Interfacial Engineering For Optimized Properties Ii Volume 586

Author : C. Barry Carter,Ernest L. Hall,Steven R. Nutt,Clyde L. Briant
Publisher : Cambridge University Press
Page : 326 pages
File Size : 45,6 Mb
Release : 2014-06-05
Category : Technology & Engineering
ISBN : 1107414199

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Interfacial Engineering for Optimized Properties II: by C. Barry Carter,Ernest L. Hall,Steven R. Nutt,Clyde L. Briant Pdf

Interfaces control the properties of many technologically important materials. For many years, however, alloys have primarily been designed with the focus on optimizing bulk properties. Recently, much more attention has been paid to designing interfaces to improve the performance of materials. This idea has been central in the development of nanoscale devices in the electronics industry, but now these concepts have also been applied to both grain boundaries and phase boundaries in structural materials. There has been a breakthrough in the area of advanced experimental tools, such as the analysis of electron backscattering patterns and in the improved simulation capabilities of interfaces in complex engineering alloys. Third has been the recognition that failures often are associated with interfaces and that materials can be processed to improve the properties. This book, first published in 2000, concentrates on the preparation and processing of interfaces, the relationships between chemistry and structure and the properties and behavior of interfaces, particularly in relation to strength and bonding.

Author : C. Barry Carter
Publisher : Unknown
Page : 338 pages
File Size : 41,9 Mb
Release : 2000-10-02
Category : Technology & Engineering
ISBN : UCSD:31822028476588

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Interfacial Engineering for Optimized Properties II: Volume 586 by C. Barry Carter Pdf

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book, first published in 2000, concentrates on the preparation and processing of interfaces, the relationships between chemistry and structure and the properties and behavior of interfaces, particularly in relation to strength and bonding.

Author : Anonim
Publisher : Unknown
Page : 336 pages
File Size : 41,7 Mb
Release : 2004
Category : Grain boundaries
ISBN : UOM:39015058334056

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Interfacial Engineering for Optimized Properties by Anonim Pdf

Author : Clyde L. Briant,C. Barry Carter,Ernest L. Hall
Publisher : Unknown
Page : 546 pages
File Size : 43,8 Mb
Release : 1997-07-08
Category : Science
ISBN : UCSD:31822024031650

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Interfacial Engineering for Optimized Properties: Volume 458 by Clyde L. Briant,C. Barry Carter,Ernest L. Hall Pdf

The study of interfaces is one of the oldest areas of research in materials science. The presence of grain boundaries in materials has long been recognized, as has its crucial role in determining mechanical properties. Another long-recognized concept is that the properties of a surface are quite different from those of the bulk. In recent years, researchers have been able to study these interfaces, both internal and external, with a detail not before possible. These advances have stemmed from the ability to obtain atomic resolution images of interfaces, to measure accurate chemical compositions of interfaces, and to model these interfaces and their properties. This volume goes a step further, beyond structural and chemical studies, to explore how all of this information can be used to engineer interfaces for improved properties and overall improved material performance. Significant attention is given to the crystallographic nature of grain boundaries and interfaces, and the relationship between this nature and the performance of a material. The versatility of electron back-scattering pattern analysis (EBSP) in solving a number of interface-related problems is also featured.

Author : E. Wuchina
Publisher : The Electrochemical Society
Page : 223 pages
File Size : 44,8 Mb
Release : 2009-08
Category : Science
ISBN : 9781566777285

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High Temperature Corrosion and Materials Chemistry 7 by E. Wuchina Pdf

The papers included in this issue of ECS Transactions were originally presented in the symposium ¿High Temperature Corrosion and Materials Chemistry 7¿, held during the PRiME 2008 joint international meeting of The Electrochemical Society and The Electrochemical Society of Japan, with the technical cosponsorship of the Japan Society of Applied Physics, the Korean Electrochemical Society, the Electrochemistry Division of the Royal Australian Chemical Institute, and the Chinese Society of Electrochemistry. This meeting was held in Honolulu, Hawaii, from October 12 to 17, 2008.

Author : Ian Milne,R. O. Ritchie,B.L. Karihaloo
Publisher : Elsevier
Page : 4647 pages
File Size : 48,6 Mb
Release : 2003-07-25
Category : Business & Economics
ISBN : 9780080490731

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Comprehensive Structural Integrity by Ian Milne,R. O. Ritchie,B.L. Karihaloo Pdf

The aim of this major reference work is to provide a first point of entry to the literature for the researchers in any field relating to structural integrity in the form of a definitive research/reference tool which links the various sub-disciplines that comprise the whole of structural integrity. Special emphasis will be given to the interaction between mechanics and materials and structural integrity applications. Because of the interdisciplinary and applied nature of the work, it will be of interest to mechanical engineers and materials scientists from both academic and industrial backgrounds including bioengineering, interface engineering and nanotechnology. The scope of this work encompasses, but is not restricted to: fracture mechanics, fatigue, creep, materials, dynamics, environmental degradation, numerical methods, failure mechanisms and damage mechanics, interfacial fracture and nano-technology, structural analysis, surface behaviour and heart valves. The structures under consideration include: pressure vessels and piping, off-shore structures, gas installations and pipelines, chemical plants, aircraft, railways, bridges, plates and shells, electronic circuits, interfaces, nanotechnology, artificial organs, biomaterial prostheses, cast structures, mining... and more. Case studies will form an integral part of the work.

