Electron Spectroscopy

Author : G. McGuire
Publisher : Springer Science & Business Media
Page : 144 pages
File Size : 45,9 Mb
Release : 2013-03-09
Category : Science
ISBN : 9781475717020

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Auger Electron Spectroscopy Reference Manual by G. McGuire Pdf

Auger electron spectroscopy (AES) is based on the Auger total secondary electron energy distribution, and an ion gun to process, which involves the core-level ionization of an atom with provide depth profiling capability. subsequent deexcitation occurring by an outer-level electron de The high surface sensitivity of Auger spectroscopy which dictates caying to fill the core hole. The excess energy is transferred to the need for an ultrahigh-vacuum system is due to the limited and causes the ejection of another electron, which is by definition mean free path of electrons in the 0-3000 e V kinetic energy an Auger electron. The Auger electron transition, denoted by range. The Auger peaks decay exponentially with overlayer cov the electron levels involved, is independent of the excitation erage, which is consistent with an exponential dependence of source and leaves the atom with a constant kinetic energy. The escape probability on the depth of the parent atom. A compila kinetic energy is given by the differences in binding energies for tion of data from a variety of sources has been used to generate the three levels (for example, EK-E L, - EL ) minus a correction 2 an escape depth curve which falls in the range of 5-30 A in the term for the work function and electron wave function relaxation. energy range from 0 to 3000 eV. The observed escape depth does When the Auger transition occurs within a few angstroms of the not show a strong dependence on the matrix.

Author : H. Ibach
Publisher : Springer Science & Business Media
Page : 265 pages
File Size : 48,6 Mb
Release : 2012-12-06
Category : Science
ISBN : 9783642810992

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Electron Spectroscopy for Surface Analysis by H. Ibach Pdf

The development of surface physics and surface chemistry as a science is closely related to the technical development of a number of methods involving electrons either as an excitation source or as an emitted particle carrying characteristic information. Many of these various kinds of electron spectroscopies have become commercially available and have made their way into industrial laboratories. Others are still in an early stage, but may become of increasing importance in the future. In this book an assessment of the various merits and possible drawbacks of the most frequently used electron spectroscopies is attempted. Emphasis is put on prac tical examples and experimental design rather than on theoretical considerations. The book addresses itself to the reader who wishes to know which electron spectroscopy or which combination of different electron spectroscopies he may choose for the particular problems under investigation. After a brief introduction the practical design of electron spectrometers and their figures of merit important for the different applications are discussed in Chapter 2. Chapter 3 deals with electron excited electron spectroscopies which are used for the elemental analysis of surfaces. Structure analysis by electron diffrac tion is described in Chapter 4 with special emphasis on the use of electron diffrac tion for the investigation of surface imperfections. For the application of electron diffraction to surface crystallography in general, the reader is referred to Volume 4 of "Topics in Applied Physics".

Author : C. R. Brundle
Publisher : Mittal Publications
Page : 274 pages
File Size : 44,9 Mb
Release : 2002
Category : Electron spectroscopy
ISBN : 8170998255

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Electron Spectroscopy by C. R. Brundle Pdf

Author : R.F. Egerton
Publisher : Springer Science & Business Media
Page : 491 pages
File Size : 52,7 Mb
Release : 2013-03-09
Category : Science
ISBN : 9781475750997

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Electron Energy-Loss Spectroscopy in the Electron Microscope by R.F. Egerton Pdf

to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones. Except for a few small changes, the notation is the same as in the first edition, with all equations in SI units.

Author : Thomas Carlson
Publisher : Springer Science & Business Media
Page : 427 pages
File Size : 48,8 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781475701180

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Photoelectron and Auger Spectroscopy by Thomas Carlson Pdf

