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Author : Electrochemical Society. Meeting
Publisher : The Electrochemical Society
Page : 720 pages
File Size : 52,5 Mb
Release : 2000
Category : Science
ISBN : 1566772842
"... papers that were presented at the Sixth Symposium on High Purity Silicon held in Phoenix, Arizona at the 198th Meeting of the Electrochemical Society, October 22-27, 2000."--Preface.
Author : C. L. Claeys,Prosenjit Rai-Choudhury,Peter Stallhofer,H. J. Dawson
Publisher : SPIE-International Society for Optical Engineering
Page : 715 pages
File Size : 42,9 Mb
Release : 2000-12-01
Category : Electronic
ISBN : 0819438901
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 454 pages
File Size : 53,5 Mb
Release : 2004
Category : Technology & Engineering
ISBN : 1566774187
"This Proceedings Volume includes papers that were presented at the Eighth Symposium on High Purity Silicon held in Honolulu, Hawaii at the 206th Meeting of the Electrochemical Society, October 3-8, 2004"--Pref.
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 370 pages
File Size : 43,7 Mb
Release : 2008-10
Category : Crystal growth
ISBN : 9781566776523
The issue of the 10th High Purity Silicon symposium provides an overview of the latest developments in the growth, characterization, devices processing, and application of high purity silicon in either bulk or epitaxial form. The emphasis is on the control and prevention of impurity incorporation, characterization and detection of defects and impurity states in high purity and high resistivity silicon for superior device performances. Device and circuit aspects related to the application of devices fabricated on high resistivity silicon wafers will also be addressed. Special attention will be given to alternative and high-mobility substrates and their material and device aspects.
Author : Anonim
Publisher : Unknown
Page : 724 pages
File Size : 49,8 Mb
Release : 2000
Category : Crystal growth
ISBN : UOM:39015047910636
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 428 pages
File Size : 48,9 Mb
Release : 2002
Category : Science
ISBN : 156677344X
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 504 pages
File Size : 48,6 Mb
Release : 2006
Category : Crystal growth
ISBN : 9781566775045
This issue discusses the latest developments in the growth, characterization, device processing and applications of high-purity silicon in either bulk or epitaxial form. Information is given on the control and prevention of impurity incorporation, characterization and detection of defects and impurity states. Device and circuit aspects are also covered. Advanced substrates such as SOI, strained Si and germanium-on-insulator are discussed.
Author : Howard R. Huff,László Fábry,Seigo Kishino
Publisher : The Electrochemical Society
Page : 650 pages
File Size : 49,9 Mb
Release : 2002
Category : Semiconductors
ISBN : 1566773741
Author : Markku Tilli,Mervi Paulasto-Kröckel,Matthias Petzold,Horst Theuss,Teruaki Motooka,Veikko Lindroos
Publisher : Elsevier
Page : 1028 pages
File Size : 52,7 Mb
Release : 2020-04-17
Category : Technology & Engineering
ISBN : 9780128177877
Handbook of Silicon Based MEMS Materials and Technologies, Third Edition is a comprehensive guide to MEMS materials, technologies, and manufacturing with a particular emphasis on silicon as the most important starting material used in MEMS. The book explains the fundamentals, properties (mechanical, electrostatic, optical, etc.), materials selection, preparation, modeling, manufacturing, processing, system integration, measurement, and materials characterization techniques of MEMS structures. The third edition of this book provides an important up-to-date overview of the current and emerging technologies in MEMS making it a key reference for MEMS professionals, engineers, and researchers alike, and at the same time an essential education material for undergraduate and graduate students. Provides comprehensive overview of leading-edge MEMS manufacturing technologies through the supply chain from silicon ingot growth to device fabrication and integration with sensor/actuator controlling circuits Explains the properties, manufacturing, processing, measuring and modeling methods of MEMS structures Reviews the current and future options for hermetic encapsulation and introduces how to utilize wafer level packaging and 3D integration technologies for package cost reduction and performance improvements Geared towards practical applications presenting several modern MEMS devices including inertial sensors, microphones, pressure sensors and micromirrors
Author : Cor L. Claeys
Publisher : The Electrochemical Society
Page : 498 pages
File Size : 49,8 Mb
Release : 1998
Category : Science
ISBN : 1566772079
Author : Peter Pichler
Publisher : Springer Science & Business Media
Page : 554 pages
File Size : 52,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9783709105979
This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.
Author : Bernd O. Kolbesen
Publisher : The Electrochemical Society
Page : 479 pages
File Size : 55,6 Mb
Release : 2009-09
Category : Semiconductors
ISBN : 9781566777407
The proceedings of ALTECH 2009 address recent developments and applications of analytical techniques for semiconductor materials, processes and devices. The papers comprise techniques of elemental and structural analysis for bulk and surface impurities and defects, thin films as well as dopants in ultra-shallow junctions.
Author : C. Claeys,Eddy Simoen
Publisher : Springer Science & Business Media
Page : 440 pages
File Size : 54,7 Mb
Release : 2002-08-21
Category : Business & Economics
ISBN : 3540433937
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author : Roberto Fornari
Publisher : Woodhead Publishing
Page : 596 pages
File Size : 54,9 Mb
Release : 2018-09-18
Category : Technology & Engineering
ISBN : 9780081020975
Single Crystals of Electronic Materials: Growth and Properties is a complete overview of the state-of-the-art growth of bulk semiconductors. It is not only a valuable update on the body of information on crystal growth of well-established electronic materials, such as silicon, III-V, II-VI and IV-VI semiconductors, but also includes chapters on novel semiconductors, such as wide bandgap oxides like ZnO, Ga2, O3, In2, O3, Al2, O3, nitrides (AIN and GaN), and diamond. Each chapter focuses on a specific material, providing a comprehensive overview that includes applications and requirements, thermodynamic properties, schematics of growth methods, and more. Presents the latest research and most comprehensive overview of both standard and novel semiconductors Provides a systematic examination of important electronic materials, including their applications, growth methods, properties, technologies and defect and doping issues Takes a close look at emerging materials, including wide bandgap oxides, nitrides and diamond
Author : Mehmet C. Öztürk,Fred Roozeboom
Publisher : The Electrochemical Society
Page : 444 pages
File Size : 45,7 Mb
Release : 2004
Category : Technology & Engineering
ISBN : 1566774063