High Resolution Electron Microscopy For Materials Science

Author : Daisuke Shindo,Hiraga Kenji
Publisher : Springer Science & Business Media
Page : 196 pages
File Size : 41,6 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9784431684220

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High-Resolution Electron Microscopy for Materials Science by Daisuke Shindo,Hiraga Kenji Pdf

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Author : Daisuke Shindo,Hiraga Kenji
Publisher : Unknown
Page : 206 pages
File Size : 54,7 Mb
Release : 1998-09-01
Category : Electronic
ISBN : 4431684239

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High-Resolution Electron Microscopy for Materials Science by Daisuke Shindo,Hiraga Kenji Pdf

Author : Florian Banhart
Publisher : World Scientific
Page : 318 pages
File Size : 42,6 Mb
Release : 2008
Category : Science
ISBN : 9789812797339

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In-situ Electron Microscopy at High Resolution by Florian Banhart Pdf

In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.

Author : John C. H. Spence
Publisher : Oxford University Press
Page : 425 pages
File Size : 40,8 Mb
Release : 2009
Category : Science
ISBN : 9780199552757

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High-Resolution Electron Microscopy by John C. H. Spence Pdf

This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.

Author : David G. Rickerby,Giovanni Valdrè,Ugo Valdrè
Publisher : Springer Science & Business Media
Page : 503 pages
File Size : 49,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9789401144513

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Impact of Electron and Scanning Probe Microscopy on Materials Research by David G. Rickerby,Giovanni Valdrè,Ugo Valdrè Pdf

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

Author : Nicolas Brodusch,Hendrix Demers,Raynald Gauvin
Publisher : Springer
Page : 137 pages
File Size : 43,9 Mb
Release : 2017-09-25
Category : Technology & Engineering
ISBN : 9789811044335

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Field Emission Scanning Electron Microscopy by Nicolas Brodusch,Hendrix Demers,Raynald Gauvin Pdf

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Author : U Valdre
Publisher : Elsevier
Page : 785 pages
File Size : 52,6 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323142564

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Electron Microscopy In Material Science by U Valdre Pdf

Electron Microscopy in Material Science covers the proceedings of the International School of Electron Microscopy held in Erice, Itsaly, in 1970. The said conference is intended to the developments of electron optics and electron microscopy and its applications in material science. The book is divided into four parts. Part I discusses the impact of electron microscopy in the science of materials. Part II covers topics such as electron optics and instrumentation; geometric electron optics and its problems; and special electron microscope specimen stages. Part III explains the theory of electron diffraction image contrast and then elaborates on related areas such as the application of electron diffraction and of electron microscopy to radiation; computing methods; and problems in electron microscopy. Part IV includes topics such as the transfer of image information in the electron microscope; phase contrast microscopy; and the magnetic phase contrast. The text is recommended for electron microscopists who are interested in the application of their field in material science, as well as for experts in the field of material science and would like to know about the importance of electron microscopy.

Author : Manfred Rühle,Frank Ernst
Publisher : Springer Science & Business Media
Page : 460 pages
File Size : 44,6 Mb
Release : 2003-01-31
Category : Medical
ISBN : 3540418180

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High-Resolution Imaging and Spectrometry of Materials by Manfred Rühle,Frank Ernst Pdf

This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

Author : P G Merli,M Vittori Antisari
Publisher : World Scientific
Page : 698 pages
File Size : 47,8 Mb
Release : 1993-01-08
Category : Electronic
ISBN : 9789814555050

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Electron Microscopy In Materials Science - Proceedings Of The International School by P G Merli,M Vittori Antisari Pdf

This volume contains an updated description of the experimental methods currently used in both Scanning and Transmission Electron Microscopy as well as the principles of electron optics and an outline of the most recent instrumental developments.The authors introduce the fundamental principles at the basis of the different techniques, the approximation used in the development of the theories, their range of validity, while stressing how to get microstructural information relevant in Materials Science.

Author : Lawrence Eugene Murr
Publisher : Unknown
Page : 568 pages
File Size : 43,5 Mb
Release : 1970
Category : Science
ISBN : STANFORD:36105030173798

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Electron Optical Applications in Materials Science by Lawrence Eugene Murr Pdf

Problems after each chapter.

Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 53,6 Mb
Release : 1985
Category : Electronic
ISBN : OCLC:799293108

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High-resolution Electron Microscopy by Anonim Pdf

Author : Brent Fultz,James M. Howe
Publisher : Springer Science & Business Media
Page : 775 pages
File Size : 48,5 Mb
Release : 2012-10-14
Category : Science
ISBN : 9783642297601

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Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz,James M. Howe Pdf

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Author : Frank Ernst,Manfred Rühle
Publisher : Springer Science & Business Media
Page : 454 pages
File Size : 43,9 Mb
Release : 2013-03-09
Category : Technology & Engineering
ISBN : 9783662077665

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High-Resolution Imaging and Spectrometry of Materials by Frank Ernst,Manfred Rühle Pdf

The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.

Author : Peter Buseck,John Cowley,LeRoy Eyring
Publisher : Oxford University Press
Page : 670 pages
File Size : 46,6 Mb
Release : 1989-02-02
Category : Science
ISBN : 0195364651

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High-Resolution Transmission Electron Microscopy by Peter Buseck,John Cowley,LeRoy Eyring Pdf

This book provides an introduction to the fundamental concepts, techniques, and methods used for electron microscopy at high resolution in space, energy, and even in time. It delineates the theory of elastic scattering, which is most useful for spectroscopic and chemical analyses. There are also discussions of the theory and practice of image calculations, and applications of HRTEM to the study of solid surfaces, highly disordered materials, solid state chemistry, mineralogy, semiconductors and metals. Contributors include J. Cowley, J. Spence, P. Buseck, P. Self, and M.A. O'Keefe. Compiled by experts in the fields of geology, physics and chemistry, this comprehensive text will be the standard reference for years to come.

Author : Alina Bruma
Publisher : CRC Press
Page : 164 pages
File Size : 50,7 Mb
Release : 2020-12-20
Category : Computers
ISBN : 9780429512735

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Scanning Transmission Electron Microscopy by Alina Bruma Pdf

Scanning Transmission Electron Microscopy is focused on discussing the latest approaches in the recording of high-fidelity quantitative annular dark-field (ADF) data. It showcases the application of machine learning in electron microscopy and the latest advancements in image processing and data interpretation for materials notoriously difficult to analyze using scanning transmission electron microscopy (STEM). It also highlights strategies to record and interpret large electron diffraction datasets for the analysis of nanostructures. This book: Discusses existing approaches for experimental design in the recording of high-fidelity quantitative ADF data Presents the most common types of scintillator-photomultiplier ADF detectors, along with their strengths and weaknesses. Proposes strategies to minimize the introduction of errors from these detectors and avenues for dealing with residual errors Discusses the practice of reliable multiframe imaging, along with the benefits and new experimental opportunities it presents in electron dose or dose-rate management Focuses on supervised and unsupervised machine learning for electron microscopy Discusses open data formats, community-driven software, and data repositories Proposes methods to process information at both global and local scales, and discusses avenues to improve the storage, transfer, analysis, and interpretation of multidimensional datasets Provides the spectrum of possibilities to study materials at the resolution limit by means of new developments in instrumentation Recommends methods for quantitative structural characterization of sensitive nanomaterials using electron diffraction techniques and describes strategies to collect electron diffraction patterns for such materials This book helps academics, researchers, and industry professionals in materials science, chemistry, physics, and related fields to understand and apply computer-science–derived analysis methods to solve problems regarding data analysis and interpretation of materials properties.