In 1970 when I first seriously contemplated writing a book on electron spectroscopy, I recognized the impossibility of completely reaching my desired goals. First, the field was expanding (and still is) at such a rate that a definitive statement of the subject is not possible. The act of following the literature comprehensively and summarizing its essential content proved to be a diver gent series. On the other hand, the field has increased to such a size that violent changes in its basic makeup no longer occur with the frequency that was present in its early days. Furthermore, the excitement of electron spectro scopy lies in its many-faceted interrelationships. In the era of specialization, electron spectroscopy is an open-ended subject continually bringing together new aspects of science. I wished to discuss not just one type of electron spectro scopy, but as many as would be possible. The book as it stands concentrates its attention on x-ray photoelectron spectroscopy, but also presents the basis of Auger electron spectroscopy and uv photoelectron spectroscopy, as well as mentioning many of the other branches of the field. A large, many-author volume might be an answer to some of these problems. However, though anyone person possesses only a limited amount of expertise, I have always enjoyed books by a single author since what they lack in detailed knowledge they gain in a unified viewpoint. I hope the final product, though limited in its attainment of these goals, will still be of some merit.

Author : V. Nemoshkalenko
Publisher : Springer Science & Business Media
Page : 371 pages
File Size : 42,6 Mb
Release : 2013-03-09
Category : Science
ISBN : 9781461329015

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Electron Spectroscopy of Crystals by V. Nemoshkalenko Pdf

This book is conceived as a monograph, and represents an up-to-date collection of information concerning the use of the method of X-ray photoelectron spec troscopy in the study of the electron structure of crystals, as well as a personal interpretation of the subject by the authors. In a natural way, the book starts in Chapter 1 with a recapitulation of the fundamentals of the method, basic relations, principles of operation, and a com parative presentation of the characteristics and performances of the most com monly used ESCA instruments (from the classical ones-Varian, McPherson, Hewlett Packard, and IEEE-up to the latest model developed by Professor Siegbahn in Uppsala), and continues with a discussion of some of the difficult problems the experimentalist must face such as calibration of spectra, prepara tion of samples, and evaluation of the escape depth of electrons. The second chapter is devoted to the theory of photoemission from crystal line solids. A discussion of the methods of Hartree-Fock and Hartree-Fock Slater for the calculation of bonding energy levels in multielectronic systems is presented, and the necessity of including in the theory both relativistic and relaxation effects is argued.

Author : John Ferrante,Donald H. Buckley
Publisher : Unknown
Page : 28 pages
File Size : 40,6 Mb
Release : 1970
Category : Aluminum-copper alloys
ISBN : UIUC:30112106880575

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Auger Electron Spectroscopy Study of Surface Segregation in Copper-aluminum Alloys by John Ferrante,Donald H. Buckley Pdf

Surface segregation of aluminum has been observed in copper-aluminum alloys by use of LEED and Auger electron spectroscopy studies. The alloys were solid solutions of aluminum in copper having compositions of 1, 5, and 10 atomic percent aluminum. All samples were single crystals oriented in the (111) direction. Surface concentrations five times that in the bulk were observed. LEED and characteristic loss data gave confirming evidence of surface composition changes. Surface concentration increased with temperature on heating to 700 [degree] C.

Author : Siegfried Hofmann
Publisher : Springer Science & Business Media
Page : 544 pages
File Size : 50,5 Mb
Release : 2012-10-25
Category : Science
ISBN : 9783642273803

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by Siegfried Hofmann Pdf

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Author : Hassan Windawi,Floyd F.-L. Ho
Publisher : John Wiley & Sons
Page : 238 pages
File Size : 55,5 Mb
Release : 1982
Category : Electron spectroscopy
ISBN : UCAL:B5036596

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Applied Electron Spectroscopy for Chemical Analysis by Hassan Windawi,Floyd F.-L. Ho Pdf

Good,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine.

Author : A. Modinos
Publisher : Springer Science & Business Media
Page : 375 pages
File Size : 53,9 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781475714487

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Field, Thermionic and Secondary Electron Emission Spectroscopy by A. Modinos Pdf

Author : A. D. Baker,D. Betteridge
Publisher : Elsevier
Page : 193 pages
File Size : 44,5 Mb
Release : 2013-10-22
Category : Science
ISBN : 9781483152363

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Photoelectron Spectroscopy by A. D. Baker,D. Betteridge Pdf

Photoelectron Spectroscopy provides an introduction to the principles of photoelectron spectroscopy, including its applications in structural and analytical chemistry. It deals with both X-ray and UV-photoelectron spectroscopy. This book begins with the basic principles of electron spectroscopy and describes the UV photoelectron spectrometers and X-ray photoelectron spectrometers. It then lists several factors influencing the appearance of the photoelectron spectra. This book concludes by describing other forms of electron spectroscopy and photoelectron techniques. Students and chemists who are looking for a readable introduction to photoelectron spectroscopy will find this book useful.

