Structural Analysis In Microelectronics And Fiber Optics 1996

Structural Analysis In Microelectronics And Fiber Optics 1996 Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Structural Analysis In Microelectronics And Fiber Optics 1996 book. This book definitely worth reading, it is an incredibly well-written.

Structural Analysis in Microelectronics and Fiber Optics, 1996

Author : Ephraim Suhir
Publisher : Unknown
Page : 236 pages
File Size : 44,7 Mb
Release : 1996
Category : Science
ISBN : STANFORD:36105017795746

Get Book

Structural Analysis in Microelectronics and Fiber Optics, 1996 by Ephraim Suhir Pdf

Proceedings of the November 1996 symposium. Contains 18 papers arranged in sections on structural reliability and dynamics, structural analysis of IC packages, solder alloys and joints, and fiber-optic and optoelectronic structures. Specific topics include singular solutions of interfacial stresses

Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices

Author : Ephraim Suhir
Publisher : CRC Press
Page : 344 pages
File Size : 52,6 Mb
Release : 2021-01-28
Category : Technology & Engineering
ISBN : 9780429863820

Get Book

Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices by Ephraim Suhir Pdf

Avoiding Inelastic Strains in Solder Joint Interconnections of IC Devices addresses analytical (mathematical) modeling approaches aimed at understanding the underlying physics and mechanics of the behavior and performance of solder materials and solder joint interconnections of IC devices. The emphasis is on design for reliability, including probabilistic predictions of the solder lifetime. Describes how to use the developed methods of analytical predictive modeling to minimize thermal stresses and strains in solder joint of IC devices Shows how to build the preprocessing models in finite-element analyses (FEA) by comparing the FEA and analytical data Covers how to design the most effective test vehicles for testing solder joints Details how to design and organize, in addition to or sometimes even instead of highly accelerated life tests (HALT), highly focused and highly cost-effective failure oriented accelerated testing (FOAT) to understand the physic of failure of solder joint interconnections Outlines how to convert the low cycle fatigue conditions into elastic fatigue conditions and to assess the fatigue lifetime in such cases Illustrates ways to replace time- and labor-consuming, expensive, and possibly misleading temperature cycling tests with simpler and physically meaningful accelerated tests This book is aimed towards professionals in electronic and photonic packaging, electronic and optical materials, materials engineering, and mechanical design.

National Semiconductor Metrology Program

Author : National Institute of Standards and Technology (U.S.)
Publisher : Unknown
Page : 160 pages
File Size : 46,5 Mb
Release : 2000
Category : Semiconductors
ISBN : PSU:000073567974

Get Book

National Semiconductor Metrology Program by National Institute of Standards and Technology (U.S.) Pdf

National Semiconductor Metrology Program

Author : National Semiconductor Metrology Program (U.S.)
Publisher : Unknown
Page : 160 pages
File Size : 44,9 Mb
Release : 2000
Category : Semiconductors
ISBN : IND:30000097563542

Get Book

National Semiconductor Metrology Program by National Semiconductor Metrology Program (U.S.) Pdf

Moisture Sensitivity of Plastic Packages of IC Devices

Author : X.J. Fan,E. Suhir
Publisher : Springer Science & Business Media
Page : 573 pages
File Size : 40,6 Mb
Release : 2010-07-23
Category : Technology & Engineering
ISBN : 9781441957191

Get Book

Moisture Sensitivity of Plastic Packages of IC Devices by X.J. Fan,E. Suhir Pdf

Moisture Sensitivity of Plastic Packages of IC Devices provides information on the state-of-the-art techniques and methodologies related to moisture issues in plastic packages. The most updated, in-depth and systematic technical and theoretical approaches are addressed in the book. Numerous industrial applications are provided, along with the results of the most recent research and development efforts, including, but not limited to: thorough exploration of moisture's effects based on lectures and tutorials by the authors, consistent focus on solution-based approaches and methodologies for improved reliability in plastic packaging, emerging theories and cutting-edge industiral applications presented by the leading professionals in the field. Moisture plays a key role in the reliability of plastic packages of IC devices, and moisture-induced failures have become an increasing concern with the development of advanced IC devices. This second volume in the Micro- and Opto-Electronic Materials, Structures, and Systems series is a must-read for researchers and engineers alike.

Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging

Author : Ephraim Suhir,Y.C. Lee,C.P. Wong
Publisher : Springer Science & Business Media
Page : 1471 pages
File Size : 54,6 Mb
Release : 2007-05-26
Category : Technology & Engineering
ISBN : 9780387329895

Get Book

Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging by Ephraim Suhir,Y.C. Lee,C.P. Wong Pdf

This handbook provides the most comprehensive, up-to-date and easy-to-apply information on the physics, mechanics, reliability and packaging of micro- and opto-electronic materials. It details their assemblies, structures and systems, and each chapter contains a summary of the state-of-the-art in a particular field. The book provides practical recommendations on how to apply current knowledge and technology to design and manufacture. It further describes how to operate a viable, reliable and cost-effective electronic component or photonic device, and how to make such a device into a successful commercial product.

Structural Analysis in Microelectronics and Fiber Optics, 1997

Author : American Society of Mechanical Engineers. Electrical and Electronic Packaging Division
Publisher : Amer Society of Mechanical
Page : 272 pages
File Size : 47,6 Mb
Release : 1997-01-01
Category : Technology & Engineering
ISBN : 079181839X

Get Book

Structural Analysis in Microelectronics and Fiber Optics, 1997 by American Society of Mechanical Engineers. Electrical and Electronic Packaging Division Pdf

A selection of 16 papers applying theoretical and experimental methods of structural analysis and engineering mechanics to various mechanical, materials, and manufacturing problems in microelectronics and photonics. Among the topics are assessing chip-scale package design options, the experimental e

Modeling and Simulation for Microelectronic Packaging Assembly

Author : Shen Liu,Yong Liu
Publisher : John Wiley & Sons
Page : 586 pages
File Size : 47,9 Mb
Release : 2011-05-17
Category : Technology & Engineering
ISBN : 9780470827802

Get Book

Modeling and Simulation for Microelectronic Packaging Assembly by Shen Liu,Yong Liu Pdf

Although there is increasing need for modeling and simulation in the IC package design phase, most assembly processes and various reliability tests are still based on the time consuming "test and try out" method to obtain the best solution. Modeling and simulation can easily ensure virtual Design of Experiments (DoE) to achieve the optimal solution. This has greatly reduced the cost and production time, especially for new product development. Using modeling and simulation will become increasingly necessary for future advances in 3D package development. In this book, Liu and Liu allow people in the area to learn the basic and advanced modeling and simulation skills to help solve problems they encounter. Models and simulates numerous processes in manufacturing, reliability and testing for the first time Provides the skills necessary for virtual prototyping and virtual reliability qualification and testing Demonstrates concurrent engineering and co-design approaches for advanced engineering design of microelectronic products Covers packaging and assembly for typical ICs, optoelectronics, MEMS, 2D/3D SiP, and nano interconnects Appendix and color images available for download from the book's companion website Liu and Liu have optimized the book for practicing engineers, researchers, and post-graduates in microelectronic packaging and interconnection design, assembly manufacturing, electronic reliability/quality, and semiconductor materials. Product managers, application engineers, sales and marketing staff, who need to explain to customers how the assembly manufacturing, reliability and testing will impact their products, will also find this book a critical resource. Appendix and color version of selected figures can be found at www.wiley.com/go/liu/packaging