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Author : Roger Theisen
Publisher : Springer Science & Business Media
Page : 173 pages
File Size : 47,9 Mb
Release : 2013-11-11
Category : Technology & Engineering
ISBN : 9783662251065
Author : S. J. B. Reed
Publisher : Cambridge University Press
Page : 232 pages
File Size : 40,7 Mb
Release : 2005-08-25
Category : Science
ISBN : 9781139446389
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Author : K.F.J. Heinrich,D. Newbury
Publisher : Springer Science & Business Media
Page : 397 pages
File Size : 49,7 Mb
Release : 2013-06-29
Category : Science
ISBN : 9781489926173
In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.
Author : Victor D. Scott,Glyn Love
Publisher : Unknown
Page : 356 pages
File Size : 42,6 Mb
Release : 1983
Category : Analytical chemistry
ISBN : UCAL:B4477134
Author : Philip J. Potts,J.F. Bowles,Stephen.J. Reed,R. Cave
Publisher : Springer Science & Business Media
Page : 430 pages
File Size : 50,9 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461520535
30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.
Author : Harvey Yakowitz,Robert L. Myklebust,Kurt F. J. Heinrich
Publisher : Unknown
Page : 56 pages
File Size : 54,7 Mb
Release : 1973
Category : Electron probe microanalysis
ISBN : UIUC:30112106612184
Author : A. J. Tousimis,L. Marton
Publisher : Elsevier
Page : 463 pages
File Size : 47,9 Mb
Release : 2013-11-06
Category : Science
ISBN : 9781483284637
Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.
Author : Kurt F. J. Heinrich
Publisher : Unknown
Page : 24 pages
File Size : 49,6 Mb
Release : 1970
Category : Analytical chemistry
ISBN : UIUC:30112106654418
Although the foundations for a procedure of data reduction in quantitative electron probe analysis have not been changed for several years, there has been progress in the choice of expressions, parameters, and constants. A brief account of recommended expressions and procedures is given. Reference is made to the Standard Reference Materials of Au-Ag and Au-Cu alloys issued for electron probe microanalysis.These are especially useful for investigating the application of correction procedures.
Author : Kurt F. J. Heinrich
Publisher : Unknown
Page : 308 pages
File Size : 48,8 Mb
Release : 1968
Category : Analytical chemistry
ISBN : UOM:39015086431619
Author : Joseph Goldstein
Publisher : Springer Science & Business Media
Page : 598 pages
File Size : 54,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461344223
In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.
Author : S. J. B. Reed
Publisher : Cambridge University Press
Page : 350 pages
File Size : 46,8 Mb
Release : 1997-07-10
Category : Science
ISBN : 052159944X
This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.
Author : Jean Hénoc,Kurt F. J. Heinrich,Robert L. Myklebust
Publisher : Unknown
Page : 136 pages
File Size : 47,7 Mb
Release : 1973
Category : Electron probe microanalysis
ISBN : UIUC:30112106561167
Author : Peter Ingram,John D. Shelburne,Victor L. Roggli,Ann LeFurgey
Publisher : Academic Press
Page : 545 pages
File Size : 48,5 Mb
Release : 1999-10-29
Category : Science
ISBN : 0080524567
Biomedical Applications of Microprobe Analysis is a combination reference/laboratory manual for the use of microprobe analysis in both clinical diagnostic and research settings. Also called microchemical microscopy, microprobe analysis uses high-energy bombardment of cells and tissue, in combination with high resolution EM or confocal microscopy to provide a profile of the ion, metal, and mineral concentrations present in a sample. This allows insight into the physiology and pathophysiology of a wide variety of cells and tissues. This book describes methods for obtaining detailed information about the identity and composition of particles too small to be seen with the naked eye and describes how this information can be useful in diagnostic and biomedical research. Up-to-date review of electron microprobe analysis Detailed descriptions of sample preparation techniques Recent technologies including confocal microscopy, infrared microspectroscopy, and laser raman spectroscopy Over 100 illustrations with numerous specific applications Contributions by world-renowned experts in the field Brief summary of highlights precedes each chapter
Author : Kurt F. J. Heinrich
Publisher : Unknown
Page : 60 pages
File Size : 51,8 Mb
Release : 1972
Category : Electron probe microanalysis
ISBN : UIUC:30112106560730
Author : R Theisen
Publisher : Unknown
Page : 128 pages
File Size : 41,9 Mb
Release : 1965-01-01
Category : Electronic
ISBN : 3540034153