Ellipsometry Of Functional Organic Surfaces And Films

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Ellipsometry of Functional Organic Surfaces and Films

Author : Karsten Hinrichs,Klaus-Jochen Eichhorn
Publisher : Springer
Page : 547 pages
File Size : 41,8 Mb
Release : 2018-05-06
Category : Science
ISBN : 9783319758954

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Ellipsometry of Functional Organic Surfaces and Films by Karsten Hinrichs,Klaus-Jochen Eichhorn Pdf

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years. The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.

Polymer Surface Characterization

Author : Luigia Sabbatini,Elvira De Giglio
Publisher : Walter de Gruyter GmbH & Co KG
Page : 403 pages
File Size : 46,5 Mb
Release : 2022-01-19
Category : Technology & Engineering
ISBN : 9783110701098

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Polymer Surface Characterization by Luigia Sabbatini,Elvira De Giglio Pdf

This fully updated edition provides a broad approach to the surface analysis of polymers being of high technological interest. Modern analytical techniques, potential applications and recent advances in instrumental apparatus are discussed. The self-consistent chapters are devoted to techniques from photoelectron spectroscopy to electron microscopies and wettability.

Advanced Green Chemistry - Part 1: Greener Organic Reactions And Processes

Author : Horvath Istvan T,Malacria Max
Publisher : World Scientific
Page : 304 pages
File Size : 45,5 Mb
Release : 2017-12-15
Category : Science
ISBN : 9789813228122

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Advanced Green Chemistry - Part 1: Greener Organic Reactions And Processes by Horvath Istvan T,Malacria Max Pdf

Green Chemistry has evolved in response to several environmental issues in the second half of the last century, mostly due to the almost freely expanding chemical, petrochemical, and pharmaceutical industries. During the past two decades Green Chemistry grew rapidly and we can now consider this area as a mature and powerful field. Tremendous development has taken place in many important areas including renewable energy and resources, reaction environments, catalysis, synthesis, chemical biology, green materials, in situ monitoring and facile recycling. The combination of Green Chemistry with engineering, biology, toxicology, and physics will lead to novel interdisciplinary systems, which can now lift Green Chemistry to the next, advanced level. The editors of this book have assembled as authors among the best specialists of this growing area of research. This collection of reviews and perspectives provides an exciting vision of the more recent developments in Green Chemistry. It illustrates the breath of the field and its role to address environmental issues. This volume will serve as a book of reference showing a panoramic view of the field and a preview of its future direction as well as a book of inspiration for those aiming to further advance its frontiers. Contents: Preface (István T Horváth and Max Malacria)Evolution of Green Chemistry (Paul T Anastas)Carbohydrates as Renewable Resources for Carbon Chemicals (Laszlo T Mika)Solvation Behavior of Ionic Liquids and Their Role in the Production of Lignocellulosic Biofuels and Sustainable Chemical Feedstocks (Coby Clarke, Wei-Chien Tu, Lisa Weigand, Agnieszka Brandt and Jason Hallet)Aliphatic Nitro Compounds as Key Precursors for the Eco-Friendly Synthesis of Fine Chemicals Under Solvent Free Conditions (Roberto Ballini and Alessandro Palmieri)Green Reaction Media for Cross-Coupling Reactions: A Recent Overview and Possible Directions (Stefano Santoro, Assunta Marrocchi, Oriana Piermatti and Luigi Vaccaro )In-situ Monitoring of the Electrochemical Surface Modification by Thin Organic Layers (Jörg Rappich, Guoguang Sun and Karsten Hinrichs)Continuous Flow Technologies in the Development of 'Green' Organic Reactions and Processes (Klaus Hellgardt and King Kuok (Mimi) Hii) Readership: Graduate students, researchers and professionals in catalyst chemistry, environmental/atmospheric chemistry, organic chemistry, physical chemistry, biological chemistry. Keywords: Green;Sustainable;Renewable Energy and Resources;Reaction Environments;Catalysis;Synthesis (Cascade, Domino, Tandem);Chemical Biology;Green MaterialsReview: Key Features: The editors have assembled as authors among the best specialists of this growing area of researchThis collection of reviews and perspectives provides an exciting vision of the more recent developments in Green ChemistryIt illustrates the breath of the field and its role to address environmental issuesThis volume will serve as a book of reference showing a panoramic view of the field and a preview of its future direction as well as a book of inspiration for those aiming to further advance its frontiers

