X Ray Absorption Spectroscopy Of Semiconductors

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X-Ray Absorption Spectroscopy of Semiconductors

Author : Claudia S. Schnohr,Mark C. Ridgway
Publisher : Springer
Page : 367 pages
File Size : 42,5 Mb
Release : 2014-11-05
Category : Technology & Engineering
ISBN : 9783662443620

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X-Ray Absorption Spectroscopy of Semiconductors by Claudia S. Schnohr,Mark C. Ridgway Pdf

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

X-Ray Absorption and X-Ray Emission Spectroscopy

Author : Jeroen A. van Bokhoven,Carlo Lamberti
Publisher : John Wiley & Sons
Page : 940 pages
File Size : 43,6 Mb
Release : 2016-03-21
Category : Science
ISBN : 9781118844236

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X-Ray Absorption and X-Ray Emission Spectroscopy by Jeroen A. van Bokhoven,Carlo Lamberti Pdf

During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials

X-ray Scattering From Semiconductors And Other Materials (3rd Edition)

Author : Fewster Paul F
Publisher : World Scientific
Page : 512 pages
File Size : 42,9 Mb
Release : 2015-02-12
Category : Technology & Engineering
ISBN : 9789814436946

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X-ray Scattering From Semiconductors And Other Materials (3rd Edition) by Fewster Paul F Pdf

This third edition has been extended considerably to incorporate more information on instrument influences on the interpretation of X-ray scattering profiles and reciprocal space maps. Another significant inclusion is on the scattering from powder samples, covering a new theoretical approach that explains features that conventional theory cannot. The new edition includes some of the latest methodologies and theoretical treatments, including the latest thinking on dynamical theory and diffuse scattering. Recent advances in detectors also present new opportunities for rapid data collection and some very different approaches in data collection techniques; the possibilities associated with these advances will be included.This edition should be of interest to those who use X-ray scattering to understand more about their samples, so that they can make a better judgment of the parameter and confidence levels in their analyses, and how the combination of instrument, sample and detection should be considered as a whole to ensure this.

X-ray Absorption Fine Structure for Catalysts and Surfaces

Author : Yasuhiro Iwasawa
Publisher : World Scientific
Page : 438 pages
File Size : 40,5 Mb
Release : 1996
Category : Science
ISBN : 9810223234

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X-ray Absorption Fine Structure for Catalysts and Surfaces by Yasuhiro Iwasawa Pdf

X-ray absorption fine structure (XAFS) is a powerful technique in characterization of structures and electronic states of materials in many research fields including, e.g., catalysts, semiconductors, optical ingredients, magnetic materials, and surfaces. This characterization technique could be applied in a static or a dynamic state (in-situ condition). The XAFS can provide information that is not accessible by other techniques for characterization of materials, particularly catalysts and related surfaces. Furthermore, XAFS can provide a molecular-level approach to the study of reaction mechanisms for the understanding of catalysts and development of new catalysts. A number of synchrotron radiation facilities have been planned to be built in Asian countries in addition to the high-brilliant synchrotron radiation facilities under construction in the USA, Europe, and Japan. The applications of XAFS have now expanded to catalytic chemistry and engineering, surface science, organometallic chemistry, materials science, solid-state chemistry, geophysics, etc. This book caters to a wide range of researchers and students working in the domain or related topics.

X-Ray Spectroscopy

Author : Shatendra K Sharma
Publisher : BoD – Books on Demand
Page : 294 pages
File Size : 55,8 Mb
Release : 2012-02-01
Category : Technology & Engineering
ISBN : 9789533079677

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X-Ray Spectroscopy by Shatendra K Sharma Pdf

The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

Synchrotron Radiation Applications

Author : Zhang Xinyi
Publisher : World Scientific
Page : 668 pages
File Size : 40,9 Mb
Release : 2018-03-20
Category : Science
ISBN : 9789813227682

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Synchrotron Radiation Applications by Zhang Xinyi Pdf

