Download Full eBooks in PDF
2001 Ieee International Integrated Reliability Workshop Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of 2001 Ieee International Integrated Reliability Workshop book. This book definitely worth reading, it is an incredibly well-written.
Author : Anonim
Publisher : Unknown
Page : 106 pages
File Size : 40,6 Mb
Release : 2001
Category : Integrated circuits
ISBN : OCLC:1069397143
Author : IEEE Electron Devices Society
Publisher : IEEE
Page : 106 pages
File Size : 54,9 Mb
Release : 2001
Category : Technology & Engineering
ISBN : 0780371674
Author : Anonim
Publisher : IEEE
Page : 161 pages
File Size : 50,6 Mb
Release : 2008
Category : Computers
ISBN : 1424440017
Author : IEEE Staff,Institute of Electrical and Electronics Engineers (New York, NY)
Publisher : Unknown
Page : 164 pages
File Size : 43,6 Mb
Release : 2011-10-16
Category : Integrated circuits
ISBN : 1457701138
Author : Anonim
Publisher : Unknown
Page : 234 pages
File Size : 48,5 Mb
Release : 2004
Category : Integrated circuits
ISBN : UIUC:30112061323249
Author : Electron Devices Society,IEEE Staff,Institute of Electrical and Electronics Engineers,Reliability Society
Publisher : Unknown
Page : 180 pages
File Size : 45,8 Mb
Release : 2010
Category : Components, Circuits, Devices & Systems
ISBN : 1424485215
Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 52,9 Mb
Release : 2017-10-08
Category : Electronic
ISBN : 1538623331
The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems Topics include resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, MEMS and sensor reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets
Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 52,9 Mb
Release : 2017
Category : Integrated circuits
ISBN : 1538623323
Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 47,8 Mb
Release : 2013-10-13
Category : Technology & Engineering
ISBN : 1479903493
Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 55,7 Mb
Release : 2008
Category : Electronic
ISBN : 1509078223
Author : IEEE Electron Devices Society,IEEE Staff,IEEE Reliability Society
Publisher : Unknown
Page : 181 pages
File Size : 46,5 Mb
Release : 2009
Category : Electronic
ISBN : 1424439205
Author : Ming Yang
Publisher : Unknown
Page : 688 pages
File Size : 44,7 Mb
Release : 2001
Category : Semiconductors
ISBN : UCAL:C3785029
Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 49,7 Mb
Release : 2020-10-04
Category : Electronic
ISBN : 1728170591
he IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
Author : Anonim
Publisher : IEEE
Page : 168 pages
File Size : 50,5 Mb
Release : 2007-01-01
Category : Technology & Engineering
ISBN : 1424411718
Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 45,5 Mb
Release : 2014-10-12
Category : Electronic
ISBN : 1479973084
The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems