Download Full eBooks in PDF
Ion Bombardment Induced Atomic Transport In Solids Book in PDF, ePub and Kindle version is available to download in english. Read online anytime anywhere directly from your device. Click on the download button below to get a free pdf file of Ion Bombardment Induced Atomic Transport In Solids book. This book definitely worth reading, it is an incredibly well-written.
Author : Ismo Koponen
Publisher : Unknown
Page : 26 pages
File Size : 45,7 Mb
Release : 1992
Category : Electronic
ISBN : 9514561546
Author : Alvin W. Czanderna,Theodore E. Madey,Cedric J. Powell
Publisher : Springer Science & Business Media
Page : 430 pages
File Size : 49,5 Mb
Release : 2006-04-11
Category : Technology & Engineering
ISBN : 9780306469145
Many books are available that detail the basic principles of the different methods of surface characterization. On the other hand, the scientific literature provides a resource of how individual pieces of research are conducted by particular labo- tories. Between these two extremes the literature is thin but it is here that the present volume comfortably sits. Both the newcomer and the more mature scientist will find in these chapters a wealth of detail as well as advice and general guidance of the principal phenomena relevant to the study of real samples. In the analysis of samples, practical analysts have fairly simple models of how everything works. Superimposed on this ideal world is an understanding of how the parameters of the measurement method, the instrumentation, and the char- teristics of the sample distort this ideal world into something less precise, less controlled, and less understood. The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Author : Bernd Rauschenbach
Publisher : Springer Nature
Page : 763 pages
File Size : 41,9 Mb
Release : 2022-08-19
Category : Technology & Engineering
ISBN : 9783030972776
This book provides a comprehensive introduction to all aspects of low-energy ion–solid interaction from basic principles to advanced applications in materials science. It features a balanced and insightful approach to the fundamentals of the low-energy ion–solid surface interaction, focusing on relevant topics such as interaction potentials, kinetics of binary collisions, ion range, radiation damages, and sputtering. Additionally, the book incorporates key updates reflecting the latest relevant results of modern research on topics such as topography evolution and thin-film deposition under ion bombardment, ion beam figuring and smoothing, generation of nanostructures, and ion beam-controlled glancing angle deposition. Filling a gap of almost 20 years of relevant research activity, this book offers a wealth of information and up-to-date results for graduate students, academic researchers, and industrial scientists working in these areas.
Author : Anonim
Publisher : Academic Press
Page : 300 pages
File Size : 49,9 Mb
Release : 1997-05-23
Category : Technology & Engineering
ISBN : 0080864422
Defects in ion-implanted semiconductors are important and will likely gain increased importance in the future as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need to be addressed. Publications in this field mainly focus on the effects of ion implantation on the material and the modification in the implanted layer afterhigh temperature annealing. Electrical and Physicochemical Characterization focuses on the physics of the annealing kinetics of the damaged layer. An overview of characterization tehniques and a critical comparison of the information on annealing kinetics is also presented. Provides basic knowledge of ion implantation-induced defects Focuses on physical mechanisms of defect annealing Utilizes electrical and physico-chemical characterization tools for processed semiconductors Provides the basis for understanding the problems caused by the defects generated by implantation and the means for their characterization and elimination
Author : H. H. Andersen,J. Bøttiger,H. Knudsen
Publisher : Elsevier
Page : 640 pages
File Size : 46,5 Mb
Release : 2017-01-31
Category : Science
ISBN : 9781483274959
Nuclear Instruments and Methods, Volume 168: Ion Beam Analysis presents the proceedings of the Fourth International Conference on Ion Beam Analysis, held in Aarhus, Denmark, on June 25–29, 1979. This book provides information pertinent to the methods and applications ion beam analysis. Organized into eight parts encompassing 95 chapters, this volume begins with an overview of the straggling of energy loss for protons and alpha particles. This text then examines the method for the calculation of the stopping of energetic ions in matter. Other chapters consider the method for measuring relative stopping powers for light energetic ions in highly reactive materials. This book discusses as well the stopping power and straggling of lithium ions with velocities around the Bohr velocity. The final chapter deals with the adsorption behavior of different gases on monocrystalline platinum surfaces. This book is a valuable resource for scientists, technologists, students, and research workers.