This is a research-level review volume. It presents both the fundamentals and the advanced research results, covering most part of important aspects of synchrotron radiation applications. Among the broad subjects of synchrotron radiation applications, as the main content of this book we have applications in VUV, soft X-rays, hard X-rays and XFEL (X-ray free electron laser) and important applications by various synchrotron-based techniques and methods, such as ARPES (angle-resolved photoemission spectroscopy), VUV photo-ionization spectroscopy, X-ray absorption/emission spectroscopy and X-ray absorption fine structure, X-ray diffraction, small angle X-ray scattering, X-ray excited optical luminescence, imaging and high pressure techniques. Contents: Angle Resolved Photoemission Spectroscopy Study Utilizing the Synchrotron Radiation (Yan Zhang, Dawei Shen, and Donglai Feng) Synchrotron-Based VUV Photoionization Mass Spectrometry in Combustion Chemistry Research (Nils Hansen, Bin Yang, and Tina Kasper) Developments on Synchrotron X-Ray Diffraction (Qiyun Xie and Xiaoshan Wu) Structural Biology and Synchrotron Radiation (Zihe Rao and Zhiyong Lou) Fluorescence Detected XAS — Unconventional Applications (Hiroyuki Oyanagi) The Application of X-Ray Absorption Fine Structure Spectroscopy in Functional Materials (Zhihu Sun, Xinyi Zhang, and Shiqiang Wei) Small Angle X-Ray Scattering and Its Applications (Zhonghua Wu and Xueqing Xing) Crystal-Based X-Ray Medical Imaging Using Synchrotron Radiation and Its Future Prospect (Masami Ando, Naoki Sunaguchi, Yongjin Sung, Daisuke Shimao, Jong-Ki Kim, Gang Li, Yoshifumi Suzuki, Tetsuya Yuasa, Kensaku Mori, Shu Ichihara and Rajiv Gupta) X-Ray Imaging and Its Applications (Tiqiao Xiao and Honglan Xie) Synchrotron Radiation Applications in Medicine (Yifeng Peng, Liangqi Wang, Chenglin Liu, Alberto Bravin, Gang Li, Shaoliang Chen, Yongting Wang, Guo-Yuan Yang and Xinyi Zhang) Synchrotron Radiation Applications on High-Pressure Research (Bo Zou, Kai Wang, Shourui Li and Guangtian Zou) X-Ray Excited Optical Luminescence and Its Applications (Lijia Liu and Xuhui Sun) A Compact X-Ray Free-Electron Laser: SACLA (Hitoshi Tanaka, Takashi Tanaka, Kei Sawada, Makina Yabashi, and Tetsuya Ishikawa) Femtosecond Imaging of Single Particles and Molecules Using X-Ray Free-Electron Lasers (Andrew V Martin and N Duane Loh) Readership: Graduate students and professionals working on synchrotron radiation. Keywords: Angle Resolved Photoemission Spectroscopy (ARPES);Coherent Diffractive Imaging (CDI);Combustion;Detactor Development;Free-Electron Laser;High Pressure;Medical Imaging;Nanomaterials;Photoemission Spectroscopy;Protein Crystallography;Serial Femtosecond Crystallography (SFX);Single Particles and Molecules;Small Angle X-Ray Scattering;Strongly Correlated Materials;Surface X-Ray Diffraction;Synchrotron Radiation Applications;Table Top X-Ray Source;VUV Photoionization Mass Spectrometry;X-Ray Absorption Fine Structure (XAFS);X-Ray Absorption Spectroscopy (XAS);X-Ray Excited Optical Luminescence (XEOL);X-Ray Fluorescence (XRF)Review: Key Features: The book contains the latest synchrotron-based techniques and research results All contributors are specialists or leading scientists in their fields The book includes new techniques and methods that will potentially get wider applications in various disciplines

Gamma- and X-ray Spectrometry with Semiconductor Detectors

Author : Klaus Debertin,Richard G. Helmer
Publisher : North Holland
Page : 420 pages
File Size : 48,6 Mb
Release : 1988
Category : Gamma ray spectrometry
ISBN : UCAL:B5012422

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Gamma- and X-ray Spectrometry with Semiconductor Detectors by Klaus Debertin,Richard G. Helmer Pdf

Hardbound. This book covers the topics essential to gamma- and x-ray spectrometry as it is now practiced with semiconductor detectors in the energy range from 5keV to 3MeV. This includes useful physical and mathematical background information, the components of a standard photon spectrometer, spectrum analysis procedures, the energy and efficiency calibration, energy and emission-rate measurement methods and some application examples.

