Integrated Circuit Quality And Reliability

Author : Eugene R. Hnatek
Publisher : Unknown
Page : 736 pages
File Size : 43,7 Mb
Release : 1987
Category : Technology & Engineering
ISBN : UOM:39015011996652

Get Book

Integrated Circuit Quality and Reliability by Eugene R. Hnatek Pdf

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Author : Eugene R. Hnatek
Publisher : CRC Press
Page : 809 pages
File Size : 42,5 Mb
Release : 2018-10-03
Category : Technology & Engineering
ISBN : 9781482277715

Get Book

Integrated Circuit Quality and Reliability by Eugene R. Hnatek Pdf

Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.

Author : Elie Maricau,Georges Gielen
Publisher : Springer Science & Business Media
Page : 208 pages
File Size : 42,9 Mb
Release : 2013-01-11
Category : Technology & Engineering
ISBN : 9781461461630

Get Book

Analog IC Reliability in Nanometer CMOS by Elie Maricau,Georges Gielen Pdf

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

Author : José Pineda de Gyvez,Dhiraj Pradhan
Publisher : John Wiley & Sons
Page : 338 pages
File Size : 48,7 Mb
Release : 1998-10-30
Category : Technology & Engineering
ISBN : 9780780334472

Get Book

Integrated Circuit Manufacturability by José Pineda de Gyvez,Dhiraj Pradhan Pdf

"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing."

Author : Arman Vassighi,Manoj Sachdev
Publisher : Springer Science & Business Media
Page : 188 pages
File Size : 51,5 Mb
Release : 2006-06-01
Category : Technology & Engineering
ISBN : 9780387297491

Get Book

Thermal and Power Management of Integrated Circuits by Arman Vassighi,Manoj Sachdev Pdf

In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the design, test, and manufacturing. Proper thermal management is the key to achieve high performance, quality and reliability. Performance and reliability of integrated circuits are strong functions of the junction temperature. A small increase in junction temperature may result in significant reduction in the device lifetime. This book reviews the significance of the junction temperature as a reliability measure under nominal and burn-in conditions. The latest research in the area of electro-thermal modeling of integrated circuits will also be presented. Recent models and associated CAD tools are covered and various techniques at the circuit and system levels are reviewed. Subsequently, the authors provide an insight into the concept of thermal runaway and how it may best be avoided. A section on low temperature operation of integrated circuits concludes the book.

Author : Rodrigo Possamai Bastos,Frank Sill Torres
Publisher : Springer Nature
Page : 162 pages
File Size : 46,9 Mb
Release : 2019-09-30
Category : Technology & Engineering
ISBN : 9783030293536

Get Book

On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits by Rodrigo Possamai Bastos,Frank Sill Torres Pdf

This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs.

Author : Norman Einspruch
Publisher : Academic Press
Page : 381 pages
File Size : 55,8 Mb
Release : 2012-12-02
Category : Computers
ISBN : 9780323153232

Get Book

Application Specific Integrated Circuit (ASIC) Technology by Norman Einspruch Pdf

Application Specific Integrated Circuit (ASIC) Technology explores and discusses the different aspects of the ASIC technology experienced during the 1990s. The topics of the chapters range from the ASIC business, model, marketing, and development up to its testability, packaging, and quality and reliability. An introductory chapter begins the discussion and tackles the historical perspective and the classification of the ASIC technology. Chapters 2 and 3 cover the business side of the technology as it discusses the market dynamics and marketing strategies. The following chapters focus on the product itself and deal with the design and model and library development. Computer-aided design tools and systems are included in the discussion. Manufacturing and packaging of ASICs are also given attention in the book. Finally, the last three chapters present the application, testability, and reliability of ASIC technology. The text can be of most help to students in the fields of microelectronics, computer technology, and engineering.

Author : Anonim
Publisher : Unknown
Page : 912 pages
File Size : 50,6 Mb
Release : 2024-06-26
Category : Science
ISBN : CORNELL:31924057185294

Get Book

Technical Abstract Bulletin by Anonim Pdf

Author : Thomas Moore
Publisher : Elsevier
Page : 274 pages
File Size : 51,7 Mb
Release : 2013-10-22
Category : Technology & Engineering
ISBN : 9781483292342

Get Book

Characterization of Integrated Circuit Packaging Materials by Thomas Moore Pdf

Chapters in this volume address important characteristics of IC packages. Analytical techniques appropriate for IC package characterization are demonstrated through examples of the measurement of critical performance parameters and the analysis of key technological problems of IC packages. Issues are discussed which affect a variety of package types, including plastic surface-mount packages, hermetic packages, and advanced designs such as flip-chip, chip-on-board and multi-chip models.

