X Ray And Neutron Reflectivity Principles And Applications

Author : Jean Daillant,Alain Gibaud
Publisher : Springer
Page : 350 pages
File Size : 55,6 Mb
Release : 2008-11-19
Category : Science
ISBN : 9783540885887

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X-ray and Neutron Reflectivity by Jean Daillant,Alain Gibaud Pdf

ways in which the magnetic interaction between neutrons and magnetic moments can yield information on the magnetization densities of thin ?lms and multilayers. I commend the organizers for having organized a group of expert lecturers to present this subject in a detailed but clear fashion, as the importance of the subject deserves. Argonne, IL S. K. Sinha Contents 1 The Interaction of X-Rays (and Neutrons) with Matter . . . . . . . . . . . . . . 1 F. de Bergevin 1. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1. 2 Generalities and De?nitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 1. 3 From the Scattering by an Object to the Propagation in a Medium . 14 1. 4 X-Rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1. 5 X-Rays: Anisotropic Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1. A Appendix: the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . 54 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 2 Statistical Aspects of Wave Scattering at Rough Surfaces . . . . . . . . . . . . 59 A. Sentenac and J. Daillant 2. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 2. 2 Description of Randomly Rough Surfaces . . . . . . . . . . . . . . . . . . . . . 60 2. 3 Description of a Surface Scattering Experiment, Coherence Domains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2. 4 Statistical Formulation of the Diffraction Problem . . . . . . . . . . . . . . 72 2. 5 Statistical Formulation of the Scattered Intensity Under the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 3 Specular Re?ectivity from Smooth and Rough Surfaces . . . . . . . . . . . . . 85 A. Gibaud and G. Vignaud 3. 1 The Re?ected Intensity from an Ideally Flat Surface . . . . . . . . . . . . 85 3. 2 X-Ray Re?ectivity in Strati?ed Media . . . . . . . . . . . . . . . . . . . . . . . . 98 3. 3 From Dynamical to Kinematical Theory . . . . . . . . . . . . . . . . . . . . . . 107 3. 4 In?uence of the Roughness on the Matrix Coef?cients . . . . . . . . . . 111 3. A Appendix: The Treatment of Roughness in Specular Re?ectivity . . 113 3. B Appendix: Inversion of re?ectivity data . . . . . . . . . . . . . . . . . . . . . . .

Author : Jean Daillant,Alain Gibaud
Publisher : Springer Science & Business Media
Page : 331 pages
File Size : 52,7 Mb
Release : 2003-07-01
Category : Science
ISBN : 9783540486961

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X-Ray and Neutron Reflectivity: Principles and Applications by Jean Daillant,Alain Gibaud Pdf

The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.

Author : Anonim
Publisher : Unknown
Page : 128 pages
File Size : 49,9 Mb
Release : 1994
Category : Electronic
ISBN : OCLC:880037371

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X-ray and Neutron Reflectivity by Anonim Pdf

Author : Jean Daillant,Alain Gibaud
Publisher : Springer Science & Business Media
Page : 360 pages
File Size : 46,6 Mb
Release : 2008-11-21
Category : Science
ISBN : 9783540885870

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X-ray and Neutron Reflectivity by Jean Daillant,Alain Gibaud Pdf

ways in which the magnetic interaction between neutrons and magnetic moments can yield information on the magnetization densities of thin ?lms and multilayers. I commend the organizers for having organized a group of expert lecturers to present this subject in a detailed but clear fashion, as the importance of the subject deserves. Argonne, IL S. K. Sinha Contents 1 The Interaction of X-Rays (and Neutrons) with Matter . . . . . . . . . . . . . . 1 F. de Bergevin 1. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1. 2 Generalities and De?nitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 1. 3 From the Scattering by an Object to the Propagation in a Medium . 14 1. 4 X-Rays . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 1. 5 X-Rays: Anisotropic Scattering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 1. A Appendix: the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . 54 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 2 Statistical Aspects of Wave Scattering at Rough Surfaces . . . . . . . . . . . . 59 A. Sentenac and J. Daillant 2. 1 Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 2. 2 Description of Randomly Rough Surfaces . . . . . . . . . . . . . . . . . . . . . 60 2. 3 Description of a Surface Scattering Experiment, Coherence Domains . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 2. 4 Statistical Formulation of the Diffraction Problem . . . . . . . . . . . . . . 72 2. 5 Statistical Formulation of the Scattered Intensity Under the Born Approximation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79 References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 3 Specular Re?ectivity from Smooth and Rough Surfaces . . . . . . . . . . . . . 85 A. Gibaud and G. Vignaud 3. 1 The Re?ected Intensity from an Ideally Flat Surface . . . . . . . . . . . . 85 3. 2 X-Ray Re?ectivity in Strati?ed Media . . . . . . . . . . . . . . . . . . . . . . . . 98 3. 3 From Dynamical to Kinematical Theory . . . . . . . . . . . . . . . . . . . . . . 107 3. 4 In?uence of the Roughness on the Matrix Coef?cients . . . . . . . . . . 111 3. A Appendix: The Treatment of Roughness in Specular Re?ectivity . . 113 3. B Appendix: Inversion of re?ectivity data . . . . . . . . . . . . . . . . . . . . . . .