Ellipsometry at the Nanoscale

Author : Maria Losurdo,Kurt Hingerl
Publisher : Springer Science & Business Media
Page : 740 pages
File Size : 51,7 Mb
Release : 2013-03-12
Category : Technology & Engineering
ISBN : 9783642339561

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Ellipsometry at the Nanoscale by Maria Losurdo,Kurt Hingerl Pdf

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

Infrared Spectroscopic Ellipsometry

Author : Arnulf Röseler
Publisher : VCH
Page : 168 pages
File Size : 40,5 Mb
Release : 1990
Category : Ellipsometry
ISBN : UVA:X030143775

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Infrared Spectroscopic Ellipsometry by Arnulf Röseler Pdf

Ellipsometry in the Measurement of Surfaces and Thin Films

Author : Elio Passaglia,Robert R. Stromberg,Jerome Kruger
Publisher : Unknown
Page : 366 pages
File Size : 53,6 Mb
Release : 1964
Category : Ellipsometry
ISBN : UOM:39015086491134

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Ellipsometry in the Measurement of Surfaces and Thin Films by Elio Passaglia,Robert R. Stromberg,Jerome Kruger Pdf

Spectroscopic Ellipsometry

Author : Hiroyuki Fujiwara
Publisher : John Wiley & Sons
Page : 388 pages
File Size : 43,7 Mb
Release : 2007-09-27
Category : Technology & Engineering
ISBN : 0470060182

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Spectroscopic Ellipsometry by Hiroyuki Fujiwara Pdf

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

A User's Guide to Ellipsometry

Author : Harland G. Tompkins
Publisher : Academic Press
Page : 260 pages
File Size : 41,5 Mb
Release : 2012-12-02
Category : Science
ISBN : 9780323140003

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A User's Guide to Ellipsometry by Harland G. Tompkins Pdf

This book is specifically designed for the user who wishes expanded use of ellipsometry beyond the relatively limited number of turn-key applications. The book provides a concise discussion of theory and instrumentation before describing how to use optical parameters to determine material properties and optical parameters for inaccessible substrates and unknown films, and how to measure extremely thin films. The book also addresses polysilicon, a material commonly used in the microelectronics industry, and the effect of substrate roughness. This book's concepts and applications are reinforced through the 14 case studies that illustrate specific applications of ellipsometry from the semiconductor industry as well as studies involving corrosion and oxide growth. Allows the user to optimize turn-key operation of ellipsometers and move beyond limited turn-key applications Provides comprehensive discussion of the measurement of film thickness and optical constants in film Discusses the trajectories of the ellipsometric parameters Del and Psi and how changes in the materials affect the parameter Includes 14 case studies to reinforce specific applications Includes three appendices for helpful references

Functional Polymer Films, 2 Volume Set

Author : Wolfgang Knoll,Rigoberto C. Advincula
Publisher : John Wiley & Sons
Page : 1107 pages
File Size : 44,7 Mb
Release : 2013-02-12
Category : Science
ISBN : 9783527638499

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Functional Polymer Films, 2 Volume Set by Wolfgang Knoll,Rigoberto C. Advincula Pdf

Very thin film materials have emerged as a highly interesting and useful quasi 2D-state functionality. They have given rise to numerous applications ranging from protective and smart coatings to electronics, sensors and display technology as well as serving biological, analytical and medical purposes. The tailoring of polymer film properties and functions has become a major research field. As opposed to the traditional treatise on polymer and resin-based coatings, this one-stop reference is the first to give readers a comprehensive view of the latest macromolecular and supramolecular film-based nanotechnology. Bringing together all the important facets and state-of-the-art research, the two well-structured volumes cover film assembly and depostion, functionality and patterning, and analysis and characterization. The result is an in-depth understanding of the phenomena, ordering, scale effects, fabrication, and analysis of polymer ultrathin films. This book will be a valuable addition for Materials Scientists, Polymer Chemists, Surface Scientists, Bioengineers, Coatings Specialists, Chemical Engineers, and Scientists working in this important research field and industry.

