The Practice Of Tof Sims

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The Practice of TOF-SIMS

Author : Alan M. Spool
Publisher : Momentum Press
Page : 181 pages
File Size : 48,8 Mb
Release : 2016-03-24
Category : Technology & Engineering
ISBN : 9781606507742

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The Practice of TOF-SIMS by Alan M. Spool Pdf

Time of flight secondary ion mass spectrometry, TOF-SIMS, is a highly surface sensitive analytical technique that provides information about composition with submicron lateral resolution. For select materials, TOF-SIMS provides unparalleled sensitivity along with excellent reproducibility, and as a mass spectrometric technique, it also provides excellent specificity. Of the analytical methods available, it is among the most surface sensitive, but the physical principles that underlie it are also the least understood. This volume describes the instrumentation, the physical principles behind the technique to the extent they are understood, and provides a practical approach for the interpretation of TOF-SIMS data. The use of advanced data processing methods such as multivariate statistics are described in a readily approachable manner. Given a basic background in undergraduate chemistry and physics, the book will be of use to any student with an interest in the technique.

ToF-SIMS

Author : J. C. Vickerman,David Briggs
Publisher : IM Publications
Page : 742 pages
File Size : 55,7 Mb
Release : 2013
Category : Mass spectrometry
ISBN : 9781906715175

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ToF-SIMS by J. C. Vickerman,David Briggs Pdf

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. This is the Second Edition of the first book ToF-SIMS: Surface analysis by Mass Spectrometry to be dedicated to the subject and the treatment is comprehensive

Handbook of Adhesion Technology

Author : Lucas F. M. da Silva,Andreas Öchsner,Robert D. Adams
Publisher : Springer Science & Business Media
Page : 1569 pages
File Size : 48,8 Mb
Release : 2011-06-10
Category : Technology & Engineering
ISBN : 9783642011689

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Handbook of Adhesion Technology by Lucas F. M. da Silva,Andreas Öchsner,Robert D. Adams Pdf

Adhesives have been used for thousands of years, but until 100 years ago, the vast majority was from natural products such as bones, skins, fish, milk, and plants. Since about 1900, adhesives based on synthetic polymers have been introduced, and today, there are many industrial uses of adhesives and sealants. It is difficult to imagine a product—in the home, in industry, in transportation, or anywhere else for that matter—that does not use adhesives or sealants in some manner. The Handbook of Adhesion Technology is intended to be the definitive reference in the field of adhesion. Essential information is provided for all those concerned with the adhesion phenomenon. Adhesion is a phenomenon of interest in diverse scientific disciplines and of importance in a wide range of technologies. Therefore, this handbook includes the background science (physics, chemistry and materials science), engineering aspects of adhesion and industry specific applications. It is arranged in a user-friendly format with ten main sections: theory of adhesion, surface treatments, adhesive and sealant materials, testing of adhesive properties, joint design, durability, manufacture, quality control, applications and emerging areas. Each section contains about five chapters written by internationally renowned authors who are authorities in their fields. This book is intended to be a reference for people needing a quick, but authoritative, description of topics in the field of adhesion and the practical use of adhesives and sealants. Scientists and engineers of many different backgrounds who need to have an understanding of various aspects of adhesion technology will find it highly valuable. These will include those working in research or design, as well as others involved with marketing services. Graduate students in materials, processes and manufacturing will also want to consult it.

Raman Spectroscopy, Volume I

Author : Günter G. Hoffmann
Publisher : Momentum Press
Page : 260 pages
File Size : 44,8 Mb
Release : 2019-01-16
Category : Science
ISBN : 9781945612015

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Raman Spectroscopy, Volume I by Günter G. Hoffmann Pdf

The book provides an up-to-date overview of the fast growing area of Raman spectroscopy. The two-volume work describes how analytic methods using Raman spectroscopy allow for the chemical analysis of materials, providing even spatial resolution without precedent. In addition, external perturbations (strain, temperature, pressure) on molecules and their alignment can be analyzed. Raman spectroscopy can also provide information about the interactions of components, again at a high level of spatial resolution. In the form of tip-enhanced Raman spectroscopy (TERS), the method is a valuable tool for nanotechnology. This book is intended for researchers or lecturers in chemistry and materials science, who are interested in the composition and properties of their samples. It describes how Raman spectroscopy will enable them to examine thin layers, surfaces, and interfaces and improve their knowledge about the properties of composites. In addition, it can serve as a short introduction to vibrational spectroscopy.

