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Author : Anonim
Publisher : Unknown
Page : 378 pages
File Size : 55,8 Mb
Release : 1999
Category : Magnetic films
ISBN : UOM:39015042093321
Author : David E. Laughlin,Kenneth P. Rodbell,Olivier Thomas,Bing Zhang
Publisher : Cambridge University Press
Page : 366 pages
File Size : 45,7 Mb
Release : 2014-06-05
Category : Technology & Engineering
ISBN : 1107413982
The unprecedented growth in the semiconductor, electronics and storage industries is the result of continued miniaturization of circuit devices, increases in chip functionality, and increased storage capacity and performance, along with a decrease in per-function cost. Hardware shrinkage has taken place, leading to similar decreases in the dimensions of interconnection wires, contact metallization and magnetic storage footprints. The increasingly important role of surfaces, interfaces, defects and impurities has raised serious materials questions about how to control the properties of polycrystalline thin films used in applications requiring tight performance tolerances. The understanding of polycrystalline film structures during growth, and the evolution of various film properties with time and temperature, is critical to the successful design and development of smaller devices. This book, first published in 1999, highlights the directions taken to understand and control the properties of polycrystalline materials. Topics include: magnetic thin films; microstructure, texture and stress; copper microstructure; nanocrystalline magnetic thin films and thin-film permanent magnets.
Author : Bruce M. Clemens
Publisher : Unknown
Page : 218 pages
File Size : 55,9 Mb
Release : 2001-04-09
Category : Technology & Engineering
ISBN : UCSD:31822030019749
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.
Author : Anonim
Publisher : Unknown
Page : 220 pages
File Size : 41,6 Mb
Release : 2000
Category : Magnetic films
ISBN : UOM:39015047822625
Author : Chijiang Tsai
Publisher : Unknown
Page : 154 pages
File Size : 44,6 Mb
Release : 1999
Category : Electronic
ISBN : CORNELL:31924084439342
Author : Klaus Wetzig,Claus M. Schneider
Publisher : John Wiley & Sons
Page : 388 pages
File Size : 40,8 Mb
Release : 2006-03-06
Category : Science
ISBN : 9783527606474
This up-to-date handbook covers the main topics of preparation, characterization and properties of complex metal-based layer systems. The authors -- an outstanding group of researchers -- discuss advanced methods for structure, chemical and electronic state characterization with reference to the properties of thin functional layers, such as metallization and barrier layers for microelectronics, magnetoresistive layers for GMR and TMR, sensor and resistance layers. As such, the book addresses materials specialists in industry, especially in microelectronics, as well as scientists, and can also be recommended for advanced studies in materials science, analytics, surface and solid state science.
Author : C.R. Tellier,A.J. Tosser
Publisher : Elsevier
Page : 321 pages
File Size : 49,7 Mb
Release : 2016-04-20
Category : Technology & Engineering
ISBN : 9781483289762
A complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects.
Author : Anonim
Publisher : Unknown
Page : 830 pages
File Size : 43,5 Mb
Release : 1995
Category : Thin films
ISBN : UOM:39015038105808
Author : Anonim
Publisher : The Electrochemical Society
Page : 636 pages
File Size : 55,8 Mb
Release : 2001
Category : Magnetic disks
ISBN : 1566772966
Author : Maurice H. Francombe
Publisher : Academic Press
Page : 380 pages
File Size : 44,8 Mb
Release : 2013-10-22
Category : Technology & Engineering
ISBN : 9781483288918
Following in the long-standing tradition of excellence established by this serial, this volume provides a focused look at contemporary applications. High Tc superconducting thin films are discussed in terms of ion beam and sputtering deposition, vacuum evaporation, laser ablation, MOCVD, and other deposition processes in addition to their ultimate applications. Detailed treatment is also given to permanent magnet thin films, lateral diffusion and electromigration in metallic thin films, and fracture and cracking phenomena in thin films adhering to high-elongation substrates.
Author : American Society for Metals
Publisher : Unknown
Page : 368 pages
File Size : 48,8 Mb
Release : 1964
Category : Technology & Engineering
ISBN : UOM:39015002937715
Author : Anonim
Publisher : Unknown
Page : 704 pages
File Size : 54,8 Mb
Release : 1995
Category : Aeronautics
ISBN : UIUC:30112050127304
Author : Ana Londergan
Publisher : The Electrochemical Society
Page : 300 pages
File Size : 52,8 Mb
Release : 2007
Category : Atomic layer deposition
ISBN : 9781566775427
This issue gives an overview of the cutting edge research in the various areas where Atomic Layer Deposition (ALD) can be used, enabling the identification of issues, challenges, and areas where further research is needed. Contributions include: Memory applications, Interconnects and contacts, ALD Productivity enhancement and precursor development, ALD for optical and photonic applications, and Applications in other areas, such as MEMs, nanotechnology, fabrication of sensors and catalysts, etc.
Author : Katayun Barmak,Kevin Coffey
Publisher : Woodhead Publishing
Page : 671 pages
File Size : 47,8 Mb
Release : 2014-02-13
Category : Technology & Engineering
ISBN : 9780857096296
Metallic films play an important role in modern technologies such as integrated circuits, information storage, displays, sensors, and coatings. Metallic Films for Electronic, Optical and Magnetic Applications reviews the structure, processing and properties of metallic films. Part one explores the structure of metallic films using characterization methods such as x-ray diffraction and transmission electron microscopy. This part also encompasses the processing of metallic films, including structure formation during deposition and post-deposition reactions and phase transformations. Chapters in part two focus on the properties of metallic films, including mechanical, electrical, magnetic, optical, and thermal properties. Metallic Films for Electronic, Optical and Magnetic Applications is a technical resource for electronics components manufacturers, scientists, and engineers working in the semiconductor industry, product developers of sensors, displays, and other optoelectronic devices, and academics working in the field. Explores the structure of metallic films using characterization methods such as x-ray diffraction and transmission electron microscopy Discusses processing of metallic films, including structure formation during deposition and post-deposition reactions and phase transformations Focuses on the properties of metallic films, including mechanical, electrical, magnetic, optical, and thermal properties
Author : B. J. Nicholson,Gordon Bradford Gaines,J. B. Baker,G. A. Stark
Publisher : Unknown
Page : 284 pages
File Size : 45,9 Mb
Release : 1965
Category : Alloys
ISBN : UOM:39015095040617
This report comprises a selective survey of the present knowledge of the effects of occluded gases and strains on the magnetic properties of Permalloy films, particularlly those which have significance for computer switching applications. Other possible techniques for accomplishing future computer switching functions and magnetic film properties are reviewed. Bulk properties are described and compared with corresponding thin film properties. The magnetic properties of epitaxial Permalloy, epitaxial nickel, epitaxial iron, polycrystalline nickel, and polycrystalline iron films are discussed. The effects of various occluded gases on magnetic film properties are summarized. Stresses present in evaporated films and their significance in determining the magnetic properties of thin films are considered. A selected bibliography of 548 references is included. (Author).
