Quantitative Atomic Resolution Electron Microscopy

Author : Anonim
Publisher : Academic Press
Page : 296 pages
File Size : 48,8 Mb
Release : 2021-03-31
Category : Technology & Engineering
ISBN : 9780323850933

Get Book

Quantitative Atomic-Resolution Electron Microscopy by Anonim Pdf

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. Contains contributions from leading authorities on the subject matter Informs and updates on the latest developments in the field of imaging and electron physics Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

Author : Wilhelmus J. de Ruijter
Publisher : Unknown
Page : 167 pages
File Size : 45,6 Mb
Release : 1992
Category : High resolution electron microscopy
ISBN : 9062757529

Get Book

Quantitative high-resolution electron microscopy and holography by Wilhelmus J. de Ruijter Pdf

Author : J. N. Chapman,A. J. Craven
Publisher : CRC Press
Page : 472 pages
File Size : 46,9 Mb
Release : 1984
Category : Design
ISBN : UCAL:B4455305

Get Book

Quantitative Electron Microscopy, by J. N. Chapman,A. J. Craven Pdf

Author : Victor D. Scott,Glyn Love
Publisher : Unknown
Page : 356 pages
File Size : 45,7 Mb
Release : 1983
Category : Analytical chemistry
ISBN : UCAL:B4477134

Get Book

Quantitative Electron-probe Microanalysis by Victor D. Scott,Glyn Love Pdf

Author : Stephen J. Pennycook,Peter D. Nellist
Publisher : Springer Science & Business Media
Page : 764 pages
File Size : 40,7 Mb
Release : 2011-03-24
Category : Technology & Engineering
ISBN : 9781441972002

Get Book

Scanning Transmission Electron Microscopy by Stephen J. Pennycook,Peter D. Nellist Pdf

Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Author : Daisuke Shindo,Hiraga Kenji
Publisher : Springer Science & Business Media
Page : 196 pages
File Size : 49,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9784431684220

Get Book

High-Resolution Electron Microscopy for Materials Science by Daisuke Shindo,Hiraga Kenji Pdf

High-resolution electron microscopy (HREM) has become a most powerful method for investigating the internal structure of materials on an atomic scale of around 0.1 nm. The authors clearly explain both the theory and practice of HREM for materials science. In addition to a fundamental formulation of the imaging process of HREM, there is detailed explanation of image simulationindispensable for interpretation of high-resolution images. Essential information on appropriate imaging conditions for observing lattice images and structure images is presented, and methods for extracting structural information from these observations are clearly shown, including examples in advanced materials. Dislocations, interfaces, and surfaces are dealt with, and materials such as composite ceramics, high-Tc superconductors, and quasicrystals are also considered. Included are sections on the latest instruments and techniques, such as the imaging plate and quantitative HREM.

Author : A.G Fitzgerald
Publisher : Routledge
Page : 493 pages
File Size : 49,8 Mb
Release : 2017-07-12
Category : Science
ISBN : 9781351420532

Get Book

Quantitative Microbeam Analysis by A.G Fitzgerald Pdf

Quantitative Microbeam Analysis provides a comprehensive introduction to the field of quantitative microbeam analysis (MQA). MQA is a technique used to analyze subatomic quantities of materials blasted from a surface by a laser or particle beam, providing information on the structure and composition of the material. Contributed to by international experts, the book is unique in the breadth of microbeam analytical techniques covered. For each technique, it develops the theoretical background, discusses practical details relating to choice of equipment, and describes the current advances. The book highlights developments relating to Auger electron spectroscopy in scanning electron microscopes and transmission electron microscopes and advances in surface analytical imaging and accelerated ion beam-surface interactions.

Author : John C. H. Spence
Publisher : OUP Oxford
Page : 440 pages
File Size : 42,5 Mb
Release : 2013-09-12
Category : Science
ISBN : 9780191508400

Get Book

High-Resolution Electron Microscopy by John C. H. Spence Pdf

This new fourth edition of the standard text on atomic-resolution transmission electron microscopy (TEM) retains previous material on the fundamentals of electron optics and aberration correction, linear imaging theory (including wave aberrations to fifth order) with partial coherence, and multiple-scattering theory. Also preserved are updated earlier sections on practical methods, with detailed step-by-step accounts of the procedures needed to obtain the highest quality images of atoms and molecules using a modern TEM or STEM electron microscope. Applications sections have been updated - these include the semiconductor industry, superconductor research, solid state chemistry and nanoscience, and metallurgy, mineralogy, condensed matter physics, materials science and material on cryo-electron microscopy for structural biology. New or expanded sections have been added on electron holography, aberration correction, field-emission guns, imaging filters, super-resolution methods, Ptychography, Ronchigrams, tomography, image quantification and simulation, radiation damage, the measurement of electron-optical parameters, and detectors (CCD cameras, Image plates and direct-injection solid state detectors). The theory of Scanning transmission electron microscopy (STEM) and Z-contrast are treated comprehensively. Chapters are devoted to associated techniques, such as energy-loss spectroscopy, Alchemi, nanodiffraction, environmental TEM, twisty beams for magnetic imaging, and cathodoluminescence. Sources of software for image interpretation and electron-optical design are given.

