Introduction To Electron And Ion Optics

Author : Poul Dahl
Publisher : Elsevier
Page : 156 pages
File Size : 40,6 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323160902

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Introduction to Electron and Ion Optics by Poul Dahl Pdf

Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.

Author : Miklos Szilagyi
Publisher : Springer Science & Business Media
Page : 550 pages
File Size : 41,8 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461309239

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Electron and Ion Optics by Miklos Szilagyi Pdf

The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.

Author : Peter W. Hawkes,Martin Hÿtch
Publisher : Elsevier
Page : 376 pages
File Size : 41,6 Mb
Release : 2023-06-02
Category : Technology & Engineering
ISBN : 9780443193217

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Aberration Theory in Electron and Ion Optics by Peter W. Hawkes,Martin Hÿtch Pdf

Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series

Author : Vernon Ellis Cosslett
Publisher : Unknown
Page : 332 pages
File Size : 40,8 Mb
Release : 1950
Category : Science
ISBN : WISC:89074766585

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Introduction to Electron Optics by Vernon Ellis Cosslett Pdf

Author : Peter W. Hawkes,Erwin Kasper
Publisher : Academic Press
Page : 1188 pages
File Size : 43,7 Mb
Release : 2012-12-02
Category : Science
ISBN : 0080962432

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Principles of Electron Optics by Peter W. Hawkes,Erwin Kasper Pdf

This is a complete handbook and reference volume which covers everything that one needs to know about electron optics. It is a comprehensive coverage of theoretical background and modern computing methods. It contains a detailed and unique account of numerical methods and an extensive bibliography.

Author : V. E. Cosslett
Publisher : Unknown
Page : 128 pages
File Size : 53,7 Mb
Release : 1946
Category : Electronic
ISBN : OCLC:613699703

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Introduction to Electron Optics by V. E. Cosslett Pdf

Author : Lucille A. Giannuzzi,North Carolina State University
Publisher : Springer Science & Business Media
Page : 362 pages
File Size : 45,8 Mb
Release : 2006-05-18
Category : Science
ISBN : 9780387233130

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Introduction to Focused Ion Beams by Lucille A. Giannuzzi,North Carolina State University Pdf

Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Author : Louis Jacob
Publisher : Unknown
Page : 176 pages
File Size : 49,8 Mb
Release : 1951
Category : Electron optics
ISBN : UOM:39015065675053

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An Introduction to Electron Optics by Louis Jacob Pdf

Author : Lawrence E Murr
Publisher : CRC Press
Page : 856 pages
File Size : 40,6 Mb
Release : 2018-10-08
Category : Technology & Engineering
ISBN : 9781482293357

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Electron and Ion Microscopy and Microanalysis by Lawrence E Murr Pdf

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Author : Peter W. Hawkes,E. Kasper
Publisher : Academic Press
Page : 752 pages
File Size : 52,9 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780080984162

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Principles of Electron Optics by Peter W. Hawkes,E. Kasper Pdf

The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include: Derivation of the laws of electron propagation from SchrUdinger's equation Image formation and the notion of resolution The interaction between specimens and electrons Image processing Electron holography and interference Coherence, brightness, and the spectral function Together, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

Author : David C. Joy
Publisher : Springer Science & Business Media
Page : 64 pages
File Size : 44,6 Mb
Release : 2013-09-13
Category : Technology & Engineering
ISBN : 9781461486602

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Helium Ion Microscopy by David C. Joy Pdf

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the Gaseous Field Ion Source (GFIS), and a comparison of the optics of ion and electron beam microscopes including their operating conditions, resolution, and signal-to-noise performance. The physical principles of Ion-Induced Secondary Electron (iSE) generation by ions are discussed, and an extensive database of iSE yields for many elements and compounds as a function of incident ion species and its energy is included. Beam damage and charging are frequently outcomes of ion beam irradiation, and techniques to minimize such problems are presented. In addition to imaging, ions beams can be used for the controlled deposition, or removal, of selected materials with nanometer precision. The techniques and conditions required for nanofabrication are discussed and demonstrated. Finally, the problem of performing chemical microanalysis with ion beams is considered. Low energy ions cannot generate X-ray emissions, so alternative techniques such as Rutherford Backscatter Imaging (RBI) or Secondary Ion Mass Spectrometry (SIMS) are examined.

Author : David A. De Wolf
Publisher : Wiley-Interscience
Page : 228 pages
File Size : 49,7 Mb
Release : 1990
Category : Science
ISBN : 0471524573

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Basics of Electron Optics by David A. De Wolf Pdf

This book provides a very basic introduction to electron optics: the underlying physics of the behaviour of charged- particle beams in electromagnetic fields. Whereas other texts attempt to cover many different applications or to give the newest and latest developments at an advanced level, Basics of

Author : Peter W. Hawkes,Erwin Kasper
Publisher : Elsevier
Page : 728 pages
File Size : 47,8 Mb
Release : 2017-10-29
Category : Science
ISBN : 9780081022573

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Principles of Electron Optics, Volume 1 by Peter W. Hawkes,Erwin Kasper Pdf

Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text

Author : V. E. Cosslett
Publisher : Unknown
Page : 293 pages
File Size : 45,6 Mb
Release : 1986
Category : Electronic
ISBN : OCLC:605361251

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Introduction to Electron Optics by V. E. Cosslett Pdf

Author : Jon Orloff,Lynwood Swanson,Mark Utlaut
Publisher : Springer Science & Business Media
Page : 304 pages
File Size : 55,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461507659

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High Resolution Focused Ion Beams: FIB and its Applications by Jon Orloff,Lynwood Swanson,Mark Utlaut Pdf

In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.