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Author : Bruce Cork,Emery Zajec
Publisher : Unknown
Page : 24 pages
File Size : 46,7 Mb
Release : 1953
Category : Lenses
ISBN : UOM:39015077590498
Author : Hermann Wollnik
Publisher : Academic Press
Page : 319 pages
File Size : 46,5 Mb
Release : 2021-10-23
Category : Science
ISBN : 9780128214664
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science. The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments. By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments. Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions Discusses new applications and newly occurring issues, which have arisen since the first edition
Author : Albert Septier
Publisher : Elsevier
Page : 487 pages
File Size : 47,6 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323148467
Focusing of Charged Particles, Volume II presents the aspects of particle optics, including the electron, the ion optical domains, and the accelerator field. This book provides a detailed analysis of the principles of the laws of propagation of beams. Comprised of three parts encompassing three chapters, this volume starts with an overview of how a beam of charged particles traverses a region that is at a uniform, constant, electrostatic potential. This book then discusses the principle of charge repulsion effect by which the space charge of the beam modifies the potential in the region that it traverses. Other chapters examine the general design techniques and performances obtainable for electron guns applicable for use in initiating a beam for linear beam tubes that is given in a condensed form. The last chapter deals with the two stable charged particles that can be accelerated, namely, protons and electrons. This book is a valuable resource to physicists, accelerator experts, and experimenters in search of interactions in the detector target.
Author : Helmut Liebl
Publisher : Springer Science & Business Media
Page : 131 pages
File Size : 41,7 Mb
Release : 2008-01-12
Category : Science
ISBN : 9783540719250
Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
Author : Jon Orloff
Publisher : CRC Press
Page : 666 pages
File Size : 48,5 Mb
Release : 2017-12-19
Category : Science
ISBN : 9781420045550
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Author : Jay Theodore Cremer, Jr.
Publisher : Newnes
Page : 1124 pages
File Size : 46,8 Mb
Release : 2013-02-18
Category : Science
ISBN : 9780124071599
Covering a wide range of topics related to neutron and x-ray optics, this book explores the aspects of neutron and x-ray optics and their associated background and applications in a manner accessible to both lower-level students while retaining the detail necessary to advanced students and researchers. It is a self-contained book with detailed mathematical derivations, background, and physical concepts presented in a linear fashion. A wide variety of sources were consulted and condensed to provide detailed derivations and coverage of the topics of neutron and x-ray optics as well as the background material needed to understand the physical and mathematical reasoning directly related or indirectly related to the theory and practice of neutron and x-ray optics. The book is written in a clear and detailed manner, making it easy to follow for a range of readers from undergraduate and graduate science, engineering, and medicine. It will prove beneficial as a standalone reference or as a complement to textbooks. Supplies a historical context of covered topics. Detailed presentation makes information easy to understand for researchers within or outside the field. Incorporates reviews of all relevant literature in one convenient resource.
Author : Martin Reiser
Publisher : John Wiley & Sons
Page : 634 pages
File Size : 50,9 Mb
Release : 2008-09-26
Category : Science
ISBN : 9783527617630
Although particle accelerators are the book's main thrust, it offers a broad synoptic description of beams which applies to a wide range of other devices such as low-energy focusing and transport systems and high-power microwave sources. Develops material from first principles, basic equations and theorems in a systematic way. Assumptions and approximations are clearly indicated. Discusses underlying physics and validity of theoretical relationships, design formulas and scaling laws. Features a significant amount of recent work including image effects and the Boltzmann line charge density profiles in bunched beams.
Author : Anonim
Publisher : Unknown
Page : 1022 pages
File Size : 48,6 Mb
Release : 1971
Category : Nuclear energy
ISBN : PSU:000047759404
NSA is a comprehensive collection of international nuclear science and technology literature for the period 1948 through 1976, pre-dating the prestigious INIS database, which began in 1970. NSA existed as a printed product (Volumes 1-33) initially, created by DOE's predecessor, the U.S. Atomic Energy Commission (AEC). NSA includes citations to scientific and technical reports from the AEC, the U.S. Energy Research and Development Administration and its contractors, plus other agencies and international organizations, universities, and industrial and research organizations. References to books, conference proceedings, papers, patents, dissertations, engineering drawings, and journal articles from worldwide sources are also included. Abstracts and full text are provided if available.