Author : Christopher A. Schuh
Publisher : Unknown
Page : 336 pages
File Size : 40,7 Mb
Release : 2004-07-16
Category : Technology & Engineering
ISBN : UCSD:31822032313033

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Interfacial Engineering for Optimized Properties III: Volume 819 by Christopher A. Schuh Pdf

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Author : Louisette Priester
Publisher : John Wiley & Sons
Page : 240 pages
File Size : 44,7 Mb
Release : 2013-02-07
Category : Technology & Engineering
ISBN : 9781118603109

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Grain Boundaries and Crystalline Plasticity by Louisette Priester Pdf

The main purpose of this book is to put forward the fundamental role of grain boundaries in the plasticity of crystalline materials. To understand this role requires a multi-scale approach to plasticity: starting from the atomic description of a grain boundary and its defects, moving on to the elemental interaction processes between dislocations and grain boundaries, and finally showing how the microscopic phenomena influence the macroscopic behaviors and constitutive laws. It involves bringing together physical, chemical and mechanical studies. The investigated properties are: deformation at low and high temperature, creep, fatigue and rupture.

Author : Maarten De Boer
Publisher : Mrs Proceedings
Page : 344 pages
File Size : 47,5 Mb
Release : 2000-10-02
Category : Science
ISBN : UCSD:31822028476448

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Materials Science of Microelectromechanical Systems (MEMS) Devices II: Volume 605 by Maarten De Boer Pdf

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Author : Aditya Agarwal
Publisher : Unknown
Page : 448 pages
File Size : 49,5 Mb
Release : 2001-04-09
Category : Technology & Engineering
ISBN : UCSD:31822030019731

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Si Front End Processing - Physics and Technology II of Dopant-Defect Interactions II: Volume 610 by Aditya Agarwal Pdf

This proceedings of the April 2000 symposium deals with formation of electrical junctions in the front-end processing of devices for the approaching end-of-the-roadmap. The 60 papers address 2D dopant characterization, ion implantation and shallow junction technology, group III diffusion and activation, carbon diffusion and activation, group V diffusion and activation, vacancy-type defects, regrown amorphous layers, and structure and properties of point and extended defects. Topics include ultra-shallow junction formation and gate activation in deep-submicron CMOS, low energy implantation of boron with decaborane ions, modeling ramp rate effects on shallow junction formation, clustering equilibrium and deactivation kinetics in As doped silicon, and atomistic modeling of complex silicon processing scenarios. c. Book News Inc.

Author : Eric L. Shirley
Publisher : Unknown
Page : 328 pages
File Size : 55,8 Mb
Release : 2000-12-22
Category : Science
ISBN : UOM:39015049693818

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The Optical Properties of Materials: Volume 579 by Eric L. Shirley Pdf

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Author : Richard Vinci,Richard Paul Vinci
Publisher : Mrs Proceedings
Page : 576 pages
File Size : 53,5 Mb
Release : 2000-09-25
Category : Science
ISBN : UCSD:31822028476570

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Thin Films - Stresses and Mechanical Properties VIII: Volume 594 by Richard Vinci,Richard Paul Vinci Pdf

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Author : David Norton
Publisher : Unknown
Page : 244 pages
File Size : 44,9 Mb
Release : 2000
Category : Science
ISBN : UOM:39015050281339

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Substrate Engineering--paving the Way to Epitaxy by David Norton Pdf

Epitaxial growth has always been a marriage of convenience between film and substrate. More and more frequently, however, it is impractical to use the same material for both film and substrate because it is not available as large single crystals, it is prohibitively expensive, or its properties are ill-suited for the intended application. To meet these challenges, many strategies have been pursued to achieve highly oriented or single-crystal thin films via epitaxy. Crystalline films have been mechanically bonded to other materials to form composite substrates. Crystals have been cut and rewelded, patterned and regrown, buffer layered and repolished. Each strategy has met with fundamental challenges including lattice mismatch, chemical incompatibility, differences in thermal expansion, and structural dissimilarity. This book, first published in 2000, focuses on developments in novel substrate engineering which enable improved epitaxy. Topics include: biaxially textured substrates for high-Tc-coated conductors; surfaces for oxide epitaxy; wafer bonding and lift off; lattice mismatch engineering; substrate engineering and solid-phase recrystallization and epitaxy.

Author : Susan Ermer
Publisher : Unknown
Page : 598 pages
File Size : 50,6 Mb
Release : 2000
Category : Technology & Engineering
ISBN : 1558995064

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Electrical, Optical, and Magnetic Properties of Organic Solid-state Materials V by Susan Ermer Pdf

This volume, the fifth in a popular series, features papers related to the development and utilization of materials with novel electrical, optical or magnetic properties. The field has experienced tremendous growth in the past years, and this volume provides a forum for materials scientists, chemists, physicists and engineers to assess the progress. In particular, light-emitting materials for displays are showing great promise for widespread commercialization. Developments in molecular engineering and self assembly, as well as in conducting polymers, are enabling better performance and greater scientific understanding of the phenomena underlying these advances. Improvements in electro-optic, photorefractive and two-photon absorbing materials are also being realized and are addressed here.

Author : D. A. Buchanan
Publisher : Mrs Proceedings
Page : 408 pages
File Size : 55,9 Mb
Release : 2000-10-17
Category : Technology & Engineering
ISBN : UOM:39015050054850

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Structure and Electronic Properties of Ultrathin Dielectric Films on Silicon and Related Structures: Volume 592 by D. A. Buchanan Pdf

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. The book, first published in 2000, includes detailed theoretical studies of the nature of SiO2 and its interface with silicon, electron paramagnetic resonance for the study of defects, electron tunneling, and band alignment among others.