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Author : IEEE Staff,Institute of Electrical and Electronics Engineers (New York, NY)
Publisher : Unknown
Page : 164 pages
File Size : 53,7 Mb
Release : 2011-10-16
Category : Integrated circuits
ISBN : 1457701138
Author : Anonim
Publisher : Unknown
Page : 202 pages
File Size : 41,6 Mb
Release : 2005
Category : Integrated circuits
ISBN : UOM:39015058744502
Author : IEEE Electron Devices Society
Publisher : IEEE
Page : 106 pages
File Size : 47,7 Mb
Release : 2001
Category : Technology & Engineering
ISBN : 0780371674
Author : Anonim
Publisher : IEEE
Page : 161 pages
File Size : 40,8 Mb
Release : 2008
Category : Computers
ISBN : 1424440017
Author : IEEE Staff
Publisher : Unknown
Page : 128 pages
File Size : 51,8 Mb
Release : 2014-10-12
Category : Electronic
ISBN : 1479973084
The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
Author : Anonim
Publisher : Unknown
Page : 187 pages
File Size : 47,7 Mb
Release : 2014
Category : Electronic
ISBN : 1479972746
Author : Anonim
Publisher : Unknown
Page : 164 pages
File Size : 52,5 Mb
Release : 2011
Category : Integrated circuits
ISBN : OCLC:812659684
Author : Anonim
Publisher : IEEE
Page : 168 pages
File Size : 53,6 Mb
Release : 2007-01-01
Category : Technology & Engineering
ISBN : 1424411718
Author : Anonim
Publisher : Unknown
Page : 182 pages
File Size : 44,7 Mb
Release : 2005
Category : Integrated circuits
ISBN : 1509097732
Author : Anonim
Publisher : Unknown
Page : 0 pages
File Size : 42,6 Mb
Release : 1996
Category : Electrical & Computer Engineering
ISBN : OCLC:1336880305
Author : Samuel Vasconcelos Araújo
Publisher : kassel university press GmbH
Page : 238 pages
File Size : 42,8 Mb
Release : 2013-06-13
Category : Semiconductors
ISBN : 9783862194865
Author : Mikhail Baklanov,Paul S. Ho,Ehrenfried Zschech
Publisher : John Wiley & Sons
Page : 616 pages
File Size : 46,5 Mb
Release : 2012-04-02
Category : Technology & Engineering
ISBN : 9780470662540
Finding new materials for copper/low-k interconnects is critical to the continuing development of computer chips. While copper/low-k interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto a single chip, the increased resistance and RC-delay at the smaller scale has become a significant factor affecting chip performance. Advanced Interconnects for ULSI Technology is dedicated to the materials and methods which might be suitable replacements. It covers a broad range of topics, from physical principles to design, fabrication, characterization, and application of new materials for nano-interconnects, and discusses: Interconnect functions, characterisations, electrical properties and wiring requirements Low-k materials: fundamentals, advances and mechanical properties Conductive layers and barriers Integration and reliability including mechanical reliability, electromigration and electrical breakdown New approaches including 3D, optical, wireless interchip, and carbon-based interconnects Intended for postgraduate students and researchers, in academia and industry, this book provides a critical overview of the enabling technology at the heart of the future development of computer chips.
Author : Jens Lienig,Matthias Thiele
Publisher : Springer
Page : 159 pages
File Size : 41,7 Mb
Release : 2018-02-23
Category : Technology & Engineering
ISBN : 9783319735580
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
Author : Electron Devices Society,Institute of Electrical and Electronics Engineers,Reliability Society
Publisher : Unknown
Page : 168 pages
File Size : 40,9 Mb
Release : 2007
Category : Integrated circuits
ISBN : 1424411726