2014 Ieee International Integrated Reliability Workshop Final Report Iirw
2014 Ieee International Integrated Reliability Workshop Final Report Iirw Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of 2014 Ieee International Integrated Reliability Workshop Final Report Iirw book. This book definitely worth reading, it is an incredibly well-written.
2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) by IEEE Staff Pdf
The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
Metrology and Physical Mechanisms in New Generation Ionic Devices by Umberto Celano Pdf
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Conductive Atomic Force Microscopy by Mario Lanza Pdf
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale. To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM. With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Heterogeneous Memory Organizations in Embedded Systems by Miguel Peón Quirós,Francky Catthoor,José Manuel Mendías Cuadros Pdf
This book defines and explores the problem of placing the instances of dynamic data types on the components of the heterogeneous memory organization of an embedded system, with the final goal of reducing energy consumption and improving performance. It is one of the first to cover the problem of placement for dynamic data objects on embedded systems with heterogeneous memory architectures, presenting a complete methodology that can be easily adapted to real cases and work flows. The authors discuss how to improve system performance and energy consumption simultaneously. Discusses the problem of placement for dynamic data objects on embedded systems with heterogeneous memory architectures; Presents a complete methodology that can be adapted easily to real cases and work flows; Offers hints on how to improve system performance and energy consumption simultaneously.
Reliability Prediction for Microelectronics by Joseph B. Bernstein,Alain Bensoussan,Emmanuel Bender Pdf
RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters over the lifespan of machines cannot be guaranteed. With microelectronics in particular, the challenges to evaluating reliability are considerable, and statistical methods for creating microelectronic reliability standards are complex. With nano-scale microelectronic devices increasingly prominent in modern life, it has never been more important to understand the tools available to evaluate reliability. Reliability Prediction for Microelectronics meets this need with a cluster of tools built around principles of reliability physics and the concept of remaining useful life (RUL). It takes as its core subject the ‘physics of failure’, combining a thorough understanding of conventional approaches to reliability evaluation with a keen knowledge of their blind spots. It equips engineers and researchers with the capacity to overcome decades of errant reliability physics and place their work on a sound engineering footing. Reliability Prediction for Microelectronics readers will also find: Focus on the tools required to perform reliability assessments in real operating conditions Detailed discussion of topics including failure foundation, reliability testing, acceleration factor calculation, and more New multi-physics of failure on DSM technologies, including TDDB, EM, HCI, and BTI Reliability Prediction for Microelectronics is ideal for reliability and quality engineers, design engineers, and advanced engineering students looking to understand this crucial area of product design and testing.
Noise in Nanoscale Semiconductor Devices by Tibor Grasser Pdf
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
2011 IEEE International Integrated Reliability Workshop Final Report by IEEE Staff,Institute of Electrical and Electronics Engineers (New York, NY) Pdf
2020 IEEE International Integrated Reliability Workshop (IIRW) by IEEE Staff Pdf
he IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
Soft Error Reliability Using Virtual Platforms by Felipe Rocha da Rosa,Luciano Ost,Ricardo Reis Pdf
This book describes the benefits and drawbacks inherent in the use of virtual platforms (VPs) to perform fast and early soft error assessment of multicore systems. The authors show that VPs provide engineers with appropriate means to investigate new and more efficient fault injection and mitigation techniques. Coverage also includes the use of machine learning techniques (e.g., linear regression) to speed-up the soft error evaluation process by pinpointing parameters (e.g., architectural) with the most substantial impact on the software stack dependability. This book provides valuable information and insight through more than 3 million individual scenarios and 2 million simulation-hours. Further, this book explores machine learning techniques usage to navigate large fault injection datasets.
Fundamentals of Electromigration-Aware Integrated Circuit Design by Jens Lienig,Matthias Thiele Pdf
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
2017 IEEE International Integrated Reliability Workshop (IIRW) by IEEE Staff Pdf
The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems Topics include resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, MEMS and sensor reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets
2019 IEEE International Integrated Reliability Workshop (IIRW) by IEEE Staff Pdf
The IEEE International Integrated Reliability Workshop (IIRW) focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems Topics include resistive memories, high k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low k dielectrics, impact of transistor degradation on circuit reliability, MEMS and sensor reliability, designing in reliability (products, circuits, systems, processes), customer product reliability requirements manufacturer reliability tasks, wafer level reliability tests (test approaches and reliability test structures), reliability modeling and simulation, optoelectronics, and single event upsets