Author : Ricardo Reis,Yu Cao,Gilson Wirth
Publisher : Springer
Page : 271 pages
File Size : 54,6 Mb
Release : 2014-11-08
Category : Technology & Engineering
ISBN : 9781461440789

Get Book

Circuit Design for Reliability by Ricardo Reis,Yu Cao,Gilson Wirth Pdf

This book presents physical understanding, modeling and simulation, on-chip characterization, layout solutions, and design techniques that are effective to enhance the reliability of various circuit units. The authors provide readers with techniques for state of the art and future technologies, ranging from technology modeling, fault detection and analysis, circuit hardening, and reliability management.

Author : Michael Pecht,Riko Radojcic,Gopal Rao
Publisher : CRC Press
Page : 205 pages
File Size : 49,7 Mb
Release : 2017-11-22
Category : Technology & Engineering
ISBN : 9781351443562

Get Book

Guidebook for Managing Silicon Chip Reliability by Michael Pecht,Riko Radojcic,Gopal Rao Pdf

Achieving cost-effective performance over time requires an organized, disciplined, and time-phased approach to product design, development, qualification, manufacture, and in-service management. Guidebook for Managing Silicon Chip Reliability examines the principal failure mechanisms associated with modern integrated circuits and describes common practices used to resolve them. This quick reference on semiconductor reliability addresses the key question: How will the understanding of failure mechanisms affect the future? Chapters discuss: failure sites, operational loads, and failure mechanism intrinsic device sensitivities electromigration hot carrier aging time dependent dielectric breakdown mechanical stress induced migration alpha particle sensitivity electrostatic discharge (ESD) and electrical overstress latch-up qualification screening guidelines for designing reliability Guidebook for Managing Silicon Chip Reliability focuses on device failure and causes throughout - providing a thorough framework on how to model the mechanism, test for defects, and avoid and manage damage. It will serve as an exceptional resource for electrical engineers as well as mechanical engineers working in the field of electronic packaging.

Author : Eugene R. Hnatek
Publisher : CRC Press
Page : 472 pages
File Size : 52,9 Mb
Release : 2002-10-25
Category : Technology & Engineering
ISBN : 0203909089

Get Book

Practical Reliability Of Electronic Equipment And Products by Eugene R. Hnatek Pdf

Examining numerous examples of highly sensitive products, this book reviews basic reliability mathematics, describes robust design practices, and discusses the process of selecting suppliers and components. He focuses on the specific issues of thermal management, electrostatic discharge, electromagnetic compatibility, printed wiring assembly, environmental stress testing, and failure analysis. The book presents methods for meeting the reliability goals established for the manufacture of electronic product hardware and addresses the development of reliable software. The appendix provides example guidelines for the derating of electrical and electromechanical components.

Author : Lawrence C. Wagner
Publisher : Springer Science & Business Media
Page : 256 pages
File Size : 49,5 Mb
Release : 2012-12-06
Category : Technology & Engineering
ISBN : 9781461549192

Get Book

Failure Analysis of Integrated Circuits by Lawrence C. Wagner Pdf

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

Author : Anonim
Publisher : Unknown
Page : 162 pages
File Size : 53,9 Mb
Release : 1979
Category : Competition, International
ISBN : UIUC:30112105131491

Get Book

Competitive Factors Influencing World Trade in Integrated Circuits by Anonim Pdf

Author : Congress of the U.S., Washington, DC. Office of Technology Assessment
Publisher : DIANE Publishing
Page : 543 pages
File Size : 49,9 Mb
Release : 1983
Category : Electronic
ISBN : 9781428923966

Get Book

International Competitiveness in Electronics by Congress of the U.S., Washington, DC. Office of Technology Assessment Pdf

This assessment continues the Office of Technology Assessment's (OTA) exploration of the meaning of industrial policy in the United States context, while also examining the industrial policies of several U.S. economic rivals. The major focus is on electronics, an area which virtually defines "high technology" of the 1980's. The assessment sets the characteristics of the technology itself alongside other forces that exert major influences over international competitiveness. Specific areas addressed include: electronics technology; structure, trade, and competitiveness in the international electronics industry; quality, reliability, and automation in manufacturing; role of financing in competitiveness and electronics; human resources (education, training, management); employment effects; national industrial policies; and U.S. trade policies and their effects. The report concludes by outlining five options for a U.S. industrial policy, drawing on electronics for examples of past and prospective impacts, as well as on OTA's previous studies of the steel and automotive industries. A detailed summary and introductory comments are included. Also included in appendices are case studies in the development and marketing of electronics products, a discussion of offshore manufacturing, and a glossary of terms used in the assessment. (JN)