Principles Of Analytical Electron Microscopy

Author : Joseph Goldstein,David C. Joy,Alton D. Romig Jr.
Publisher : Springer Science & Business Media
Page : 458 pages
File Size : 50,7 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781489920379

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Principles of Analytical Electron Microscopy by Joseph Goldstein,David C. Joy,Alton D. Romig Jr. Pdf

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 55,8 Mb
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 0387258000

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Physical Principles of Electron Microscopy by Ray Egerton Pdf

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Author : DAISUKE Shindo,T. Oikawa
Publisher : Springer Science & Business Media
Page : 162 pages
File Size : 52,8 Mb
Release : 2013-04-17
Category : Science
ISBN : 9784431669883

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Analytical Electron Microscopy for Materials Science by DAISUKE Shindo,T. Oikawa Pdf

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Author : John Hren
Publisher : Springer Science & Business Media
Page : 609 pages
File Size : 40,8 Mb
Release : 2013-11-11
Category : Technology & Engineering
ISBN : 9781475755817

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Introduction to Analytical Electron Microscopy by John Hren Pdf

The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.

Author : John J. Bozzola,Lonnie Dee Russell
Publisher : Jones & Bartlett Learning
Page : 702 pages
File Size : 49,8 Mb
Release : 1999
Category : Medical
ISBN : 0763701920

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Electron Microscopy by John J. Bozzola,Lonnie Dee Russell Pdf

New edition of an introductory reference that covers all of the important aspects of electron microscopy from a biological perspective, including theory of scanning and transmission; specimen preparation; darkroom, digital imaging, and image analysis; laboratory safety; interpretation of images; and an atlas of ultrastructure. Generously illustrated with bandw line drawings and photographs. Annotation copyrighted by Book News, Inc., Portland, OR

Author : P.W. Hawkes,John C.H. Spence
Publisher : Springer Science & Business Media
Page : 1322 pages
File Size : 51,8 Mb
Release : 2008-08-29
Category : Technology & Engineering
ISBN : 9780387497624

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Science of Microscopy by P.W. Hawkes,John C.H. Spence Pdf

This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Author : S. Amelinckx,Dirk van Dyck,J. van Landuyt,Gustaaf van Tendeloo
Publisher : John Wiley & Sons
Page : 527 pages
File Size : 46,8 Mb
Release : 2008-09-26
Category : Technology & Engineering
ISBN : 9783527614554

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Electron Microscopy by S. Amelinckx,Dirk van Dyck,J. van Landuyt,Gustaaf van Tendeloo Pdf

Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include: * Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods * Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry * Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.

Author : M. A. Hayat
Publisher : John Wiley & Sons
Page : 392 pages
File Size : 40,8 Mb
Release : 1976
Category : Science
ISBN : UOM:39015006151198

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Principles and Techniques of Electron Microscopy by M. A. Hayat Pdf

High voltage electron microscopy; The principles of high resolution electron microscopy; Contrast and image formation of biological specimens; The analysis of biological structure with x-ray diffraction techniques; Tilting experiments in the electron microscope; Electron autoradiography of free specimens; Cryoultramicrotomy; Eletron interference microscope.

Author : Ian M. Watt
Publisher : Cambridge University Press
Page : 506 pages
File Size : 41,8 Mb
Release : 1997-01-30
Category : Science
ISBN : 0521435919

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The Principles and Practice of Electron Microscopy by Ian M. Watt Pdf

The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

Author : Debbie Stokes
Publisher : John Wiley & Sons
Page : 247 pages
File Size : 41,7 Mb
Release : 2008-12-22
Category : Science
ISBN : 9780470065402

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Principles and Practice of Variable Pressure / Environmental Scanning Electron Microscopy (VP-ESEM) by Debbie Stokes Pdf

Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 52,6 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781461332732

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin Pdf

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Author : Peter Ingram,John D. Shelburne,Victor L. Roggli,Ann LeFurgey
Publisher : Academic Press
Page : 545 pages
File Size : 51,5 Mb
Release : 1999-10-29
Category : Science
ISBN : 0080524567

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Biomedical Applications of Microprobe Analysis by Peter Ingram,John D. Shelburne,Victor L. Roggli,Ann LeFurgey Pdf

Biomedical Applications of Microprobe Analysis is a combination reference/laboratory manual for the use of microprobe analysis in both clinical diagnostic and research settings. Also called microchemical microscopy, microprobe analysis uses high-energy bombardment of cells and tissue, in combination with high resolution EM or confocal microscopy to provide a profile of the ion, metal, and mineral concentrations present in a sample. This allows insight into the physiology and pathophysiology of a wide variety of cells and tissues. This book describes methods for obtaining detailed information about the identity and composition of particles too small to be seen with the naked eye and describes how this information can be useful in diagnostic and biomedical research. Up-to-date review of electron microprobe analysis Detailed descriptions of sample preparation techniques Recent technologies including confocal microscopy, infrared microspectroscopy, and laser raman spectroscopy Over 100 illustrations with numerous specific applications Contributions by world-renowned experts in the field Brief summary of highlights precedes each chapter

Author : M. A. Hayat
Publisher : John Wiley & Sons
Page : 264 pages
File Size : 46,7 Mb
Release : 1974
Category : Science
ISBN : UOM:39015046245760

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Principles and Techniques of Scanning Electron Microscopy by M. A. Hayat Pdf

Author : Ludwig Reimer
Publisher : Springer
Page : 532 pages
File Size : 51,6 Mb
Release : 2013-11-11
Category : Science
ISBN : 9783662135532

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Transmission Electron Microscopy by Ludwig Reimer Pdf

The aim of this book is to outline the physics of image formation, electron specimen interactions and image interpretation in transmission electron mic roscopy. The book evolved from lectures delivered at the University of Munster and is a revised version of the first part of my earlier book Elek tronenmikroskopische Untersuchungs- und Priiparationsmethoden, omitting the part which describes specimen-preparation methods. In the introductory chapter, the different types of electron microscope are compared, the various electron-specimen interactions and their applications are summarized and the most important aspects of high-resolution, analytical and high-voltage electron microscopy are discussed. The optics of electron lenses is discussed in Chapter 2 in order to bring out electron-lens properties that are important for an understanding of the function of an electron microscope. In Chapter 3, the wave optics of elec trons and the phase shifts by electrostatic and magnetic fields are introduced; Fresnel electron diffraction is treated using Huygens' principle. The recogni tion that the Fraunhofer-diffraction pattern is the Fourier transform of the wave amplitude behind a specimen is important because the influence of the imaging process on the contrast transfer of spatial frequencies can be described by introducing phase shifts and envelopes in the Fourier plane. In Chapter 4, the elements of an electron-optical column are described: the electron gun, the condenser and the imaging system. A thorough understanding of electron-specimen interactions is essential to explain image contrast.

Author : Graham Lawes,Arthur M. James
Publisher : Unknown
Page : 103 pages
File Size : 50,7 Mb
Release : 1987
Category : Electron microscopy
ISBN : 0471913901

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Scanning Electron Microscopy and X-ray Microanalysis by Graham Lawes,Arthur M. James Pdf