Author : K.H. Bockhoff
Publisher : Springer Science & Business Media
Page : 1049 pages
File Size : 41,6 Mb
Release : 2012-12-06
Category : Science
ISBN : 9789400970991
Proceedings of the International Conference, Antwerp, Belgium, September 6-10, 1982
Author : Harald Rose
Publisher : Springer
Page : 519 pages
File Size : 43,8 Mb
Release : 2013-02-02
Category : Science
ISBN : 9783642321191
This second edition is an extended version of the first edition of Geometrical Charged-Particle Optics. The updated reference monograph is intended as a guide for researchers and graduate students who are seeking a comprehensive treatment of the design of instruments and beam-guiding systems of charged particles and their propagation in electromagnetic fields. Wave aspects are included in this edition for explaining electron holography, the Aharanov-Bohm effect and the resolution of electron microscopes limited by diffraction. Several methods for calculating the electromagnetic field are presented and procedures are outlined for calculating the properties of systems with arbitrarily curved axis. Detailed methods are presented for designing and optimizing special components such as aberration correctors, spectrometers, energy filters monochromators, ion traps, electron mirrors and cathode lenses. In particular, the optics of rotationally symmetric lenses, quadrupoles, and systems composed of these elements are discussed extensively. Beam properties such as emittance, brightness, transmissivity and the formation of caustics are outlined. Relativistic motion and spin precession of the electron are treated in a covariant way by introducing the Lorentz-invariant universal time and by extending Hamilton’s principle from three to four spatial dimensions where the laboratory time is considered as the fourth pseudo-spatial coordinate. Using this procedure and introducing the self action of the electron, its accompanying electromagnetic field and its radiation field are calculated for arbitrary motion. In addition, the Stern-Gerlach effect is revisited for atomic and free electrons.
Author : Stanley Humphries, JR.
Publisher : Courier Corporation
Page : 866 pages
File Size : 43,8 Mb
Release : 2013-04-04
Category : Science
ISBN : 9780486498683
Detailed enough to serve as both text and reference, this volume addresses topics vital to understanding high-power accelerators and high-brightness-charged particle beams, including stochastic cooling, high-brightness injectors, and the free electron laser. 1990 edition.
Author : Harald H. Rose
Publisher : Springer Science & Business Media
Page : 422 pages
File Size : 47,6 Mb
Release : 2009
Category : Science
ISBN : 9783540859154
This resource covering all theoretical aspects of modern geometrical charged-particle optics is aimed at anyone involved in the design of electron optical instruments and beam-guiding systems for charged particles.
Author : Stanley Humphries
Publisher : Courier Corporation
Page : 588 pages
File Size : 41,7 Mb
Release : 2013-09-11
Category : Science
ISBN : 9780486320632
This authoritative text offers a unified, programmed summary of the principles underlying all charged particle accelerators — it also doubles as a reference collection of equations and material essential to accelerator development and beam applications. The only text that covers linear induction accelerators, the work contains straightforward expositions of basic principles rather than detailed theories of specialized areas. 1986 edition.
Author : Anonim
Publisher : Academic Press
Page : 373 pages
File Size : 50,6 Mb
Release : 2009-07-15
Category : Technology & Engineering
ISBN : 9780080912165
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians
Author : Albert Septier
Publisher : Academic Press
Page : 524 pages
File Size : 47,5 Mb
Release : 2013-10-22
Category : Science
ISBN : 9781483270616
Focusing of Charged Particles, Volume I deals with the various aspects of problems in corpuscular optics such as the need for new focusing principles to guide the beams of fast particles over long distances and to increase the internal efficiency of particle accelerators. This volume is comprised of articles from specialists who attempt to find solutions to various problems in geometrical corpuscular optics. The topics discussed in the book include the general properties of potentials, fields and trajectories, the methods for resolving Laplace's and Poisson's equations and computing trajectories with or without space charge, and a description of the methods used for the measurement of magnetic fields. The optics of straight axis systems for producing and focusing low-intensity beams: high-brightness electron guns, electrostatic and magnetic electron lenses, and strong focusing lenses for high-energy beams are covered as well. The text ends with the elucidation of the problem of the production of electron microprobes. Physicists, students, researchers, and engineers working with charged particles will find the book invaluable.