Author : Kurt E. Sickafus,Eugene A. Kotomin,Blas P. Uberuaga
Publisher : Springer Science & Business Media
Page : 593 pages
File Size : 49,6 Mb
Release : 2007-05-22
Category : Science
ISBN : 9781402052958
This is a comprehensive overview of fundamental principles and relevant technical issues associated with the behavior of solids exposed to high-energy radiation. These issues are important to the development of materials for existing fission reactors or future fusion and advanced reactors for energy production; to the development of electronic devices such as high-energy detectors; and to the development of novel materials for electronic and photonic applications.
Author : Anonim
Publisher : Unknown
Page : 712 pages
File Size : 46,7 Mb
Release : 1998
Category : Physics
ISBN : CHI:53164820
Author : Anonim
Publisher : Unknown
Page : 658 pages
File Size : 43,5 Mb
Release : 1976
Category : Nuclear energy
ISBN : UOM:39015023546362
Author : George Carter,John Smallwood Colligon
Publisher : Unknown
Page : 464 pages
File Size : 53,9 Mb
Release : 1968
Category : Ion bombardment
ISBN : OSU:32435014339360
Author : Anonim
Publisher : Unknown
Page : 968 pages
File Size : 54,8 Mb
Release : 1989
Category : Aeronautics
ISBN : UIUC:30112075701745
Author : Anonim
Publisher : Unknown
Page : 680 pages
File Size : 51,8 Mb
Release : 1976
Category : Nuclear energy
ISBN : RUTGERS:39030044059097
Author : Hubert Gnaser
Publisher : Springer
Page : 312 pages
File Size : 54,7 Mb
Release : 1999
Category : Medical
ISBN : UVA:X004335343
The book presents an overview on important aspects of ion irradiation of surfaces, emphasizing low impact energies. Specifically, ion penetration and implantation into solids, defect creation and amorphization of semiconductors, sputtering of elemental and multicomponent targets, and ionization processes of emitted species are discussed. It provides a synoptic view of these phenomena which are strongly interrelated by the same basic processes, but are often described separately and in diverging terminology. The book tries to bridge this gap, summarizing results from experiments, computer simulations and theoretical approaches.
Author : Michael Nastasi,James W. Mayer,James K. Hirvonen
Publisher : Cambridge University Press
Page : 572 pages
File Size : 49,9 Mb
Release : 1996-03-29
Category : Science
ISBN : 9780521373760
Comprehensive guide to an important materials science technique for students and researchers.
Author : Dale C. Jacobson
Publisher : Unknown
Page : 776 pages
File Size : 49,5 Mb
Release : 1995-11-20
Category : Science
ISBN : UOM:39015034507874
Proceedings of the title symposium, held at the 1994 MRS Fall Meeting in Boston, 28 November-2 December 1994. Selected papers that were presented in both oral and poster sessions are divided into six topical groups: ion beam processing; defects and diffusion; ion-beam modification of polymers; analysis and characterization; sputtering; and laser-assisted and induced processes. Annotation copyright by Book News, Inc., Portland, OR
Author : Emile Knystautas
Publisher : CRC Press
Page : 362 pages
File Size : 47,7 Mb
Release : 2018-10-03
Category : Technology & Engineering
ISBN : 9781351836753
While ion-beam techniques have been used to create thin films in the semiconductor industry for several decades, these methods have been too costly for other surface treatment applications. However, as manufacturing devices become increasingly smaller, the use of a directed-energy ion beam is finding novel industrial applications that require the custom tailoring of new materials and devices, including magnetic storage devices, photonics, opto-electronics, and molecular transport. Engineering Thin Films and Nanostructures with Ion Beams offers a thorough narrative of the recent advances that make this technology relevant to current and future applications. Featuring internationally recognized researchers, the book compiles their expertise in a multidimensional source that: Highlights the mechanisms and visual evidence of the effects of single-ion impacts on metallic surfaces Considers how ion-beam techniques can help achieve higher disk-drive densities Introduces gas-cluster ion-beam technology and reviews its precedents Explains how ion beams are used to aggregate metals and semiconductors into nanoclusters with nonlinear optical properties Addresses current challenges in building equipment needed to produce nanostructures in an industrial setting Examines the combination of ion-beam techniques, particularly with physical vapor deposition Delineates the fabrication of nanopillars, nanoflowers, and interconnected nanochannels in three dimensions by using atomic shadowing techniques Illustrates the production of nanopores of varying dimensions in polymer films, alloys, and superconductors using ion-beam irradiation Shows how fingerprints can be made more reliable as forensic evidence by recoil-mixing them into the substrate using ion beams From the basics of the ion-beam modification of materials to state-of-the-art applications, Engineering Th