Author : Liyuan Liang,Romano Rinaldi,Helmut Schober
Publisher : Springer Science & Business Media
Page : 641 pages
File Size : 51,9 Mb
Release : 2008-12-11
Category : Technology & Engineering
ISBN : 9780387094168

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Neutron Applications in Earth, Energy and Environmental Sciences by Liyuan Liang,Romano Rinaldi,Helmut Schober Pdf

Neutron Applications in Earth, Energy and Environmental Sciences offers a comprehensive overview of the wide ranging applications of neutron scattering techniques to elucidate the fundamental materials properties at the nano-, micro- and meso-scale, which underpin research in the related fields of Earth, Energy and Environmental Sciences. Introductions to neutron scattering fundamentals and instrumentation are paired with a thorough review of the applications to a large variety of scientific and technological problems, written through the direct experience of leading scientists in each field. Tailored to a wide audience, this volume provides the novice with an inspiring introduction and stimulates the expert to consider these non-conventional problem solving techniques in his/her field of interest. Earth and environmental scientists, engineers, researchers and graduate students involved with materials science will find Neutron Applications in Earth, Energy and Environmental Sciences a valuable ready-to-use reference.

Author : Ian W. Hamley
Publisher : John Wiley & Sons
Page : 288 pages
File Size : 40,9 Mb
Release : 2021-05-11
Category : Technology & Engineering
ISBN : 9781119768340

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Small-Angle Scattering by Ian W. Hamley Pdf

SMALL-ANGLE SCATTERING A comprehensive and timely volume covering contemporary research, practical techniques, and theoretical approaches to SAXS and SANS Small-Angle Scattering: Theory, Instrumentation, Data, and Applications provides authoritative coverage of both small-angle X-ray scattering (SAXS), small-angle neutron scattering (SANS) and grazing incidence small-angle scattering (GISAS) including GISAXS and GISANS. This single-volume resource offers readers an up-to-date view of the state of the field, including the theoretical foundations, experimental methods, and practical applications of small-angle scattering (SAS) techniques including laboratory and synchrotron SAXS and reactor/spallation SANS. Organized into six chapters, the text first describes basic theory, instrumentation, and data analysis. The following chapters contain in-depth discussion on various applications of SAXS and SANS and GISAXS and GISANS, and on specific techniques for investigating structure and order in soft materials, biomolecules, and inorganic and magnetic materials. Author Ian Hamley draws from his more than thirty years’ experience working with many systems, instruments, and types of small-angle scattering experiments across most European facilities to present the most complete introduction to the field available. This book: Presents uniquely broad coverage of practical and theoretical approaches to SAXS and SANS Includes practical information on instrumentation and data analysis Offers useful examples and an accessible and concise presentation of topics Covers new developments in the techniques of SAXS and SANS, including GISAXS and GISANS Small-Angle Scattering: Theory, Instrumentation, Data, and Applications is a valuable source of detailed information for researchers and postgraduate students in the field, as well as other researchers using X-ray and neutron scattering to investigate soft materials, other nanostructured materials and biomolecules such as proteins.

Author : Mu-Ping Nieh,Frederick A. Heberle,John Katsaras
Publisher : Walter de Gruyter GmbH & Co KG
Page : 647 pages
File Size : 55,9 Mb
Release : 2019-07-22
Category : Science
ISBN : 9783110544657

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Characterization of Biological Membranes by Mu-Ping Nieh,Frederick A. Heberle,John Katsaras Pdf

The study of membranes has become of high importance in the fields of biology, pharmaceutical chemistry and medicine, since much of what happens in a cell or in a virus involves biological membranes. The current book is an excellent introduction to the area, which explains how modern analytical methods can be applied to study biological membranes and membrane proteins and the bioprocesses they are involved to.