A Systems Approach to Modeling the Water-Energy-Land-Food Nexus, Volume I

Author : Bernard Amadei
Publisher : Momentum Press
Page : 220 pages
File Size : 48,5 Mb
Release : 2019-01-29
Category : Architecture
ISBN : 9781947083530

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A Systems Approach to Modeling the Water-Energy-Land-Food Nexus, Volume I by Bernard Amadei Pdf

This two-volume set describes a flexible and adaptive system-based methodology and associated guidelines for the management and allocation of community-based WELF resources. Over the next 50 years, rapid population, urbanization, and economic growth worldwide will create unprecedented demands for water, energy, land, and food (WELF) resources. The discussion on how to meet human needs for WELF resources and how to guarantee their respective securities has changed over time from looking at all four sectors in isolation to understanding their interdependency through the so-called WELF nexus. The approach presented in this book responds to the overall agreement in the WELF nexus literature that the management and allocation of WELF resources at the community level need to be examined in a more systemic, multidisciplinary, participatory, and practical manner while seeking to increase synergies and reduce trade-offs. This book was written to explore the value proposition of that approach. Volume 1 focuses on defining the landscape in which the nexus operates and outlines the proposed methodology. Volume 2 explores the quantitative and qualitative modeling of the nexus and landscape using system modeling tools including system dynamics. It presents a road map for the formulation, simulation, selection, and ranking of possible intervention plans. The proposed methodology is designed to serve as a guide for different groups involved in the science and policy decision aspects of the WELF nexus within the context of community development. The methodology focuses mostly on WELF-related issues in small-scale and low-income communities where securing resources is critical to their short- and long-term livelihood and development.

Principles of Materials Characterization and Metrology

Author : Kannan M. Krishnan
Publisher : Oxford University Press
Page : 869 pages
File Size : 48,5 Mb
Release : 2021
Category : Science
ISBN : 9780198830252

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Principles of Materials Characterization and Metrology by Kannan M. Krishnan Pdf

Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.

Handbook of Semiconductor Manufacturing Technology

Author : Yoshio Nishi,Robert Doering
Publisher : CRC Press
Page : 1720 pages
File Size : 53,5 Mb
Release : 2017-12-19
Category : Technology & Engineering
ISBN : 9781420017663

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Handbook of Semiconductor Manufacturing Technology by Yoshio Nishi,Robert Doering Pdf

Retaining the comprehensive and in-depth approach that cemented the bestselling first edition's place as a standard reference in the field, the Handbook of Semiconductor Manufacturing Technology, Second Edition features new and updated material that keeps it at the vanguard of today's most dynamic and rapidly growing field. Iconic experts Robert Doering and Yoshio Nishi have again assembled a team of the world's leading specialists in every area of semiconductor manufacturing to provide the most reliable, authoritative, and industry-leading information available. Stay Current with the Latest Technologies In addition to updates to nearly every existing chapter, this edition features five entirely new contributions on... Silicon-on-insulator (SOI) materials and devices Supercritical CO2 in semiconductor cleaning Low-κ dielectrics Atomic-layer deposition Damascene copper electroplating Effects of terrestrial radiation on integrated circuits (ICs) Reflecting rapid progress in many areas, several chapters were heavily revised and updated, and in some cases, rewritten to reflect rapid advances in such areas as interconnect technologies, gate dielectrics, photomask fabrication, IC packaging, and 300 mm wafer fabrication. While no book can be up-to-the-minute with the advances in the semiconductor field, the Handbook of Semiconductor Manufacturing Technology keeps the most important data, methods, tools, and techniques close at hand.

