Diffraction Analysis Of The Microstructure Of Materials

Author : Eric J. Mittemeijer,Paolo Scardi
Publisher : Springer Science & Business Media
Page : 557 pages
File Size : 42,5 Mb
Release : 2013-11-21
Category : Science
ISBN : 9783662067239

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Diffraction Analysis of the Microstructure of Materials by Eric J. Mittemeijer,Paolo Scardi Pdf

Overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Author : Eric J. Mittemeijer,Paolo Scardi
Publisher : Unknown
Page : 580 pages
File Size : 44,8 Mb
Release : 2014-09-01
Category : Electronic
ISBN : 3662067242

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Diffraction Analysis of the Microstructure of Materials by Eric J. Mittemeijer,Paolo Scardi Pdf

Author : Anonim
Publisher : Walter de Gruyter GmbH & Co KG
Page : 320 pages
File Size : 52,8 Mb
Release : 2015-10-29
Category : Science
ISBN : 9783486992564

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Fifth Size Strain Conference. Diffraction Analysis of the Microstructure of Materials by Anonim Pdf

Zeitschrift für Kristallographie. Supplement Volume 27 presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling Supplement Series of Zeitschrift für Kristallographie publishes Proceedings and Abstracts of international conferences on the interdisciplinary field of crystallography.

Author : Robert L. Snyder,Jaroslav Fiala,Hans J. Bunge,Hans Joachim Bunge,International Union of Crystallography
Publisher : International Union of Crystal
Page : 785 pages
File Size : 41,7 Mb
Release : 1999
Category : Science
ISBN : 0198501897

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Defect and Microstructure Analysis by Diffraction by Robert L. Snyder,Jaroslav Fiala,Hans J. Bunge,Hans Joachim Bunge,International Union of Crystallography Pdf

Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With theadvent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles tobroaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallitesize, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis ofthe fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by thesimulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation,along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.

Author : David Brandon,Wayne D. Kaplan
Publisher : John Wiley & Sons
Page : 517 pages
File Size : 52,6 Mb
Release : 2013-03-21
Category : Technology & Engineering
ISBN : 9781118681480

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Microstructural Characterization of Materials by David Brandon,Wayne D. Kaplan Pdf

Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/ Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source.

Author : Eric J. Mittemeijer
Publisher : Springer Nature
Page : 754 pages
File Size : 43,7 Mb
Release : 2022-01-01
Category : Technology & Engineering
ISBN : 9783030600563

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Fundamentals of Materials Science by Eric J. Mittemeijer Pdf

This textbook offers a strong introduction to the fundamental concepts of materials science. It conveys the quintessence of this interdisciplinary field, distinguishing it from merely solid-state physics and solid-state chemistry, using metals as model systems to elucidate the relation between microstructure and materials properties. Mittemeijer's Fundamentals of Materials Science provides a consistent treatment of the subject matter with a special focus on the microstructure-property relationship. Richly illustrated and thoroughly referenced, it is the ideal adoption for an entire undergraduate, and even graduate, course of study in materials science and engineering. It delivers a solid background against which more specialized texts can be studied, covering the necessary breadth of key topics such as crystallography, structure defects, phase equilibria and transformations, diffusion and kinetics, and mechanical properties. The success of the first edition has led to this updated and extended second edition, featuring detailed discussion of electron microscopy, supermicroscopy and diffraction methods, an extended treatment of diffusion in solids, and a separate chapter on phase transformation kinetics. “In a lucid and masterly manner, the ways in which the microstructure can affect a host of basic phenomena in metals are described.... By consistently staying with the postulated topic of the microstructure - property relationship, this book occupies a singular position within the broad spectrum of comparable materials science literature .... it will also be of permanent value as a reference book for background refreshing, not least because of its unique annotated intermezzi; an ambitious, remarkable work.” G. Petzow in International Journal of Materials Research. “The biggest strength of the book is the discussion of the structure-property relationships, which the author has accomplished admirably.... In a nutshell, the book should not be looked at as a quick ‘cook book’ type text, but as a serious, critical treatise for some significant time to come.” G.S. Upadhyaya in Science of Sintering. “The role of lattice defects in deformation processes is clearly illustrated using excellent diagrams . Included are many footnotes, ‘Intermezzos’, ‘Epilogues’ and asides within the text from the author’s experience. This ..... soon becomes valued for the interesting insights into the subject and shows the human side of its history. Overall this book provides a refreshing treatment of this important subject and should prove a useful addition to the existing text books available to undergraduate and graduate students and researchers in the field of materials science.” M. Davies in Materials World.

Author : Vadim Davydov
Publisher : LAP Lambert Academic Publishing
Page : 172 pages
File Size : 53,6 Mb
Release : 2013-01
Category : Electronic
ISBN : 384332042X

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Neutron Diffraction Analysis of Internal Stresses and Microstructure by Vadim Davydov Pdf

In the current world of advanced technologies, materials play a key role in our day-to-day life, and the investigation of their mechanical properties with the aim of improvement, thus becomes a matter of crucial importance. Nondestructive studies of microstructure and of internal stresses coupled with in situ mechanical tests and diffraction techniques yield an attractive tool for materials scientists. This assists not only to a growth of this topic in significance but also to its development into the detached and relatively new scientific field of diffraction analysis. Neutron diffraction used in the listed works of this book as a main probe for materials, has become the most powerful technique for examination of microstructure and mechanical properties, and it is therefore considered as a prerequisite. In response to the needs of diligent fabricator of materials, striving for the improvement of materials quality, the topic of internal stress development pertains to the significantly relevant issues covered by this book.

