Nonlinear X-Ray Spectroscopy for Materials Science by Iwao Matsuda,Ryuichi Arafune Pdf
X-ray experiments have been used widely in materials science, and conventional spectroscopy has been based on linear responses in light–matter interactions. Recent development of ultrafast light sources of tabletop lasers and X-ray free electron lasers reveals nonlinear optical phenomena in the X-ray region, and the measurement signals have been found to carry a further wealth of information on materials. This book overviews such nonlinear X-ray spectroscopy and its related issues for materials science. Each chapter is written by pioneers in the field and skillfully reviews the topics of nonlinear spectroscopy including X-ray multi-photon absorption and X-ray second harmonic generation. The chapters are divided depending on photon wavelength, ranging from extreme ultraviolet to (soft) X-ray. To facilitate readers’ comprehensive understanding, some of the chapters cover the conventional linear X-ray spectroscopy and basic principles of the non-linear responses. The book is mainly accessible as a primer for junior/senior- or graduate-level readers, and it also serves as a useful reference or guide even for established researchers in optical spectroscopy. The book offers readers opportunities to benefit from cutting-edge research in this new area of nonlinear X-ray spectroscopy.
