The Electron Microprobe

Author : S. J. B. Reed
Publisher : Cambridge University Press
Page : 232 pages
File Size : 44,7 Mb
Release : 2005-08-25
Category : Science
ISBN : 9781139446389

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Electron Microprobe Analysis and Scanning Electron Microscopy in Geology by S. J. B. Reed Pdf

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Author : Theodore David McKinley,Kurt F. J. Heinrich,D. B. Wittry,David Beryle Wittry
Publisher : Unknown
Page : 1052 pages
File Size : 46,5 Mb
Release : 1966
Category : Technology & Engineering
ISBN : MINN:31951000009670N

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The Electron Microprobe by Theodore David McKinley,Kurt F. J. Heinrich,D. B. Wittry,David Beryle Wittry Pdf

Author : Joseph Goldstein
Publisher : Springer Science & Business Media
Page : 598 pages
File Size : 55,9 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461344223

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Practical Scanning Electron Microscopy by Joseph Goldstein Pdf

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Author : S. J. B. Reed
Publisher : Unknown
Page : 366 pages
File Size : 41,9 Mb
Release : 1993-01-28
Category : Science
ISBN : UCAL:B4477136

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Electron Microprobe Analysis by S. J. B. Reed Pdf

1993 paperback of successful physics monograph on electron microprobe analysis, a widely used technique.

Author : K.F.J. Heinrich,D. Newbury
Publisher : Springer Science & Business Media
Page : 397 pages
File Size : 48,5 Mb
Release : 2013-06-29
Category : Science
ISBN : 9781489926173

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Electron Probe Quantitation by K.F.J. Heinrich,D. Newbury Pdf

In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted.

Author : Electrochemical Society. Electrothermics and Metallurgy Division
Publisher : Unknown
Page : 1035 pages
File Size : 45,5 Mb
Release : 1966
Category : Electron probe microanalysis
ISBN : 0471584606

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The Electron Microprobe by Electrochemical Society. Electrothermics and Metallurgy Division Pdf

Author : Roger Theisen
Publisher : Springer Science & Business Media
Page : 173 pages
File Size : 55,8 Mb
Release : 2013-11-11
Category : Technology & Engineering
ISBN : 9783662251065

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Quantitative Electron Microprobe Analysis by Roger Theisen Pdf

Author : L. S. Birks
Publisher : Krieger Publishing Company
Page : 212 pages
File Size : 40,7 Mb
Release : 1979
Category : Science
ISBN : 0882759523

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Electron Probe Microanalysis by L. S. Birks Pdf

Author : A. J. Tousimis,L. Marton
Publisher : Elsevier
Page : 463 pages
File Size : 55,6 Mb
Release : 2013-11-06
Category : Science
ISBN : 9781483284637

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Electron Probe Microanalysis by A. J. Tousimis,L. Marton Pdf

Electron Probe Microanalysis presents a collection of reviews on various aspects of electron probe microanalysis. This book discusses the model for quantitative electron probe analysis. Organized into 14 chapters, this book begins with an overview of the various kinds of microanalysis followed by a discussion of the advantages that can be derived from using the electron probe method. This text then examines the various applications of backscattered electron and specimen current methods for quantitative analysis. Other chapters consider the fundamental concepts for quantitative electron probe microanalysis utilizing pure elements as standards. This book discusses as well the absolute method of quantitative chemical analysis by emission X-ray spectroscopy. The final chapter deals with the main advantage of the Kossel technique in the study of the thermodynamic and mechanical characteristics of crystals. This book is a valuable resource for scientists and research workers. Non-specialists who need information on this excellent analytical tool will also find this book useful.