Characterization of Nanomaterials

Author : Ehrenfried Zschech,Robert Sinclair,Rodrigo Martins,Marco Sebastiani,Sabrina Sartori
Publisher : MDPI
Page : 140 pages
File Size : 55,6 Mb
Release : 2021-09-01
Category : Science
ISBN : 9783036507569

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Characterization of Nanomaterials by Ehrenfried Zschech,Robert Sinclair,Rodrigo Martins,Marco Sebastiani,Sabrina Sartori Pdf

This Special Issue “Characterization of Nanomaterials” collects nine selected papers presented at the 6th Dresden Nanoanalysis Symposium, held at Fraunhofer Institute for Ceramic Technologies and Systems in Dresden, Germany, on 31 August 2018. Following the specific motto of this annual symposium “Materials challenges—Micro- and nanoscale characterization”, it covered various topics of nanoscale materials characterization along the whole value and innovation chain, from fundamental research up to industrial applications. The scope of this Special Issue is to provide an overview of the current status, recent developments and research activities in the field of nanoscale materials characterization, with a particular emphasis on future scenarios. Primarily, analytical techniques for the characterization of thin films and nanostructures are discussed, including modeling and simulation. We anticipate that this Special Issue will be accessible to a wide audience, as it explores not only methodical aspects of nanoscale materials characterization, but also materials synthesis, fabrication of devices and applications.

Water Worlds in the Solar System

Author : Antony Joseph
Publisher : Elsevier
Page : 846 pages
File Size : 52,9 Mb
Release : 2022-11-25
Category : Science
ISBN : 9780323957182

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Water Worlds in the Solar System by Antony Joseph Pdf

Water Worlds in the Solar System: In Search of Habitable Environments and Life is a comprehensive reference on the formation, availability, habitability potential, and astrobiological implications of water in the Solar System. The book provides understanding of the importance of water on Earth to elucidate potential water and biosignature sources on other bodies in the Solar System. It covers processes involved in the formation of Earth and its Moon, genesis of water on those bodies, events on early Earth, and other processes that are applicable to celestial bodies in the Solar System, directly correlating data available on water on other bodies to over 15 Earth analogue sites. This book forms a comprehensive overview on water in the Solar System, from formation to biosignature and habitability considerations. It is ideal for academics, researchers and students working in the field of planetary science, extraterrestrial water research and habitability potential. Presents a comprehensive reference on water in the Solar System, developing readers’ understanding of the importance and occurrence of water on Earth and beyond, all from an oceanographer’s perspective Contrasts terrestrial analogues in relation to their roles in understanding and exploring ocean worlds and habitability Includes numerous figures, illustrations, tables and videos to help readers better understand concepts covered

Plastics Additives

Author : J.C.J. Bart
Publisher : IOS Press
Page : 824 pages
File Size : 42,6 Mb
Release : 2006-03-15
Category : Science
ISBN : 9781607501220

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Plastics Additives by J.C.J. Bart Pdf

"Cover-to-cover reading of Plastics Additives, Advanced Industrial Analysis, is recommended for both professional analysts and plastics technologists. Professor Bart’s prose style is easy to read. A professional background in analytical chemistry is not assumed. Particularly valuable is the trove of good advice as to which approach might be best in a given situation. Every department with a serious interest in additive / property relations should invest in a copy.” -- PMAD Newsletter. This industrially relevant and up-to-date resource deals with all established and emerging analytical methods for in-polymer additive analysis of plastics formulations. Quality assurance and industrial troubleshooting all benefit from direct analysis modes. Plastics Additives comprises detailed coverage of solid-state spectroscopy, thermal analysis and pyrolysis, laser techniques, surface studies and microanalysis along with process analytics, quantitative analysis and modern method development and validation applied to additives in polymers. The book is organised for quick and easy reference and is extensively illustrated with over 200 figures, 300 flow diagrams and tables to facilitate rapid understanding of this topic, and it contains 4000 references. Emphasis is on understanding (principles and characteristics) and industrial applicability.