Introduction to XAFS

Author : Grant Bunker
Publisher : Cambridge University Press
Page : 128 pages
File Size : 46,8 Mb
Release : 2010-01-28
Category : Science
ISBN : 9781139485098

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Introduction to XAFS by Grant Bunker Pdf

X-ray absorption fine structure spectroscopy (XAFS) is a powerful and versatile technique for studying structures of materials in chemistry, physics, biology and other fields. This textbook is a comprehensive, practical guide to carrying out and interpreting XAFS experiments. Assuming only undergraduate-level physics and mathematics, the textbook is ideally suited for graduate students in physics and chemistry starting XAFS-based research. It contains concise executable example programs in Mathematica 7. Supplementary material available at www.cambridge.org/9780521767750 includes Mathematica code from the book, related Mathematica programs, and worked data analysis examples. The textbook addresses experiment, theory, and data analysis, but is not tied to specific data analysis programs or philosophies. This makes it accessible to a broad audience in the sciences, and a useful guide for researchers entering the subject.

Carrier-driven Disordering in Semiconductors

Author : Patrick Brian Hillyard
Publisher : Unknown
Page : 276 pages
File Size : 41,5 Mb
Release : 2008
Category : Semiconductors
ISBN : STANFORD:36105210238841

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Carrier-driven Disordering in Semiconductors by Patrick Brian Hillyard Pdf

X-ray Absorption and X-ray Emission Spectroscopy

Author : Jeroen A. van Bokhoven,Carlo Lamberti
Publisher : Unknown
Page : 920 pages
File Size : 41,8 Mb
Release : 2015
Category : Spectrum analysis
ISBN : 1118844246

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X-ray Absorption and X-ray Emission Spectroscopy by Jeroen A. van Bokhoven,Carlo Lamberti Pdf

Defect-Induced Magnetism in Oxide Semiconductors

Author : Parmod Kumar,Jitendra Pal Singh,Vinod Kumar
Publisher : Elsevier
Page : 738 pages
File Size : 50,5 Mb
Release : 2023-05-26
Category : Technology & Engineering
ISBN : 9780323909082

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Defect-Induced Magnetism in Oxide Semiconductors by Parmod Kumar,Jitendra Pal Singh,Vinod Kumar Pdf

Defect-Induced Magnetism in Oxide Semiconductors provides an overview of the latest advances in defect engineering to create new magnetic materials and enable new technological applications. First, the book introduces the mechanisms, behavior, and theory of magnetism in oxide semiconductors and reviews the methods of inducing magnetism in these materials. Then, strategies such as pulsed laser deposition and RF sputtering to grow oxide nanostructured materials with induced magnetism are discussed. This is followed by a review of the most relevant postdeposition methods to induce magnetism in oxide semiconductors including annealing, ion irradiation, and ion implantation. Examples of defect-induced magnetism in oxide semiconductors are provided along with selected applications. This book is a suitable reference for academic researchers and practitioners and for people engaged in research and development in the disciplines of materials science and engineering. Reviews the magnetic, electrical, dielectric and optical properties of oxide semiconductors with defect-induced magnetism Discusses growth and post-deposition strategies to grow oxide nanostructured materials such as oxide thin films with defect-induced magnetism Provides examples of materials with defect-induced magnetism such as zinc oxide, cerium dioxide, hafnium dioxide, and more

Characterization of Semiconductor Heterostructures and Nanostructures

Author : Giovanni Agostini,Carlo Lamberti
Publisher : Elsevier
Page : 501 pages
File Size : 52,7 Mb
Release : 2011-08-11
Category : Science
ISBN : 9780080558158