Author : Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field
Publisher : Springer Science & Business Media
Page : 352 pages
File Size : 54,6 Mb
Release : 2013-06-29
Category : Technology & Engineering
ISBN : 9781475732054

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Electron Backscatter Diffraction in Materials Science by Adam J. Schwartz,Mukul Kumar,Brent L. Adams,David P. Field Pdf

Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Author : Gubicza, Jen?
Publisher : IGI Global
Page : 359 pages
File Size : 49,7 Mb
Release : 2014-03-31
Category : Technology & Engineering
ISBN : 9781466658530

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X-Ray Line Profile Analysis in Materials Science by Gubicza, Jen? Pdf

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Author : J. McCall
Publisher : Springer Science & Business Media
Page : 344 pages
File Size : 43,8 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461586937

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Microstructural Analysis by J. McCall Pdf

During recent years, people involved in developing new metals and materials for use in some of the rather extreme conditions of stress, temperature, and environment have relied heavily on the microstructural condition of their materials. In fact, many of the newer materials, such as dispersion-strengthened alloys, have been designed almost entirely by first determining the microstruc ture desired and then finding the right combination of composition, heat treatment, and mechanical working that will result in the de sired microstructure. Furthermore, the extremely high reliability required of materials used today, for example, in aerospace and nuclear energy systems, requires close control on the microstruc tural conditions of materials. This is clearly evident from even a cursory examination of recently written specifications for mate rials where rather precise microstructural parameters are stipu lated. Whereas specifications written several years ago may have included microstructural requirements for details such as ASTM grain size or graphite type, today's specifications are beginning to include such things as volume fraction of phases, mean free path of particles, and grain intercept distances. Rather arbitrary terms such as "medium pearlite" have been replaced by requirements such as "interlamella spacing not to exceed 0. 1 micron. " Finally, materials users have become increasingly aware that when a material does fail, the reason for its failure may be found by examining and "reading" its microstructure. The responsibility for a particular microstructure and a resulting failure is a matter of growing importance in current product liability consider ations.

Author : Valerie Randle
Publisher : Institute of Materials Minerals and Mining
Page : 138 pages
File Size : 48,7 Mb
Release : 2003-01-01
Category : Engineering, General
ISBN : 1902653831

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Microtexture Determination and Its Applications by Valerie Randle Pdf

A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present: morphology, including size and shape distributions; chemical composition; crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is: 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure.' The term microtexture also describes any experimental technique used to determine this information. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin.An estimated 95 percent of microtexture determination is by 'electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5 percent contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these changes.

Author : V. Randle
Publisher : Routledge
Page : 146 pages
File Size : 55,9 Mb
Release : 2013-02
Category : Social Science
ISBN : 190654011X

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B0798 Microtexture Determination and Its Applications by V. Randle Pdf

The characterisation of microstructure is a cornerstone in the study of both natural and technological materials. In the widest sense this topic encompasses for all phases present: morphology, including size and shape distributions; chemical composition; and crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. Microtexture can be defined as 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure'. The term microtexture can also be applied to any experimental technique used to determine this information. Essentially, atomic planes in the sampled volume of specimen diffract a stationary beam of electrons. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95% of microtexture determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation determination is by electron backscatter diffraction (EBSD) in a scanning electron microscope (SEM), with the remaining 5% contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these developments.

Author : E. J. Mittemeijer,U. Welzel
Publisher : John Wiley & Sons
Page : 563 pages
File Size : 42,9 Mb
Release : 2013-02-04
Category : Science
ISBN : 9783527649907

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Modern Diffraction Methods by E. J. Mittemeijer,U. Welzel Pdf

The role of diffraction methods for the solid-state sciences has been pivotal to determining the (micro)structure of a material. Particularly, the expanding activities in materials science have led to the development of new methods for analysis by diffraction. This book offers an authoritative overview of the new developments in the field of analysis of matter by (in particular X-ray, electron and neutron) diffraction. It is composed of chapters written by leading experts on 'modern diffraction methods'. The focus in the various chapters of this book is on the current forefront of research on and applications for diffraction methods. This unique book provides descriptions of the 'state of the art' and, at the same time, identifies avenues for future research. The book assumes only a basic knowledge of solid-state physics and allows the application of the described methods by the readers of the book (either graduate students or mature scientists).

Author : René Guinebretière
Publisher : John Wiley & Sons
Page : 290 pages
File Size : 45,7 Mb
Release : 2013-03-01
Category : Technology & Engineering
ISBN : 9781118613955

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X-Ray Diffraction by Polycrystalline Materials by René Guinebretière Pdf

This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.

Author : Myeongkyu Lee
Publisher : CRC Press
Page : 302 pages
File Size : 45,8 Mb
Release : 2017-03-16
Category : Science
ISBN : 9781315361970

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X-Ray Diffraction for Materials Research by Myeongkyu Lee Pdf

X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.