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Author : Grace M. Davidson,ASM International
Publisher : ASM International
Page : 310 pages
File Size : 55,5 Mb
Release : 1997-01-01
Category : Technology & Engineering
ISBN : 9781615030828
Author : A S M International
Publisher : ASM International(OH)
Page : 346 pages
File Size : 43,6 Mb
Release : 1997
Category : Electronic book
ISBN : 0871706199
Proceedings of the October 1997 symposium, of interest to engineers involved in testing and failure analysis of semiconductor devices. Contains sections on testing and signature analysis, techniques, micro-electric-mechanical systems, discretes, packaging/E-beam, FIB/E- beam, and case histories. Specific topics include gain reduction in silicon pho
Author : Anonim
Publisher : ASM International
Page : 128 pages
File Size : 41,8 Mb
Release : 2018-12-01
Category : Electronic
ISBN : 9781627080996
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author : ASM International
Publisher : Unknown
Page : 660 pages
File Size : 46,7 Mb
Release : 2017-12
Category : Electronic
ISBN : 162708150X
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author : A. S. M. International,International Symposium for Testing and Failure Analysis
Publisher : ASM International
Page : 561 pages
File Size : 44,6 Mb
Release : 2014-11-01
Category : Technology & Engineering
ISBN : 9781627080743
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Author : Anonim
Publisher : ASM International
Page : 479 pages
File Size : 40,6 Mb
Release : 2011
Category : Technology & Engineering
ISBN : 9781615038503
Author : ASM International
Publisher : ASM International
Page : 456 pages
File Size : 50,9 Mb
Release : 2001-01-01
Category : Technology & Engineering
ISBN : 9781615030859
Author : ASM International
Publisher : ASM International
Page : 551 pages
File Size : 54,6 Mb
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 9781615030910
Author : Anonim
Publisher : ASM International
Page : 540 pages
File Size : 41,9 Mb
Release : 2019-12-01
Category : Technology & Engineering
ISBN : 9781627082730
The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.
Author : ASM International,Electronic Device Failure Analysis Society
Publisher : Unknown
Page : 524 pages
File Size : 48,9 Mb
Release : 2006
Category : Technology & Engineering
ISBN : 1615030891
Author : Anonim
Publisher : ASM International
Page : 487 pages
File Size : 45,5 Mb
Release : 2010-01-01
Category : Technology & Engineering
ISBN : 9781615037278
Author : Anonim
Publisher : Unknown
Page : 620 pages
File Size : 55,9 Mb
Release : 2012
Category : Electronic apparatus and appliances
ISBN : 1680155121
Author : ASM International
Publisher : ASM International
Page : 453 pages
File Size : 49,5 Mb
Release : 1998-01-01
Category : Technology & Engineering
ISBN : 9781615030767
Author : ASM International
Publisher : ASM International(OH)
Page : 523 pages
File Size : 43,9 Mb
Release : 2005
Category : Science
ISBN : 087170823X
Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 45,8 Mb
Release : 2003
Category : Electronic apparatus and appliances
ISBN : OCLC:55939095
Contains complete text of the conference proceedings.