Author : S. J. B. Reed
Publisher : Cambridge University Press
Page : 350 pages
File Size : 52,7 Mb
Release : 1997-07-10
Category : Science
ISBN : 052159944X

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Electron Microprobe Analysis by S. J. B. Reed Pdf

This 1993 book gives a comprehensive account of both experimental and theoretical aspects of electron microprobe analysis, and is an extensively updated version of the seminal first edition, published in 1975. The design and operation of the instrument, including the electron column and both wavelength- and energy-dispersive X-ray spectrometers, are covered in the first part of the book. Experimental procedures for qualitative and quantitative analysis, using both types of spectrometer, are then discussed. Matrix ('ZAF') corrections, as required for quantitative analysis, are treated in some detail from both theoretical and practical viewpoints. Special considerations applying to the analysis of 'light' elements (atomic number below 10) are covered in a separate chapter. The emphasis throughout is on a sound understanding of principles and the treatment is applicable equally to the electron microprobe in its 'classical' form and to scanning electron microscopes fitted with X-ray spectrometers.

Author : Anonim
Publisher : Unknown
Page : 76 pages
File Size : 52,7 Mb
Release : 1964
Category : Analytical chemistry
ISBN : UOM:39015086460121

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Applications of the Electron Microprobe to Chemical Analysis by Anonim Pdf

Author : Philip J. Potts,J.F. Bowles,Stephen.J. Reed,R. Cave
Publisher : Springer Science & Business Media
Page : 430 pages
File Size : 48,7 Mb
Release : 2012-12-06
Category : Science
ISBN : 9781461520535

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Microprobe Techniques in the Earth Sciences by Philip J. Potts,J.F. Bowles,Stephen.J. Reed,R. Cave Pdf

30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.

Author : Peter W. Hawkes
Publisher : Academic Press
Page : 654 pages
File Size : 46,8 Mb
Release : 2013-11-06
Category : Science
ISBN : 9781483284651

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The Beginnings of Electron Microscopy by Peter W. Hawkes Pdf

The Beginnings of Electron Microscopy presents the technical development of electron microscope. This book examines the mechanical as well as the technical problems arising from the physical properties of the electron. Organized into 19 chapters, this book begins with an overview of the history of scanning electron microscopy and electron beam microanalysis. This text then explains the applications and capabilities of electron microscopes during the war. Other chapters consider the classical techniques of light microscopy. This book presents as well the schematic outline of the preparation techniques for investigation of nerve cells by electron microscopy. The final chapter deals with the historical account of the beginnings of electron microscopy in Russia. This book is a valuable resource for scientists, technologists, physicists, electrical engineers, designers, and technicians. Graduate students as well as researcher workers who are interested in the history of electron microscopy will also find this book extremely useful.

Author : Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin
Publisher : Springer Science & Business Media
Page : 679 pages
File Size : 40,8 Mb
Release : 2013-11-11
Category : Science
ISBN : 9781461332732

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Scanning Electron Microscopy and X-Ray Microanalysis by Joseph Goldstein,Dale E. Newbury,Patrick Echlin,David C. Joy,Charles Fiori,Eric Lifshin Pdf

This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The material has been chosen to provide a student with a general introduction to the techniques of scanning electron microscopy and x-ray microanalysis suitable for application in such fields as biology, geology, solid state physics, and materials science. Following the format of PSEM, this book gives the student a basic knowledge of (1) the user-controlled functions of the electron optics of the scanning electron microscope and electron microprobe, (2) the characteristics of electron-beam-sample inter actions, (3) image formation and interpretation, (4) x-ray spectrometry, and (5) quantitative x-ray microanalysis. Each of these topics has been updated and in most cases expanded over the material presented in PSEM in order to give the reader sufficient coverage to understand these topics and apply the information in the laboratory. Throughout the text, we have attempted to emphasize practical aspects of the techniques, describing those instru ment parameters which the microscopist can and must manipulate to obtain optimum information from the specimen. Certain areas in particular have been expanded in response to their increasing importance in the SEM field. Thus energy-dispersive x-ray spectrometry, which has undergone a tremendous surge in growth, is treated in substantial detail.

Author : Stephen Jervis Brent Reed
Publisher : Unknown
Page : 0 pages
File Size : 54,9 Mb
Release : 1993
Category : Electronic
ISBN : OCLC:59957223

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Electron Microprobe Analysis by Stephen Jervis Brent Reed Pdf