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Characterization of Semiconductor Heterostructures and Nanostructures by Giovanni Agostini,Carlo Lamberti Pdf

In the last couple of decades, high-performance electronic and optoelectronic devices based on semiconductor heterostructures have been required to obtain increasingly strict and well-defined performances, needing a detailed control, at the atomic level, of the structural composition of the buried interfaces. This goal has been achieved by an improvement of the epitaxial growth techniques and by the parallel use of increasingly sophisticated characterization techniques and of refined theoretical models based on ab initio approaches. This book deals with description of both characterization techniques and theoretical models needed to understand and predict the structural and electronic properties of semiconductor heterostructures and nanostructures. Comprehensive collection of the most powerful characterization techniques for semiconductor heterostructures and nanostructures Most of the chapters are authored by scientists that are among the top 10 worldwide in publication ranking of the specific field Each chapter starts with a didactic introduction on the technique The second part of each chapter deals with a selection of top examples highlighting the power of the specific technique to analyze the properties of semiconductors

Semiconductor X-Ray Detectors

Author : B. G. Lowe,R. A. Sareen
Publisher : CRC Press
Page : 626 pages
File Size : 51,7 Mb
Release : 2013-12-07
Category : Technology & Engineering
ISBN : 9781466554009

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Semiconductor X-Ray Detectors by B. G. Lowe,R. A. Sareen Pdf

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detectors, an important supplement to the knowledge now required to achieve full understanding of the workings of SDDs, CCDs, and Compound Semiconductor Detectors. The book provides an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters present a self-contained summary of relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the assembly and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.

Hydrogenated Dilute Nitride Semiconductors

Author : Gianluca Ciatto
Publisher : CRC Press
Page : 316 pages
File Size : 50,8 Mb
Release : 2015-04-01
Category : Science
ISBN : 9789814463461

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Hydrogenated Dilute Nitride Semiconductors by Gianluca Ciatto Pdf

The nonlinear behavior of nitrogen and the passivation effect of hydrogen in dilute nitrides open the way to the manufacture of a new class of nanostructured devices with in-plane variation of the optical band gap. This book addresses the modifications of the electronic structure and of the optical and structural properties induced in these technologically important semiconductors by atomic hydrogen irradiation. The book comprises discussions on experimental results from several techniques, enriched by state-of-the-art theoretical studies aimed at clarifying the origin of hydrogenation effects that lead to the discovery of specific nitrogen–hydrogen complexes. It presents techniques, such as infrared absorption spectroscopy, synchrotron radiation, and nuclear reaction analysis, which have indeed been crucial for addressing the physical origin of hydrogenation effects and their role in fine structural characterization. The book is not a simple assembly of the contributions of different groups on the subject; it rather tells the complete story of the amazing effects of hydrogen irradiation from the first observations to the discovery of their origin and to potential technology transfer. The primary scope of the book is to guide PhD students and new scientists into the field and to inspire similar analysis approaches in other fields.

Physics of Organic Semiconductors

Author : Wolfgang Brütting
Publisher : John Wiley & Sons
Page : 554 pages
File Size : 42,6 Mb
Release : 2006-05-12
Category : Science
ISBN : 9783527606795

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Physics of Organic Semiconductors by Wolfgang Brütting Pdf

Filling the gap in the literature currently available, this book presents an overview of our knowledge of the physics behind organic semiconductor devices. Contributions from 18 international research groups cover various aspects of this field, ranging from the growth of organic layers and crystals, their electronic properties at interfaces, their photophysics and electrical transport properties to the application of these materials in such different devices as organic field-effect transistors, photovoltaic cells and organic light-emitting diodes. From the contents: * Excitation Dynamics in Organic Semiconductors * Organic Field-Effect Transistors * Spectroscopy of Organic Semiconductors * Interfaces between Organic Semiconductors and Metals * Analysis and Modeling of Devices * Exciton Formation and Energy Transfer in Organic Light Emitting Diodes * Deposition and Characterization