Author : Abbass A. Hashim
Publisher : BoD – Books on Demand
Page : 592 pages
File Size : 52,9 Mb
Release : 2012-04-18
Category : Science
ISBN : 9789535105008

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Smart Nanoparticles Technology by Abbass A. Hashim Pdf

In the last few years, Nanoparticles and their applications dramatically diverted science in the direction of brand new philosophy. The properties of many conventional materials changed when formed from nanoparticles. Nanoparticles have a greater surface area per weight than larger particles which causes them to be more reactive and effective than other molecules. In this book, we (InTech publisher, editor and authors) have invested a lot of effort to include 25 most advanced technology chapters. The book is organised into three well-heeled parts. We would like to invite all Nanotechnology scientists to read and share the knowledge and contents of this book.

Author : Andrei Benediktovich,Ilya Feranchuk,Alexander Ulyanenkov
Publisher : Springer Science & Business Media
Page : 325 pages
File Size : 54,8 Mb
Release : 2013-09-07
Category : Technology & Engineering
ISBN : 9783642381775

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Theoretical Concepts of X-Ray Nanoscale Analysis by Andrei Benediktovich,Ilya Feranchuk,Alexander Ulyanenkov Pdf

This book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.

Author : Lhadi Merhari
Publisher : Springer Science & Business Media
Page : 840 pages
File Size : 55,7 Mb
Release : 2009-03-03
Category : Technology & Engineering
ISBN : 9780387304281

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Hybrid Nanocomposites for Nanotechnology by Lhadi Merhari Pdf

This book covers the latest advances in polymer-inorganic nanocomposites, with particular focus on high-added-value applications in fields including electronics, optics, magnetism and biotechnology. The unique focus of this book is on electronic, optical, magnetic and biomedical applications of hybrid nanocomposites. Coverage includes: Synthesis methods and issues and production scale-up; Characterization methods; Electronic applications; Optical applications and Photonics; Magnetic applications; and Biomedical applications. The book offers readers a solid grasp of the state of the art, and of current challenges in non-traditional applications of hybrid nanocomposites.

Author : Yoshio Waseda
Publisher : Springer
Page : 214 pages
File Size : 40,5 Mb
Release : 2003-07-01
Category : Technology & Engineering
ISBN : 9783540460084

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Anomalous X-Ray Scattering for Materials Characterization by Yoshio Waseda Pdf

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.

Author : Daniel Chateigner
Publisher : John Wiley & Sons
Page : 382 pages
File Size : 50,6 Mb
Release : 2013-03-04
Category : Technology & Engineering
ISBN : 9781118622643

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Combined Analysis by Daniel Chateigner Pdf

This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing—a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses. This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology.

Author : J. Ping Liu,Eric Fullerton,Oliver Gutfleisch,D.J. Sellmyer
Publisher : Springer Science & Business Media
Page : 731 pages
File Size : 41,9 Mb
Release : 2010-04-05
Category : Science
ISBN : 9780387856001

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Nanoscale Magnetic Materials and Applications by J. Ping Liu,Eric Fullerton,Oliver Gutfleisch,D.J. Sellmyer Pdf

Nanoscale Magnetic Materials and Applications covers exciting new developments in the field of advanced magnetic materials. Readers will find valuable reviews of the current experimental and theoretical work on novel magnetic structures, nanocomposite magnets, spintronic materials, domain structure and domain-wall motion, in addition to nanoparticles and patterned magnetic recording media. Cutting-edge applications in the field are described by leading experts from academic and industrial communities. These include new devices based on domain wall motion, magnetic sensors derived from both giant and tunneling magnetoresistance, thin film devices in micro-electromechanical systems, and nanoparticle applications in biomedicine. In addition to providing an introduction to the advances in magnetic materials and applications at the nanoscale, this volume also presents emerging materials and phenomena, such as magnetocaloric and ferromagnetic shape memory materials, which motivate future development in this exciting field. Nanoscale Magnetic Materials and Applications also features a foreword written by Peter Grünberg, recipient of the 2007 Nobel Prize in Physics.

Author : Gubicza, Jen?
Publisher : IGI Global
Page : 359 pages
File Size : 53,6 Mb
Release : 2014-03-31
Category : Technology & Engineering
ISBN : 9781466658530

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X-Ray Line Profile Analysis in Materials Science by Gubicza, Jen? Pdf

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Author : Terence K. S. Wong
Publisher : Bentham Science Publishers
Page : 141 pages
File Size : 40,6 Mb
Release : 2012
Category : Technology & Engineering
ISBN : 9781608053599

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Semiconductor Strain Metrology by Terence K. S. Wong Pdf

This book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers involved in thin film and nanoscale device characterizati