Analytical Electron Microscopy For Materials Science

Author : DAISUKE Shindo,T. Oikawa
Publisher : Springer Science & Business Media
Page : 162 pages
File Size : 45,8 Mb
Release : 2013-04-17
Category : Science
ISBN : 9784431669883

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Analytical Electron Microscopy for Materials Science by DAISUKE Shindo,T. Oikawa Pdf

Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

Author : David Bernard Williams
Publisher : Electron Optics Publishing Group
Page : 170 pages
File Size : 42,6 Mb
Release : 1984
Category : Science
ISBN : PSU:000025024623

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Practical Analytical Electron Microscopy in Materials Science by David Bernard Williams Pdf

Author : David B. Williams
Publisher : Techbooks
Page : 180 pages
File Size : 43,8 Mb
Release : 1980-06-01
Category : Electronic
ISBN : 1878907166

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Practical Analytical Electron Microscopy in Materials Science by David B. Williams Pdf

Author : Daisuke Shindo,Hiraga Kenji
Publisher : Springer Science & Business Media
Page : 196 pages
File Size : 51,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9784431684220

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High-Resolution Electron Microscopy for Materials Science by Daisuke Shindo,Hiraga Kenji Pdf

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Author : David B. Williams,C. Barry Carter
Publisher : Springer Science & Business Media
Page : 804 pages
File Size : 54,5 Mb
Release : 2009-08-05
Category : Science
ISBN : 9780387765006

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Transmission Electron Microscopy by David B. Williams,C. Barry Carter Pdf

This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, the book provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

Author : Nicolas Brodusch,Hendrix Demers,Raynald Gauvin
Publisher : Springer
Page : 137 pages
File Size : 45,5 Mb
Release : 2017-09-25
Category : Technology & Engineering
ISBN : 9789811044335

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Field Emission Scanning Electron Microscopy by Nicolas Brodusch,Hendrix Demers,Raynald Gauvin Pdf

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Author : John Hren
Publisher : Springer Science & Business Media
Page : 609 pages
File Size : 47,9 Mb
Release : 2013-11-11
Category : Technology & Engineering
ISBN : 9781475755817

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Introduction to Analytical Electron Microscopy by John Hren Pdf

The birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM that signaled its birth? Was AEM born with the attachment of a crystal spectrometer to an otherwise conventional TEM? Or was it born earlier with the first analysis of electron loss spectra? It's not likely that any of these developments alone would have been sufficient and there have been many others (microdiffraction, EDS, microbeam fabrication, etc.) that could equally lay claim to being critical to the establishment of true AEM. It is probably more accurate to simply ascribe the present rapid development to the obvious: a combination of ideas whose time has come. Perhaps it is difficult to trace the birth of AEM simply because it remains a point of contention to even define its true scope. For example, the topics in this book, even though very broad, are still far from a complete description of what many call AEM. When electron beams interact with a solid it is well-known that a bewildering number of possible interactions follow. Analytical electron microscopy attempts to take full qualitative and quantitative advantage of as many of these interactions as possible while still preserving the capability of high resolution imaging. Although we restrict ourselves here to electron transparent films, much of what is described applies to thick specimens as well. Not surprisingly, signals from all possible interactions cannot yet (and probably never will) be attained simultaneously under optimum conditions.

Author : P.W. Hawkes,John C.H. Spence
Publisher : Springer Science & Business Media
Page : 1336 pages
File Size : 51,7 Mb
Release : 2008-08-29
Category : Technology & Engineering
ISBN : 9780387497624

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Science of Microscopy by P.W. Hawkes,John C.H. Spence Pdf

This fully corrected second impression of the classic 2006 text on microscopy runs to more than 1,000 pages and covers up-to-the-minute developments in the field. The two-volume work brings together a slew of experts who present comprehensive reviews of all the latest instruments and new versions of the older ones, as well as their associated operational techniques. The chapters draw attention to their principal areas of application. A huge range of subjects are benefiting from these new tools, including semiconductor physics, medicine, molecular biology, the nanoworld in general, magnetism, and ferroelectricity. This fascinating book will be an indispensable guide for a wide range of scientists in university laboratories as well as engineers and scientists in industrial R&D departments.

Author : Peter J. Goodhew,John Humphreys
Publisher : CRC Press
Page : 264 pages
File Size : 54,9 Mb
Release : 2000-11-30
Category : Technology & Engineering
ISBN : 9781482289343

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Electron Microscopy and Analysis by Peter J. Goodhew,John Humphreys Pdf

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors h

Author : Jürgen Thomas,Thomas Gemming
Publisher : Springer Science & Business
Page : 357 pages
File Size : 40,9 Mb
Release : 2014-04-17
Category : Technology & Engineering
ISBN : 9789401786010

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Analytical Transmission Electron Microscopy by Jürgen Thomas,Thomas Gemming Pdf

This work is based on experiences acquired by the authors regarding often asked questions and problems during manifold education of beginners in analytical transmission electron microscopy. These experiences are summarised illustratively in this textbook. Explanations based on simple models and hints for the practical work are the focal points. This practically- oriented textbook represents a clear and comprehensible introduction for all persons who want to use a transmission electron microscope in practice but who are not specially qualified electron microscopists up to now.

Author : Joseph Goldstein,David C. Joy,Alton D. Romig Jr.
Publisher : Springer Science & Business Media
Page : 458 pages
File Size : 49,6 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781489920379

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Principles of Analytical Electron Microscopy by Joseph Goldstein,David C. Joy,Alton D. Romig Jr. Pdf

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Author : David B. Williams,C. Barry Carter
Publisher : Springer Science & Business Media
Page : 708 pages
File Size : 45,6 Mb
Release : 2013-03-09
Category : Science
ISBN : 9781475725193

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Transmission Electron Microscopy by David B. Williams,C. Barry Carter Pdf

Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.

Author : David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 50,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401144513

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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Pdf

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Author : Ray Egerton
Publisher : Springer Science & Business Media
Page : 224 pages
File Size : 40,6 Mb
Release : 2011-02-11
Category : Technology & Engineering
ISBN : 0387258000

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Physical Principles of Electron Microscopy by Ray Egerton Pdf

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Author : Merin Sara Thomas,Józef T. Haponiuk,Sabu Thomas,Anne George
Publisher : CRC Press
Page : 326 pages
File Size : 54,9 Mb
Release : 2022-12-23
Category : Technology & Engineering
ISBN : 9781000572834

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Advanced Microscopy by Merin Sara Thomas,Józef T. Haponiuk,Sabu Thomas,Anne George Pdf

This interdisciplinary book, Advanced Microscopy: A Strong Analytical Tool in Materials Science, covers the methodology and applications of different advanced microscopic techniques in various research fields, including chemistry, nanotechnology, polymers, chemical engineering, and biomedical engineering, providing an informative overview that helps to determine the best applications for advanced materials. Materials usually behave very differently at nanoscale in all aspects, and this volume shows how microscopy can help provide a detailed understanding of materials such as semiconductors, metals, polymers, biopolymers, etc. The volume illustrates advanced microscopic techniques that include scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), confocal microscopy, and others. The microscopy techniques presented in the volume show applications in many areas of science, including botany and plant science, medicine, nanotechnology, chemistry, food science, waste management, and others. This book presents the diverse advanced microscopic techniques for researchers, giving a better understanding as well as implementation of novel techniques in materials science.