Electron And Ion Optics

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Introduction to Electron and Ion Optics

Author : Poul Dahl
Publisher : Elsevier
Page : 156 pages
File Size : 43,7 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323160902

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Introduction to Electron and Ion Optics by Poul Dahl Pdf

Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.

Electron and Ion Optics

Author : Miklos Szilagyi
Publisher : Springer Science & Business Media
Page : 550 pages
File Size : 50,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461309239

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Electron and Ion Optics by Miklos Szilagyi Pdf

The field of electron and ion optics is based on the analogy between geometrical light optics and the motion of charged particles in electromagnetic fields. The spectacular development of the electron microscope clearly shows the possibilities of image formation by charged particles of wavelength much shorter than that of visible light. As new applications such as particle accelerators, cathode ray tubes, mass and energy spectrometers, microwave tubes, scanning-type analytical instruments, heavy beam technologies, etc. emerged, the scope of particle beam optics has been exten ded to the formation of fine probes. The goal is to concentrate as many particles as possible in as small a volume as possible. Fabrication of microcircuits is a good example of the growing importance of this field. The current trend is towards increased circuit complexity and pattern density. Because of the diffraction limitation of processes using optical photons and the technological difficulties connected with x-ray processes, charged particle beams are becoming popular. With them it is possible to write directly on a wafer under computer control, without using a mask. Focused ion beams offer especially great possibilities in the submicron region. Therefore, electron and ion beam technologies will most probably playa very important role in the next twenty years or so.

Aberration Theory in Electron and Ion Optics

Author : Peter W. Hawkes,Martin Hÿtch
Publisher : Elsevier
Page : 376 pages
File Size : 48,6 Mb
Release : 2023-06-02
Category : Technology & Engineering
ISBN : 9780443193217

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Aberration Theory in Electron and Ion Optics by Peter W. Hawkes,Martin Hÿtch Pdf

Advances in Imaging and Electron Physics, Volume 227 in the Advances in Imaging and Electron Physics series, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series

Principles of Electron Optics

Author : Peter W. Hawkes,Erwin Kasper
Publisher : Academic Press
Page : 755 pages
File Size : 50,7 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780080984162

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Principles of Electron Optics by Peter W. Hawkes,Erwin Kasper Pdf

The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include: Derivation of the laws of electron propagation from SchrUdinger's equation Image formation and the notion of resolution The interaction between specimens and electrons Image processing Electron holography and interference Coherence, brightness, and the spectral function Together, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

Handbook of Charged Particle Optics

Author : Jon Orloff
Publisher : CRC Press
Page : 666 pages
File Size : 41,7 Mb
Release : 2017-12-19
Category : Science
ISBN : 9781420045550

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Handbook of Charged Particle Optics by Jon Orloff Pdf

With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.

Electron Optics

Author : P. Grivet,P. W. Hawkes,A. Septier
Publisher : Elsevier
Page : 412 pages
File Size : 41,9 Mb
Release : 2013-10-22
Category : Science
ISBN : 9781483137858

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Electron Optics by P. Grivet,P. W. Hawkes,A. Septier Pdf

Electron Optics, Second English Edition, Part I: Optics is a 10-chapter book that begins by elucidating the fundamental features and basic techniques of electron optics, as well as the distribution of potential and field in electrostatic lenses. This book then explains the field distribution in magnetic lenses; the optical properties of electrostatic and magnetic lenses; and the similarities and differences between glass optics and electron optics. Subsequent chapters focus on lens defects; some electrostatic lenses and triode guns; and magnetic lens models. The strong focusing lenses and prism optics are also described. This book will be useful to graduating students, as well as to beginners who sometimes feel lost in the abundant specialized literature.

Focusing of Charged Particles V2

Author : Albert Septier
Publisher : Elsevier
Page : 487 pages
File Size : 44,8 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323148467

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Focusing of Charged Particles V2 by Albert Septier Pdf

Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.

Applied Charged Particle Optics

Author : Helmut Liebl
Publisher : Springer Science & Business Media
Page : 131 pages
File Size : 43,6 Mb
Release : 2008-01-12
Category : Science
ISBN : 9783540719250

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Applied Charged Particle Optics by Helmut Liebl Pdf

Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.

Electron and Ion Microscopy and Microanalysis

Author : Lawrence E Murr
Publisher : CRC Press
Page : 856 pages
File Size : 42,8 Mb
Release : 2018-10-08
Category : Technology & Engineering
ISBN : 9781482293357

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Electron and Ion Microscopy and Microanalysis by Lawrence E Murr Pdf

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Optics of Charged Particles

Author : Hermann Wollnik
Publisher : Academic Press
Page : 319 pages
File Size : 53,5 Mb
Release : 2021-10-23
Category : Science
ISBN : 9780128214664

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Optics of Charged Particles by Hermann Wollnik Pdf

Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition

Introduction to Electron Optics

Author : Vernon Ellis Cosslett
Publisher : Unknown
Page : 332 pages
File Size : 54,7 Mb
Release : 1950
Category : Science
ISBN : WISC:89074766585

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Introduction to Electron Optics by Vernon Ellis Cosslett Pdf

High Resolution Focused Ion Beams: FIB and its Applications

Author : Jon Orloff,Lynwood Swanson,Mark Utlaut
Publisher : Springer Science & Business Media
Page : 304 pages
File Size : 53,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461507659

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High Resolution Focused Ion Beams: FIB and its Applications by Jon Orloff,Lynwood Swanson,Mark Utlaut Pdf

In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation. We have included a mix of theory and applications that seemed most useful to us. The field of FIBs has advanced rapidly since the application of the first field emission ion sources in the early 1970s. The development of the liquid metal ion source (LMIS) in the late 1960s and early 1970s and its application for FIBs in the late 1970s have resulted in a powerful tool for research and for industry. There have been hundreds of papers written on many aspects of LMIS and FIBs, and a useful and informative book on these subjects was published in 1991 by Phil Prewett and Grame Mair. Because there have been so many new applications and uses found for FIBs in the last ten years we felt that it was time for another book on the subject.

Particles and Waves in Electron Optics and Microscopy

Author : Anonim
Publisher : Academic Press
Page : 358 pages
File Size : 53,5 Mb
Release : 2016-05-27
Category : Computers
ISBN : 9780128052303

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Particles and Waves in Electron Optics and Microscopy by Anonim Pdf

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matter Informs and updates all the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics

Author : Anatoly M. Filachev,Inna S. Gaidoukova
Publisher : Society of Photo Optical
Page : 176 pages
File Size : 48,7 Mb
Release : 2003
Category : Technology & Engineering
ISBN : 0819448265

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Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics by Anatoly M. Filachev,Inna S. Gaidoukova Pdf