Author : Graham C. Smith
Publisher : Springer Science & Business Media
Page : 165 pages
File Size : 40,7 Mb
Release : 2013-11-21
Category : Science
ISBN : 9781489909671

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Surface Analysis by Electron Spectroscopy by Graham C. Smith Pdf

This book is t~e fifth in aseries of scientific textbooks designed to cover advances in selected research fields from a basic and general view point. The reader is taken carefully but rapidly through the introductory material in order that t~e significance of recent developments can be understood with only limited initial knowledge. The inclusion in the Appendix of the abstracts of many of the more important papers in the field provides further assistance for the non-specialist, and acts as aspringboard to supplementary reading for those who wish to consult the original liter ature. Surface analysis has been the subject of numerous books and review articles, and the fundamental scientific principles of t~e more popular techniques are now reasonably weIl established. This book is concerned with the very powerful techniques of Auger electron and X-ray photoelectron spectroscopy (AES and XPS), with an emphasis on how they may be performed as part of a modern analytical facility. Since the development of AES and XPS in the late 1960s and early 1970s there have been great strides forward in the sensitivities and resolutions of the instrumentation. Simultaneously, these spectroscopies have undergone a veritable explosion, both in their acceptance alongside more routine ana1ytical techniques and in the range of problems and materials to which they are applied. As a result, many researchers in industry and in academia now come into contact with AES and XPS not as specialists, but as users.

Author : Siegfried Hofmann
Publisher : Springer Science & Business Media
Page : 545 pages
File Size : 45,8 Mb
Release : 2012-10-25
Category : Science
ISBN : 9783642273810

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science by Siegfried Hofmann Pdf

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.

Author : Patrick Bertrand
Publisher : Springer Nature
Page : 420 pages
File Size : 52,9 Mb
Release : 2020-02-03
Category : Science
ISBN : 9783030396633

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Electron Paramagnetic Resonance Spectroscopy by Patrick Bertrand Pdf

Although originally invented and employed by physicists, electron paramagnetic resonance (EPR) spectroscopy has proven to be a very efficient technique for studying a wide range of phenomena in many fields, such as chemistry, biochemistry, geology, archaeology, medicine, biotechnology, and environmental sciences. Acknowledging that not all studies require the same level of understanding of this technique, this book thus provides a practical treatise clearly oriented toward applications, which should be useful to students and researchers of various levels and disciplines. In this book, the principles of continuous wave EPR spectroscopy are progressively, but rigorously, introduced, with emphasis on interpretation of the collected spectra. Each chapter is followed by a section highlighting important points for applications, together with exercises solved at the end of the book. A glossary defines the main terms used in the book, and particular topics, whose knowledge is not required for understanding the main text, are developed in appendices for more inquisitive readers.

Author : John F. Watts,John Wolstenholme
Publisher : John Wiley & Sons
Page : 307 pages
File Size : 53,7 Mb
Release : 2019-08-27
Category : Technology & Engineering
ISBN : 9781119417644

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An Introduction to Surface Analysis by XPS and AES by John F. Watts,John Wolstenholme Pdf

Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum. Chapters examine recent innovations in instrument design and key applications in metallurgy, biomaterials, and electronics. Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling. The book finishes with chapters on applications of electron spectroscopy in materials science and the comparison of XPS and AES with other analytical techniques. Extensively revised and updated with new material on NAPXPS, twin anode monochromators, gas cluster ion sources, valence band spectra, hydrogen detection, and quantification Explores key spectroscopic techniques in surface analysis Provides descriptions of latest instruments and techniques Includes a detailed glossary of key surface analysis terms Features an extensive bibliography of key references and additional reading Uses a non-theoretical style to appeal to industrial surface analysis sectors An Introduction to Surface Analysis by XPS and AES, 2nd Edition is an excellent introductory text for undergraduates, first-year postgraduates, and industrial users of XPS and AES.