Principles Of Electron Optics

Author : Peter W. Hawkes,E. Kasper
Publisher : Academic Press
Page : 752 pages
File Size : 53,6 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780080984162

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Principles of Electron Optics by Peter W. Hawkes,E. Kasper Pdf

The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include: Derivation of the laws of electron propagation from SchrUdinger's equation Image formation and the notion of resolution The interaction between specimens and electrons Image processing Electron holography and interference Coherence, brightness, and the spectral function Together, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 42,7 Mb
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 0387258000

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Physical Principles of Electron Microscopy by Ray Egerton Pdf

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Author : Peter W. Hawkes,Erwin Kasper
Publisher : Academic Press
Page : 562 pages
File Size : 47,7 Mb
Release : 2022-02-21
Category : Technology & Engineering
ISBN : 9780128189801

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Principles of Electron Optics, Volume 3 by Peter W. Hawkes,Erwin Kasper Pdf

Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

Author : Max Born,Emil Wolf
Publisher : Elsevier
Page : 836 pages
File Size : 45,6 Mb
Release : 2013-06-01
Category : Science
ISBN : 9781483103204

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Principles of Optics by Max Born,Emil Wolf Pdf

Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light, Sixth Edition covers optical phenomenon that can be treated with Maxwell’s phenomenological theory. The book is comprised of 14 chapters that discuss various topics about optics, such as geometrical theories, image forming instruments, and optics of metals and crystals. The text covers the elements of the theories of interference, interferometers, and diffraction. The book tackles several behaviors of light, including its diffraction when exposed to ultrasonic waves. The selection will be most useful to researchers whose work involves understanding the behavior of light.

Author : Poul Dahl
Publisher : Elsevier
Page : 156 pages
File Size : 45,5 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323160902

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Introduction to Electron and Ion Optics by Poul Dahl Pdf

Introduction to Electron and Ion Optics provides the theoretical background needed to understand the subject matter and even be helpful in laboratory works. Seven major parts comprise the book where each focuses on a certain aspect or field. The book begins with an introduction to the general principles about electron and ion optics, specifically as basis for the design of the optical components used in particle analyzers and accelerators. The following parts tackle different aspects such as geometrical optics; scaling rules and dispersion coefficients; fields (paraxial, sector, fringing, quadrupole); lenses (electrostatic, immersion, unipotential, etc.); analyzers (electrostatic, spherical, etc.); and space charge and beam production. Towards the last part of the book, there is an exercises section where various problems are given for the reader to answer. This book caters to students specifically in the field of physics.

Author : Joseph Goldstein,David C. Joy,Alton D. Romig Jr.
Publisher : Springer Science & Business Media
Page : 458 pages
File Size : 54,6 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781489920379

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Principles of Analytical Electron Microscopy by Joseph Goldstein,David C. Joy,Alton D. Romig Jr. Pdf

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Author : Ludwig Reimer
Publisher : Springer
Page : 532 pages
File Size : 53,8 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783662135532

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Transmission Electron Microscopy by Ludwig Reimer Pdf

The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.

Author : Max Born,Emil Wolf
Publisher : Cambridge University Press
Page : 993 pages
File Size : 54,7 Mb
Release : 2019-12-19
Category : Science
ISBN : 9781108477437

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Principles of Optics by Max Born,Emil Wolf Pdf

The 60th anniversary edition of this classic and unrivalled optics reference work includes a special foreword by Sir Peter Knight.

Author : A. B. El-Kareh,J. C. J. El-Kareh
Publisher : Unknown
Page : 348 pages
File Size : 41,8 Mb
Release : 1970
Category : Electron optics
ISBN : UCLA:L0065813933

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Electron Beams, Lenses, and Optics by A. B. El-Kareh,J. C. J. El-Kareh Pdf

Author : Peter W. Hawkes,Erwin Kasper
Publisher : Elsevier
Page : 728 pages
File Size : 43,7 Mb
Release : 2017-10-29
Category : Science
ISBN : 9780081022573

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Principles of Electron Optics, Volume 1 by Peter W. Hawkes,Erwin Kasper Pdf

Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography. Offers a fully revised and expanded new edition based on the latest research developments in electron optics Written by the top experts in the field Covers every significant advance in electron optics since the subject originated Contains exceptionally complete and carefully selected references and notes Serves both as a reference and text

Author : Anjam Khursheed
Publisher : World Scientific
Page : 417 pages
File Size : 49,9 Mb
Release : 2011
Category : Technology & Engineering
ISBN : 9789812836670

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Scanning Electron Microscope Optics and Spectrometers by Anjam Khursheed Pdf

This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.

Author : David C. Bell,Natasha Erdman
Publisher : John Wiley & Sons
Page : 241 pages
File Size : 43,9 Mb
Release : 2012-11-30
Category : Science
ISBN : 9781118498484

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Low Voltage Electron Microscopy by David C. Bell,Natasha Erdman Pdf

Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before.

Author : Harry J. Levinson
Publisher : SPIE Press
Page : 446 pages
File Size : 52,8 Mb
Release : 2005
Category : Technology & Engineering
ISBN : 0819456608

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Principles of Lithography by Harry J. Levinson Pdf

Lithography is a field in which advances proceed at a swift pace. This book was written to address several needs, and the revisions for the second edition were made with those original objectives in mind. Many new topics have been included in this text commensurate with the progress that has taken place during the past few years, and several subjects are discussed in more detail. This book is intended to serve as an introduction to the science of microlithography for people who are unfamiliar with the subject. Topics directly related to the tools used to manufacture integrated circuits are addressed in depth, including such topics as overlay, the stages of exposure, tools, and light sources. This text also contains numerous references for students who want to investigate particular topics in more detail, and they provide the experienced lithographer with lists of references by topic as well. It is expected that the reader of this book will have a foundation in basic physics and chemistry. No topics will require knowledge of mathematics beyond elementary calculus.

Author : John Hren
Publisher : Springer Science & Business Media
Page : 609 pages
File Size : 43,9 Mb
Release : 2013-11-11
Category : Technology & Engineering
ISBN : 9781475755817

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Introduction to Analytical Electron Microscopy by John Hren Pdf

The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.

Author : Lukas Novotny,Bert Hecht
Publisher : Cambridge University Press
Page : 583 pages
File Size : 48,8 Mb
Release : 2012-09-06
Category : Science
ISBN : 9781107005464

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Principles of Nano-Optics by Lukas Novotny,Bert Hecht Pdf

Fully revised and in its second edition, this standard reference on nano-optics is ideal for graduate students and researchers alike.