Paint Analysis

Author : Roger Dietrich
Publisher : European Coatings
Page : 280 pages
File Size : 43,5 Mb
Release : 2021-04-12
Category : Science
ISBN : 9783748604259

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Paint Analysis by Roger Dietrich Pdf

The market demands modern, high-performance, flawless paints that possess specified properties. Where deviations from set points occur, the cause must be investigated and the error must be remedied. What "standard methods" don't disclose is why a particular coating either meets or fails to meet a requirement. Thus the author presents modern analytical techniques and their applications in the coatings industry that answer further complex questions. The information in this book can be used for performing failure analysis, production control and quality control, and also meet the requirements of modern high-level quality management. An excellent combination of theory and practice for formulators, paint engineers and applied technologists seeking a sound basic introduction to instrumental paint analysis and concrete answers to everyday problems.

Surface Analysis

Author : John C. Vickerman,Ian S. Gilmore
Publisher : John Wiley & Sons
Page : 690 pages
File Size : 55,5 Mb
Release : 2011-08-10
Category : Technology & Engineering
ISBN : 9781119965510

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Surface Analysis by John C. Vickerman,Ian S. Gilmore Pdf

This completely updated and revised second edition of Surface Analysis: The Principal Techniques, deals with the characterisation and understanding of the outer layers of substrates, how they react, look and function which are all of interest to surface scientists. Within this comprehensive text, experts in each analysis area introduce the theory and practice of the principal techniques that have shown themselves to be effective in both basic research and in applied surface analysis. Examples of analysis are provided to facilitate the understanding of this topic and to show readers how they can overcome problems within this area of study.

Solid-Liquid Interfaces

Author : Klaus Wandelt,Stephen Thurgate
Publisher : Springer Science & Business Media
Page : 446 pages
File Size : 50,9 Mb
Release : 2003-07-01
Category : Technology & Engineering
ISBN : 9783540448174

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Solid-Liquid Interfaces by Klaus Wandelt,Stephen Thurgate Pdf

Using combinations of in situ and ex situ experimental methods, fundamental and relevant phenomena such as adsorption and desorption of ions and molecules, restructuring of surfaces, thin film and nanocluster growth, and electrochemical reactions on the micrometer scale are addressed. The overview includes a wide range of experimental techniques and examples of solid-liquid interfaces and aims at stimulating an expansion of this important type of interface science.

Nanoscopic Approaches in Earth and Planetary Sciences

Author : G. Jordan
Publisher : The Mineralogical Society of Great Britain and Ireland
Page : 395 pages
File Size : 48,8 Mb
Release : 2010-08-01
Category : Science
ISBN : 9780903056250

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Nanoscopic Approaches in Earth and Planetary Sciences by G. Jordan Pdf

The properties of matter at extreme length scales can differ markedly from those at length scales accessible to human observation. Nanogeoscience is described here: analytical techniques ranging from atomic force microscopy, nanoscale SIMS, TEM and EELS, to recent developments in nano-scale resolution in synchrotron radiation.

Characterization and Analysis of Polymers

Author : Wiley
Publisher : John Wiley & Sons
Page : 987 pages
File Size : 41,9 Mb
Release : 2008-02-08
Category : Technology & Engineering
ISBN : 9780470233009

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Characterization and Analysis of Polymers by Wiley Pdf

Based on Wiley's renowned Encyclopedia of Polymer Science and Technology, this book provides coverage of key methods of characterization of the physical and chemical properties of polymers, including atomic force microscopy, chromatographic methods, laser light scattering, nuclear magnetic resonance, and thermal analysis, among others. Written by prominent scholars from around the world, this reference presents over twenty-five self -contained articles on the most used analytical techniques currently practiced in polymer science.