Principles Of Materials Characterization And Metrology
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Principles of Materials Characterization and Metrology by Kannan M. Krishnan Pdf
This book provides a comprehensive introduction to the principles of materials characterization and metrology. Based on several decades of teaching experience, it includes many worked examples, questions and exercises, suitable for students at the undergraduate or beginning graduate level.
Principles of Materials Characterization and Metrology by Kannan M. Krishnan Pdf
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.
Advanced Materials Characterization by Ch Sateesh Kumar,M. Muralidhar Singh,Ram Krishna Pdf
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
Materials Characterization Using Nondestructive Evaluation (NDE) Methods by Gerhard Huebschen,Iris Altpeter,Ralf Tschuncky,Hans-Georg Herrmann Pdf
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials
Materials Characterization by Ramiro Pérez Campos,Antonio Contreras Cuevas,Rodrigo Esparza Muñoz Pdf
This book covers novel research results for process and techniques of materials characterization for a wide range of materials. The authors provide a comprehensive overview of the aspects of structural and chemical characterization of these materials. The articles contained in this book covers state of the art and experimental techniques commonly used in modern materials characterization. The book includes theoretical models and numerous illustrations of structural and chemical characterization properties.
Characterization, Testing, Measurement, and Metrology by Chander Prakash,Sunpreet Singh,J. Paulo Davim Pdf
This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years. The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems. The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.
Springer Handbook of Materials Measurement Methods by Horst Czichos,Tetsuya Saito,Leslie E. Smith Pdf
This Handbook compiles advanced methods for materials measurement and characterization from the macroscopic to the nano-scale. Materials professionals need not only handbooks of materials data but clear guidelines and standards for how to measure the full spectrum of materials characteristics of new materials ans systems. Since materials science forms a bridge between the more traditonal fields of physics, engineering, and chemistry, unifying the varying perspectives and covering the full gamut of properties also serves a useful purpose. This handbook is the first dedicated to these practical and important considerations.
Handbook of Metrology and Applications by Dinesh K. Aswal,Sanjay Yadav,Toshiyuki Takatsuji,Prem Rachakonda,Harish Kumar Pdf
This handbook provides comprehensive and up-to-date information on the topic of scientific, industrial and legal metrology. It discusses the state-of-art review of various metrological aspects pertaining to redefinition of SI Units and their implications, applications of time and frequency metrology, certified reference materials, industrial metrology, industry 4.0, metrology in additive manufacturing, digital transformations in metrology, soft metrology and cyber security, optics in metrology, nano-metrology, metrology for advanced communication, environmental metrology, metrology in biomedical engineering, legal metrology and global trade, ionizing radiation metrology, advanced techniques in evaluation of measurement uncertainty, etc. The book has contributed chapters from world’s leading metrologists and experts on the diversified metrological theme. The internationally recognized team of editors adopt a consistent and systematic approach and writing style, including ample cross reference among topics, offering readers a user-friendly knowledgebase greater than the sum of its parts, perfect for frequent consultation. Moreover, the content of this volume is highly interdisciplinary in nature, with insights from not only metrology but also mechanical/material science, optics, physics, chemistry, biomedical and more. This handbook is ideal for academic and professional readers in the traditional and emerging areas of metrology and related fields.
Springer Handbook of Metrology and Testing by Horst Czichos,Tetsuya Saito,Leslie E. Smith Pdf
This Springer Handbook of Metrology and Testing presents the principles of Metrology – the science of measurement – and the methods and techniques of Testing – determining the characteristics of a given product – as they apply to chemical and microstructural analysis, and to the measurement and testing of materials properties and performance, including modelling and simulation. The principal motivation for this Handbook stems from the increasing demands of technology for measurement results that can be used globally. Measurements within a local laboratory or manufacturing facility must be able to be reproduced accurately anywhere in the world. The book integrates knowledge from basic sciences and engineering disciplines, compiled by experts from internationally known metrology and testing institutions, and academe, as well as from industry, and conformity-assessment and accreditation bodies. The Commission of the European Union has expressed this as there is no science without measurements, no quality without testing, and no global markets without standards.
Encyclopedia of Materials Characterization by Charles A. Evans Pdf
"This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series."--Knovel.
Metrology and Standardization for Nanotechnology by Elisabeth Mansfield,Debra L. Kaiser,Daisuke Fujita,Marcel Van de Voorde Pdf
For the promotion of global trading and the reduction of potential risks, the role of international standardization of nanotechnologies has become more and more important. This book gives an overview of the current status of nanotechnology including the importance of metrology and characterization at the nanoscale, international standardization of nanotechnology, and industrial innovation of nano-enabled products. First the field of nanometrology, nanomaterial standardization and nanomaterial innovation is introduced. Second, major concepts in analytical measurements are given in order to provide a basis for the reliable and reproducible characterization of nanomaterials. The role of standards organizations are presented and finally, an overview of risk management and the commercial impact of metrology and standardization for industrial innovations.
X-Ray Metrology in Semiconductor Manufacturing by D. Keith Bowen,Brian K. Tanner Pdf
The scales involved in modern semiconductor manufacturing and microelectronics continue to plunge downward. Effective and accurate characterization of materials with thicknesses below a few nanometers can be achieved using x-rays. While many books are available on the theory behind x-ray metrology (XRM), X-Ray Metrology in Semiconductor Manufacturing is the first book to focus on the practical aspects of the technology and its application in device fabrication and solving new materials problems. Following a general overview of the field, the first section of the book is organized by application and outlines the techniques that are best suited to each. The next section delves into the techniques and theory behind the applications, such as specular x-ray reflectivity, diffraction imaging, and defect mapping. Finally, the third section provides technological details of each technique, answering questions commonly encountered in practice. The authors supply real examples from the semiconductor and magnetic recording industries as well as more than 150 clearly drawn figures to illustrate the discussion. They also summarize the principles and key information about each method with inset boxes found throughout the text. Written by world leaders in the field, X-Ray Metrology in Semiconductor Manufacturing provides real solutions with a focus on accuracy, repeatability, and throughput.
Concise Encyclopedia of Materials Characterization by R.W. Cahn,E.M. Lifshitz Pdf
To use materials effectively, their composition, degree of perfection, physical and mechanical characteristics, and microstructure must be accurately determined. This concise encyclopledia covers the wide range of characterization techniques necessary to achieve this. Articles included are not only concerned with the characterization techniques of specific materials such as polymers, metals, ceramics and semiconductors but also techniques which can be applied to materials in general. The techniques described cover bulk methods, and also a number of specific methods to study the topography and composition of surface and near-surface regions. These techniques range from the well-established and traditional to the very latest including: atomic force microscopy; confocal optical microscopy; gamma ray diffractometry; thermal wave imaging; x-ray diffraction and time-resolved techniques. This unique concise encyclopedia comprises 116 articles by leading experts in the field from around the world to create the ideal guide for materials scientists, chemists and engineers involved with any aspect of materials characterization. With over 540 illustrations, extensive cross-referencing, approximately 900 references, and a detailed index, this concise encyclopedia will be a valuable asset to any materials science collection.
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