Spectroscopic Ellipsometry

Author : Harland G. Tompkins,James N. Hilfiker
Publisher : Momentum Press
Page : 178 pages
File Size : 48,5 Mb
Release : 2015-12-16
Category : Technology & Engineering
ISBN : 9781606507285

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Spectroscopic Ellipsometry by Harland G. Tompkins,James N. Hilfiker Pdf

Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.

Characterization of Organic Thin Films

Author : Abraham Ulman
Publisher : Butterworth-Heinemann
Page : 302 pages
File Size : 52,8 Mb
Release : 1995
Category : Science
ISBN : UOM:39015026902927

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Characterization of Organic Thin Films by Abraham Ulman Pdf

Characterization of Organic Thin Films will help materials scientists, physicists, chemists, and biologists develop a fundamental understanding of structure-properties relationships which in turn makes possible molecular engineering of advanced materials and opens new opportunities in molecular manufacturing.

Infrared Ellipsometry on Semiconductor Layer Structures

Author : Mathias Schubert
Publisher : Springer Science & Business Media
Page : 216 pages
File Size : 49,5 Mb
Release : 2004-11-26
Category : Science
ISBN : 3540232494

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Infrared Ellipsometry on Semiconductor Layer Structures by Mathias Schubert Pdf

The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.

An Introduction to Ultrathin Organic Films

Author : Abraham Ulman
Publisher : Academic Press
Page : 442 pages
File Size : 40,7 Mb
Release : 2013-10-22
Category : Technology & Engineering
ISBN : 9780080926315

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An Introduction to Ultrathin Organic Films by Abraham Ulman Pdf

The development of oriented organic monomolecular layers by the Langmuir-Blodgett (LB) and self-assembly (SA) techniques has led researchers toward their goal of assembling individual molecules into highly ordered architectures. Thus the continually growing contribution of LB and SA systems to the chemistry and physics of thin organic films is widely recognized. Equally well-known is the difficulty in keeping up to date with the burgeoning multidisciplinary research in this area. Dr. Ulman provides a massive survey of the available literature. The book begins with a section on analytical tools to broaden the understanding of the structure and properties of monolayers and films. Following sections discuss LB films, the preparation and properties of SA monolayers and films, the modeling of LB and SA monolayers, and the application of LB and SA films.

Organic Thin Films and Surfaces: Directions for The Nineties

Author : Abraham Ulman
Publisher : Elsevier
Page : 392 pages
File Size : 40,5 Mb
Release : 2013-10-22
Category : Technology & Engineering
ISBN : 9781483288895

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Organic Thin Films and Surfaces: Directions for The Nineties by Abraham Ulman Pdf

Physics of Thin Films has been one of the longest running continuing series in thin film science consisting of 20 volumes since 1963. The series contains some of the highest quality studies of the properties ofvarious thin films materials and systems. In order to be able to reflect the development of todays science and to cover all modern aspects of thin films, the series, beginning with Volume 20, will move beyond the basic physics of thin films. It will address the most important aspects of both inorganic and organic thin films, in both their theoretical as well as technological aspects. Therefore, in order to reflect the modern technology-oriented problems, the title has been slightly modified from Physics of Thin Films to Thin Films. Edited by Abraham Ulman, Organic Thin Films and Surfaces: Directions for the Nineties will be the first volume to link two dynamic areas in the physical sciences--organic thin films and surface science. Contributions from leading experts in the field cover a range of important topics on the processing, characterization, and applications of organic thin films.

Introduction to Spectroscopic Ellipsometry of Thin Film Materials

Author : Andrew T. S. Wee,Xinmao Yin,Chi Sin Tang
Publisher : John Wiley & Sons
Page : 213 pages
File Size : 53,8 Mb
Release : 2022-03-08
Category : Technology & Engineering
ISBN : 9783527833955

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Introduction to Spectroscopic Ellipsometry of Thin Film Materials by Andrew T. S. Wee,Xinmao Yin,Chi Sin Tang Pdf

A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems. The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes: Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites Comprehensive explorations of two-dimensional transition metal dichalcogenides Practical discussions of single layer graphene systems and nickelate systems In-depth examinations of potential future developments and applications of spectroscopic ellipsometry Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.