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Author : ASM International
Publisher : ASM International
Page : 551 pages
File Size : 54,6 Mb
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 9781615030910
Author : ASM International
Publisher : ASM International(OH)
Page : 528 pages
File Size : 52,7 Mb
Release : 2008-01-01
Category : Electronic apparatus and appliances
ISBN : 0871707144
Author : Anonim
Publisher : ASM International
Page : 128 pages
File Size : 40,7 Mb
Release : 2018-12-01
Category : Electronic
ISBN : 9781627080996
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
Author : Anonim
Publisher : ASM International
Page : 562 pages
File Size : 53,7 Mb
Release : 2014-11-01
Category : Electronic apparatus and appliances
ISBN : 9781627080743
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Exploring the Many Facets of Failure Analysis.
Author : ASM International
Publisher : ASM International
Page : 456 pages
File Size : 41,8 Mb
Release : 2001-01-01
Category : Technology & Engineering
ISBN : 9781615030859
Author : Anonim
Publisher : ASM International
Page : 128 pages
File Size : 49,9 Mb
Release : 2017-12-01
Category : Technology & Engineering
ISBN : 9781627081511
The theme for the November 2017 conference was Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Author : ASM International
Publisher : ASM International
Page : 524 pages
File Size : 44,7 Mb
Release : 2005-01-01
Category : Technology & Engineering
ISBN : 9781615030880
Author : Anonim
Publisher : ASM International
Page : 487 pages
File Size : 53,8 Mb
Release : 2010-01-01
Category : Technology & Engineering
ISBN : 9781615037278
Author : Grace M. Davidson,ASM International
Publisher : ASM International
Page : 310 pages
File Size : 42,9 Mb
Release : 1997-01-01
Category : Technology & Engineering
ISBN : 9781615030828
Author : A. S. M. International
Publisher : ASM International
Page : 634 pages
File Size : 47,5 Mb
Release : 2013-01-01
Category : Technology & Engineering
ISBN : 9781627080224
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
Author : Anonim
Publisher : ASM International
Page : 371 pages
File Size : 45,9 Mb
Release : 2009-01-01
Category : Technology & Engineering
ISBN : 9781615030927
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Author : Anonim
Publisher : Unknown
Page : 556 pages
File Size : 55,7 Mb
Release : 2005
Category : Electronic apparatus and appliances
ISBN : UOM:39015062539302
Author : Anonim
Publisher : Unknown
Page : 633 pages
File Size : 46,9 Mb
Release : 2013
Category : Electronic apparatus and appliances
ISBN : 168015513X
Author : ASM International,Electronic Device Failure Analysis Society
Publisher : Unknown
Page : 524 pages
File Size : 51,6 Mb
Release : 2006
Category : Technology & Engineering
ISBN : 1615030891
Author : ASM International
Publisher : ASM International(OH)
Page : 523 pages
File Size : 44,5 Mb
Release : 2005
Category : Science
ISBN : 087170823X