Author : Peter W. Hawkes,Erwin Kasper
Publisher : Academic Press
Page : 562 pages
File Size : 46,9 Mb
Release : 2022-02-21
Category : Technology & Engineering
ISBN : 9780128189801

Get Book

Principles of Electron Optics, Volume 3 by Peter W. Hawkes,Erwin Kasper Pdf

Principles of Electron Optic: Volume Three: Wave Optics, discusses this essential topic in microscopy to help readers understand the propagation of electrons from the source to the specimen, and through the latter (and from it) to the image plane of the instrument. In addition, it also explains interference phenomena, notably holography, and informal coherence theory. This third volume accompanies volumes one and two that cover new content on holography and interference, improved and new modes of image formation, aberration corrected imaging, simulation, and measurement, 3D-reconstruction, and more. The study of such beams forms the subject of electron optics, which divides naturally into geometrical optics where effects due to wavelength are neglected, with wave optics considered. Includes authoritative coverage of the fundamental theory behind electron beams Describes the interaction of electrons with solids and the information that can be obtained from electron-beam techniques Addresses recent, relevant research topics, including new content on holography and interference, new modes of image formation, 3D reconstruction and aberration corrected imaging, simulation and measurement

Author : Peter W. Hawkes
Publisher : Elsevier
Page : 333 pages
File Size : 47,8 Mb
Release : 2004-05-26
Category : Science
ISBN : 9780080493268

Get Book

Advances in Imaging and Electron Physics by Peter W. Hawkes Pdf

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it's application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material

Author : David J. Smith
Publisher : Unknown
Page : 302 pages
File Size : 42,5 Mb
Release : 1997-09-05
Category : Science
ISBN : UOM:39015041312409

Get Book

Atomic Resolution Microscopy of Surfaces and Interfaces: Volume 466 by David J. Smith Pdf

There has been a considerable expansion in the breadth and depth of studies involving scanning tunneling microscopy and high-resolution electron microscopy. The purpose of this book is to highlight recent developments and applications of atomic-resolution imaging methods to surfaces and bulk defects. Papers from a range of scientific and engineering disciplines are presented. Recent advances in imaging techniques, including quantitative image matching, are emphasized. Applications to ceramics, intermetallics and semiconductor surface reconstructions are also featured.

Author : John C. H. Spence
Publisher : Oxford University Press
Page : 425 pages
File Size : 53,8 Mb
Release : 2009
Category : Science
ISBN : 9780199552757

Get Book

High-Resolution Electron Microscopy by John C. H. Spence Pdf

This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added.

Author : Peter W. Hawkes,John C.H. Spence
Publisher : Springer Nature
Page : 1561 pages
File Size : 51,5 Mb
Release : 2019-11-02
Category : Technology & Engineering
ISBN : 9783030000691

Get Book

Springer Handbook of Microscopy by Peter W. Hawkes,John C.H. Spence Pdf

This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.

Author : Rajiv Kohli,Kashmiri L. Mittal
Publisher : Elsevier
Page : 336 pages
File Size : 40,9 Mb
Release : 2021-10-21
Category : Technology & Engineering
ISBN : 9780128222171

Get Book

Surfactants in Precision Cleaning by Rajiv Kohli,Kashmiri L. Mittal Pdf

Surfactants in Precision Cleaning: Removal of Contaminants at the Micro and Nanoscale is a single source of information on surfactants, emulsions, microemulsions and detergents for removal of surface contaminants at the micro and nanoscale. The topics covered include cleaning mechanisms, effect of surfactants, types of stable dispersions (emulsions, microemulsions, surfactants, detergents, etc.), cleaning technology, and cleaning applications. Users will find this volume an excellent resource on the use of stable dispersions in precision cleaning. Single source of current information on surfactants, emulsions, microemulsions and detergents for precision cleaning applications Includes a list of extensive reference sources Discusses specific selection and properties of surfactants and their use in cleaning Provides a guide for cleaning applications in different industry sectors

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
Page : 598 pages
File Size : 40,7 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461344223

Get Book

Practical Scanning Electron Microscopy by Joseph Goldstein Pdf

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.